A test and measurement instrument, comprising a display and one or more processors configured to display a waveform viewing area, receive a selection of a viewing mode. When an overlay viewing mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area, and when a stacked viewing mode is selected, display a first waveform in a first slice having a first graticule in the waveform viewing area and display a second waveform in a second slice having a second graticule below the first slice in the waveform viewing area.

The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a current probe, respectively, for a plurality of switching cycles of the device under test. The switching current versus the switching voltage is plotted on a current versus voltage plot as a curve for each of the switching cycles. Each of the curves on the current versus voltage plot overlap each other and are displayed to a user.

A measurement apparatus is provided for measuring signals from a device under test (DUT). The measurement apparatus includes a time domain receiver configured to receive from the DUT a time domain signal in a time domain; a logic domain receiver configured to receive from the DUT a logical signal comprising logic levels over time; a frequency domain receiver configured to receive from the DUT a frequency domain signal in a frequency domain through frequency downconversion; and a controller coupled to the logic domain receiver, and configured to determine the logic levels over time of the logical signal and to control at least one parameter of the frequency domain signal in response to the determined logic levels.

A configuration device in a test and measurement system including an event generator and a Device Under Test (DUT) to receive one or more events generated by the event generator includes an output display structured to graphically illustrate a first event timeline that includes source event markers for a first test channel for a second test channel, in which the first event timeline and the second event timeline appear on the output display as separate timelines vertically separated from one another. The position of the event delay indicator or a position of the event width indicator may be movable by a user, and moving the position of the event delay indicator or moving the position of the event width indicator causes the event generator to change one or more event generation parameters of the first event based on such movement. Methods are also disclosed.

The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

The invention relates to a measuring device and a measurement method for the display of a measurement signal connected to the measuring device. The measuring device comprises a measurement-signal input, a measurement-parameter input, a calculation unit and a display unit for the display of calculated statistical signals. The measuring device is set up to display a plurality of statistical signals in parallel on the display unit in real-time.

A method and test system are provided for selectively emphasizing waveforms on a display of the test system. The method includes presenting a graphical user interface (GUI) on the display of the test system; receiving through the GUI a selection of channels to be viewed on the display; receiving through the GUI an indication enabling a waveform emphasis feature; receiving through the GUI an indication of a cycle time; and displaying through the GUI multiple waveforms, respectively produced by the selected channels, by sequentially emphasizing each waveform of the multiple waveforms for the cycle time as a viewable waveform, while de-emphasizing each remaining waveforms of the multiple waveforms in relation to the emphasized waveform for the cycle time.

A method of capturing instrument data using a communications device includes recognizing an action performed by a user on the communication device, one of either transmitting or receiving a trigger message between the communications device and at least one instrument, storing instrument data in a memory on the at least one instrument, and transmitting the instrument data and user information to a network. A test system includes a test and measurement device having at least one communications link, a memory, and a processor configured to execute instructions that cause the processor to receive a message through the communications link, save instrument data into the memory, and transmit the instrument data to a remote location; and a communications device having at least one communications link, a memory, and a processor configured to execute instructions that cause the processor to recognize an action performed by a user, send the message to the test and measurement device, store associated information including user information, and transmit the user information to the remote location.

A test and measurement instrument having an input configured to acquire waveforms from a device under test, a memory configured to store the acquired waveforms, a user input configured to receive a selection, and one or more processors. The one or more processors can render on a display the acquired waveforms, receive the selection from the user input indicating a filter criterium, such as a region of interest in the displayed acquired waveforms, determine which waveforms of the acquired waveforms are within the region of interest, and render only waveforms associated with the region of interest on the display.

A method for performing a Bus autoset function is described. A maximum amplitude of an analog signal is detected. The analog signal is converted into a logical signal. A frame in the logical signal is detected. A scale of an output unit is set such that the whole frame is output. Further, a measurement device is described.