A sample holder includes a sample container and a fixing member. The fixing member is inserted into the sample container in a state in which a sample is placed, and fixes the sample by sandwiching the sample between the fixing member and a bottom surface of the sample container. At this time, a peripheral edge portion of the fixing member is elastically deformed by being inserted into the sample container, and the fixing member sandwiches the sample by its elastic force. Therefore, even when the sample is placed in the sample container in the state of being immersed in a liquid, the sample can be held in a stable state by the fixing member.

A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (SPM) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. The retention mechanism provides a vacuum region formed in the platform, with the vacuum region being barometrically coupled with a vacuum generator. Establishment of a vacuum in the vacuum region prevents or substantially reduces oscillation of the sample vessel floor in an operating frequency range of the SPM head.

An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

The invention relates to a method for processing a measuring probe which is intended for detecting surface properties or for modifying surface structures in the sub-micrometer range. The method comprises at least the following steps. First, providing a precursor containing molecules polymerizable by light or electron beams and a measuring probe comprising at least one carrier with a tip having an upper end opposite the carrier and a light or electron source for emitting light or electron beams with a wavelength and intensity, which fulfil an energy input at least required for polymerization of the precursor and means for variable positioning of the light or electron source and a control file and an electronic data processing system, wherein the control file describes at least a part of the surface of the measuring probe and serves to control a change in position of the light or electron source. In the following step, the measuring probe is covered with the precursor and the measuring probe is arranged in the beam path of the light or electron beams, whereupon the precursor is exposed to the light or electron beam at several positions that touch each other and are specified in the control file, leaving out the tip of the measuring probe. The unexposed areas of the precursor are then removed by means of a water or solvent bath or controlled air or gas flow and, if necessary, the areas polymerized by exposure are finally developed. The invention also includes measuring probes which are manufactured using the inventive method.

The invention relates to a measurement device (120), for example for testing, comprising a micromechanical positioning actuator (130) for causing movement of a sensor (150) with respect to a target (110), a positioning controller (145), the positioning controller (145) having an output coupled to the actuator (130) for controlling the movement, and the having an input coupled to the sensor (150) for receiving a sensor signal from the sensor (150) to the positioning controller (145), and the positioning controller (145) arranged to control the movement based on the sensor signal. The measurement device (120) may have memory for storing positioning control instructions (300). The positioning controller (145) may be arranged to control said movement based on said sensor signal and said positioning control instructions (300).

The invention relates to a measurement device (120), for example for testing, comprising a micromechanical positioning actuator (130) for causing movement of a sensor (150) with respect to a target (110), a positioning controller (145), the positioning controller (145) having an output coupled to the actuator (130) for controlling the movement, and the having an input coupled to the sensor (150) for receiving a sensor signal from the sensor (150) to the positioning controller (145), and the positioning controller (145) arranged to control the movement based on the sensor signal. The measurement device (120) may have memory for storing positioning control instructions (300). The positioning controller (145) may be arranged to control said movement based on said sensor signal and said positioning control instructions (300).

A liquid cell for in situ atomic force microscopy (AFM) measurement of a sample during filtration is provided. The liquid cell includes a cantilever probe; a cantilever holder to position the probe near a surface of a sample (e.g., a filtration membrane); a liquid cell housing provided to hold the sample and comprising an opening at the top; an upper part; a lower part; an internal cavity to contain a fluid; a fluid inlet passage located in the upper part; a first fluid outlet passage located in the upper part; and a second fluid outlet passage located in the lower part. A method of in situ atomic force microscopy (AFM) measurement of a sample during filtration in a liquid by using the liquid cell described herein is also provided.

A liquid cell for in situ atomic force microscopy (AFM) measurement of a sample during filtration is provided. The liquid cell includes a cantilever probe; a cantilever holder to position the probe near a surface of a sample (e.g., a filtration membrane); a liquid cell housing provided to hold the sample and comprising an opening at the top; an upper part; a lower part; an internal cavity to contain a fluid; a fluid inlet passage located in the upper part; a first fluid outlet passage located in the upper part; and a second fluid outlet passage located in the lower part. A method of in situ atomic force microscopy (AFM) measurement of a sample during filtration in a liquid by using the liquid cell described herein is also provided.

The objective of the present invention is to provide a corrosion resistance evaluation method and evaluation device that make it possible to estimate crevice corrosion depth and pitting depth in a short period of time. A corrosion resistance evaluation method according to the present invention is characterized in that the surface potential of a metal under evaluation is measured in a state in which the metal is immersed in a usage-environment liquid, the surface potential distribution of the metal is determined, the surface potential differences in the microstructure of the metal are calculated on the basis of the surface potential distribution, and the corrosion rate of crevice corrosion and corrosion rate of pitting are predicted using the maximum surface potential difference from among the calculated surface potential differences as an evaluation index for corrosion evaluation.