A test and measurement system is disclosed that includes an input for receiving a digital bus conducting a plurality of digital values, a display, and a memory. The memory stores hit frequencies for the digital values, and stores data indicating the digital values. The test and measurement system also includes at least one processor coupled to the display and the memory. The processor causes the display to depict the digital values and hit frequencies of the digital values by depicting persistence of the digital values over time and by depicting decay of the digital values over time.

An electrical measurement device is described with an acquisition unit that is configured to receive an input signal, a post-processing unit, and a visualization unit. The acquisition unit comprises an acquisition trigger unit and an acquisition memory, the acquisition memory being configured to acquire sampled output data and to store the sampled output data by control of the acquisition trigger unit. The post-processing unit comprises a measurement unit that is configured to process at least parts of the sampled output data and to generate processed sampled output data. The post-processing unit further comprises a measurement trigger unit that is configured to evaluate the processed sampled output data in view of a measurement trigger condition, the measurement trigger unit being configured to output a measurement trigger event if the measurement trigger condition is met. The measurement trigger unit is further configured to control the visualization unit. Moreover, a method for operating an electrical measurement device is described.

Methods are described to provide a new and improved display of phase identification measurements in a three-phase power distribution network, that is easier and more intuitive to interpret and define tagging reference phase. A short sequence of individual phase measurements are displayed as dots inside a static phase attribute display circle. The 3 primary, 12 secondary, and 6 three-phase attributes are displayed around the outside of the phase circle. When using a touch screen Smartphone or Tablet display device, the user simply touches inside the phase circle to rotate the dots around the center of the phase circle, so they line up with the known conductor phase attribute. This rotation defines the tagging reference phase for the circuit.

Methods are described to provide a new and improved display of phase identification measurements in a three-phase power distribution network, that is easier and more intuitive to interpret and define tagging reference phase. A short sequence of individual phase measurements are displayed as dots inside a static phase attribute display circle. The 3 primary, 12 secondary, and 6 three-phase attributes are displayed around the outside of the phase circle. When using a touch screen Smartphone or Tablet display device, the user simply touches inside the phase circle to rotate the dots around the center of the phase circle, so they line up with the known conductor phase attribute. This rotation defines the tagging reference phase for the circuit.

A system maps and stores data in digital three-dimensional oscilloscope, wherein an ADC module has four ADC submodules. Four acquired waveform data are sent to an extraction module, and buffered in a FIFO module. When a trigger signal arrives, FIFO module outputs four extracted waveform data to a mapping address calculation module for calculating a mapping address and a RAM serial number for each point data, and the waveform data comparison and control module performs the reading and writing control of the 4N dual port RAMs. When mapping number reaches a frame number, the RAM array module outputs its waveform probability values to the upper computer module to convert each value into RBG values, and the display module displays the waveforms of input signals of four channels on a screen according the RBG values.

A measurement system for automated measurement of several contributions to signal degradation is provided. Said measurement system comprises a device under test, a signal analyzer, and a controller. In this context, the controller comprises at least one command sequence for the device under test and/or the signal analyzer. In addition to this, each of the at least one command sequence comprises respective commands to compensate for a specific cause of signal degradation.

The present invention provides a method for 3D waveform mapping of full-parallel structure, first, a 3D waveform mapping database is created according to the size of a 3D waveform image, the number of bits of probability value and the ADC's resolution of data acquisition module, then the 3D waveform mapping database is divided into M.sub.tM.sub.a independent mapping storage areas along the time axis and the amplitude axis, and each independent mapping storage area is assigned a RAM, then RAMs are selected and addresses are calculated based on the sampling values and the structure of created 3D waveform mapping database, finally, parallel mappings are performed simultaneously on the time axis and the amplitude axis according to the selected RAMs and calculated addresses. Thus, the mapping time are shorten, especially in vector mapping mode, several RAMs are used for mapping, so the WCR of DSO is improved.

A measurement device, which provides for a visualization of multiple measurement channels, is provided. The measuring device includes n measurement channels configured to receive up to n signals, wherein n is an unsigned integer. The measuring device further includes a processor configured to activate or deactivate each of the n measurement channels, wherein nk measurement channels are activated, wherein k is an unsigned integer, kn and k represents the number of deactivated measurement channels. The measuring device further includes a display. The processor is configured to control the display to display nkj traces of the n signals, wherein j is an unsigned integer, jk and j represents a number of measurement channels that are not displayed.

A multi-level logic analyzer for analyzing multi-level digital signals comprises a plurality of signal inputs, each signal input being configured to receive a multi-level digital signal, a plurality of comparison units, each comparison unit comprising a first comparator input and a second comparator input and being configured to compare a signal received at the first comparator input with a signal received at the second comparator input, and first switching means configured to couple at least one of the signal inputs with the first comparator inputs of at least two of the comparison units.

A waveform display device displays first and second waveform data whose value changes with respect to a time axis. Based on a first point on the first waveform data, a second point on the second waveform data which is in a correspondence with the first point is obtained. Correspondence data indicating a correspondence between the first point and the second point is generated. Then, based on the correspondence data, the first and second waveform data is displayed in a manner such that a predetermined point (a reference point) on the first waveform data and a point on the second waveform data which is in a correspondence with the reference point overlap one another on a time axis.