A needle-shaped body protrudes from a cantilever made of Si. Furthermore, the rear face of the cantilever is coated with aluminum (first metal) having a Fermi level higher than that of Si. The cantilever is dipped into an aqueous silver nitride solution containing the ions of Ag serving as a second metal. The electrons of Si flow out to the aqueous silver nitride solution due to the existence of the aluminum, and Ag nanostructures are precipitated at the tip end of the needle-shaped body. A probe for tip-enhanced Raman scattering in which the Ag nanostructures are fixed to the tip end of the needle-shaped body is manufactured. The sizes and shapes of the Ag nanostructures can be controlled properly by adjusting the concentration of the aqueous silver nitride solution and the time during which the cantilever is dipped into the aqueous silver nitride solution.

The present invention provides a surface plasmon-optical-electrical hybrid conduction nano heterostructure and a preparation method therefor. The structure includes an exciting light source, a semiconductor nano-structure array, a two-dimensionalplasmonic micro-nano structure, a sub-wavelength plasmon polariton guided wave, an emergent optical wave, a one-dimensionalplasmonic micro-nano structure, a wire, a metal electrode, a conductive substrate, a probe molecule, an atomic-force microscopic conductive probe and a voltage source. The method achieves a semiconductor seed crystal with controllable distribution and density by controlling free metal ions, air, water or oxygen on a metal substrate to achieve highly uniform control of the seed crystal, and then strictly controls a length-to-diameter ratio and distribution of a semiconductor structure by continuous growth. Therefore, a new nano optics platform is provided for studying various novel effects produced by interaction between light and substances.

The present invention provides a surface plasmon-optical-electrical hybrid conduction nano heterostructure and a preparation method therefor. The structure includes an exciting light source, a semiconductor nano-structure array, a two-dimensionalplasmonic micro-nano structure, a sub-wavelength plasmon polariton guided wave, an emergent optical wave, a one-dimensionalplasmonic micro-nano structure, a wire, a metal electrode, a conductive substrate, a probe molecule, an atomic-force microscopic conductive probe and a voltage source. The method achieves a semiconductor seed crystal with controllable distribution and density by controlling free metal ions, air, water or oxygen on a metal substrate to achieve highly uniform control of the seed crystal, and then strictly controls a length-to-diameter ratio and distribution of a semiconductor structure by continuous growth. Therefore, a new nano optics platform is provided for studying various novel effects produced by interaction between light and substances.

The present disclosure discloses a method for detecting electrical characteristics of individual soot nanoparticles, wherein the electrical characteristics comprise conductance and work function. The conductance of individual soot nanoparticles is measured by a PF-TUNA mode of an atomic force microscope, and the work function of soot nanoparticles is measured by a KPFM mode of the atomic force microscope. The method mainly comprises steps of preparing a gold film substrate, sampling soot nanoparticles, measuring the conductance of individual soot nanoparticles, and measuring the work function of soot nanoparticles. The detection method of the present disclosure reduces the influence on the inherent characteristics of soot nanoparticles.

The present disclosure discloses a method for detecting electrical characteristics of individual soot nanoparticles, wherein the electrical characteristics comprise conductance and work function. The conductance of individual soot nanoparticles is measured by a PF-TUNA mode of an atomic force microscope, and the work function of soot nanoparticles is measured by a KPFM mode of the atomic force microscope. The method mainly comprises steps of preparing a gold film substrate, sampling soot nanoparticles, measuring the conductance of individual soot nanoparticles, and measuring the work function of soot nanoparticles. The detection method of the present disclosure reduces the influence on the inherent characteristics of soot nanoparticles.

The present disclosure discloses a method for detecting electrical characteristics of individual soot nanoparticles, wherein the electrical characteristics comprise conductance and work function. The conductance of individual soot nanoparticles is measured by a PF-TUNA mode of an atomic force microscope, and the work function of soot nanoparticles is measured by a KPFM mode of the atomic force microscope. The method mainly comprises steps of preparing a gold film substrate, sampling soot nanoparticles, measuring the conductance of individual soot nanoparticles, and measuring the work function of soot nanoparticles. The detection method of the present disclosure reduces the influence on the inherent characteristics of soot nanoparticles.

The present disclosure discloses a method for detecting electrical characteristics of individual soot nanoparticles, wherein the electrical characteristics comprise conductance and work function. The conductance of individual soot nanoparticles is measured by a PF-TUNA mode of an atomic force microscope, and the work function of soot nanoparticles is measured by a KPFM mode of the atomic force microscope. The method mainly comprises steps of preparing a gold film substrate, sampling soot nanoparticles, measuring the conductance of individual soot nanoparticles, and measuring the work function of soot nanoparticles. The detection method of the present disclosure reduces the influence on the inherent characteristics of soot nanoparticles.

A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.

A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.

A probe for atomic force microscopy comprises a tip for atomic force microscopy oriented in a direction referred to as the longitudinal direction and protrudes from an edge of a substrate in the longitudinal direction, wherein the tip is arranged at one end of a shuttle attached to the substrate at least via a first and via a second structure, which structures are referred to as support structures, at least the first support structure being a flexible structure, extending in a direction referred to as the transverse direction, perpendicular to the longitudinal direction and anchored to the substrate by at least one mechanical linkage in the transverse direction, the support structures being suitable for allowing the shuttle to be displaced in the longitudinal direction. An atomic force microscope comprising at least one such probe is also provided.