The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

A method for oscilloscope 3D mapping in scan mode. The input signal is acquired using a real-time sampling rate which is D.sub.r times higher, thus more sampling points, i.e. D.sub.r acquired data can be obtained during the time interval between two consecutive horizontal pixels. The D.sub.r acquired data are mapped into a same column of the screen to implement fluorescent waveform display. In addition, to realize the scanning display, a flag X is introduced into the three-dimensional database, when the screen refresh signal arrives, the first D.sub.s acquired data are read out from the unread acquired data in FIFO memory. The three-dimensional database is updated from the flag X, which make the leftmost waveform always be the oldest waveform, the rightmost waveform always be the newest waveform. Thus the 3D mapping is realized in scan mode, letting the DSO have a fluorescent waveform display at slow time-base.

A waveform display device includes: an operation accepting unit for accepting operation by a user; and a display controller for generating waveform display screen including a program pattern waveform for program control and an actual measurement waveform based on measurement data obtained as a result of the program control, with the program pattern waveform and the actual measurement waveform being superimposed on each other, and a cursor indicating a section between a past time area showing a program pattern waveform and an actual measurement waveform in the past time and a future time area showing a future program pattern waveform. The operation accepting unit is configured to accept scroll operation for changing a position of the cursor in the waveform display screen. The display controller is configured to change the position of the cursor in the waveform display screen in accordance with the scroll operation.

A digital oscilloscope includes a video input interface, a data processing system, a video output interface, and a clock system. The video input interface is configured to receive a digital video signal; the data processing system receives the digital video signal and processes the digital video signal to generate an oscillogram signal, which includes an oscillogram image and further includes one of a menu image and a frame image of the digital video signal; and the video output interface is connected to the data processing system, receives the oscillogram signal and outputs it to external terminals. The oscilloscope can display a variety of image information, with high intuitiveness, simplified structure, improved portability, and is convenient to use in outdoor places.

An oscilloscope includes a time domain input, a logic domain input, and a frequency domain input. The time domain input provides a time domain input signal in a time domain as a first input signal. The logic domain input provides logic level input as a second input signal. The logic level input includes logic levels over time. The frequency domain input provides a third input signal through frequency downconversion.

An arrangement for signal analysis provides at least one central data-processing unit and a screen unit connected to the at least one central data-processing unit, wherein the central data-processing unit calculates a spectrum and a spectrogram from a digitised signal. The at least one central data-processing unit is embodied in such a manner that it controls the screen unit in such a manner that the spectrogram of the digitised signal, the characteristic of the spectrum of the digitised signal and the characteristic of the digitised signal present in the time domain can be displayed together on the screen unit.

A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

The present invention provides a method for 3D waveform mapping of full-parallel structure, first, a 3D waveform mapping database is created according to the size of a 3D waveform image, the number of bits of probability value and the ADC's resolution of data acquisition module, then the 3D waveform mapping database is divided into M.sub.tM.sub.a independent mapping storage areas along the time axis and the amplitude axis, and each independent mapping storage area is assigned a RAM, then RAMs are selected and addresses are calculated based on the sampling values and the structure of created 3D waveform mapping database, finally, parallel mappings are performed simultaneously on the time axis and the amplitude axis according to the selected RAMs and calculated addresses. Thus, the mapping time are shorten, especially in vector mapping mode, several RAMs are used for mapping, so the WCR of DSO is improved.

A measurement apparatus comprising a detection unit configured to provide measurement tuples, each measurement tuple (T) including a high frequency signal amplitude (a) of a high frequency signal (S); and a coding unit configured to encode the high frequency signal amplitude (a) of each provided measurement tuple.

A signal analyzing circuit is described, with at least a first channel, the first channel comprising a digitizer configured to digitize an input signal into a time-and-value-discrete signal; a switching unit coupled to the digitizer, the switching unit being adapted to receive the time-and-value-discrete signal and an acquisition memory coupled to the switching unit. The switching unit is adapted to selectively activate a decimator unit in a time-domain operation mode, the decimator unit decimating the time-and-vale-discrete signal to a decimated time-and-value-discrete signal or a digital down converter unit in a spectrum view operation mode, the digital down converter unit down-converting the time-and-value-discrete signal to a down-converted time-and-value-discrete signal. The aid acquisition memory is coupled to the decimator unit in the time-domain operation mode to store the decimated time-and-value-discrete signal, the acquisition memory being not coupled to the digital down converter unit in the time-domain operation mode. The acquisition memory is coupled to the digital down converter unit in the spectrum view operation mode to store the down-converted time-and-value-discrete signal, the acquisition memory being not coupled to the decimator unit in the spectrum view operation mode. In addition, an oscilloscope and a method for auto setting an oscilloscope are described.