A digital oscilloscope includes a video input interface, a data processing system, a video output interface, and a clock system. The video input interface is configured to receive a digital video signal; the data processing system receives the digital video signal and processes the digital video signal to generate an oscillogram signal, which includes an oscillogram image and further includes one of a menu image and a frame image of the digital video signal; and the video output interface is connected to the data processing system, receives the oscillogram signal and outputs it to external terminals. The oscilloscope can display a variety of image information, with high intuitiveness, simplified structure, improved portability, and is convenient to use in outdoor places.

A measuring system has an analog-to-digital converter, an acquisition memory, a processing unit, and a display memory. The processing unit is adapted to decode a digital signal according to a protocol creating a decoded signal and to evaluate the decoded signal at a cursor position. The digital data generated by decoding the decoded signal at the cursor position is stored in the display memory. Further, a method for analyzing an analog signal according to a protocol is shown.

This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events occurred. The trigger may be generated based on a timeout signal, or based on another event, trigger, or signal. Stored data in the acquisition memory may be marked relative to the detection of the final event. An external forced timeout signal may control which in a series of events is marked as a final event. The triggering on final event may be enabled after another trigger is satisfied, and may be used as one of many different types of triggers.

Methods for analyzing a measured signal, and a measurement unit for carrying out these methods, are provided. The method includes, acquiring at least a first segment and a second segment of the measured signal by a measurement unit; storing the at least a first segment and a second segment in an acquisition memory of the measurement unit; applying a filter on the at least a first segment and a second segment; and storing at least one segment of the at least a first segment and a second segment that corresponds to the filter into at least one of a display memory and a processor memory of the measurement unit.

A multifunction testing and measuring device having a probe body with an elongated portion extending outward from a rearward main body portion to a hook-shaped forward end, the hook-shaped end useful for isolating a conductor under test, a slide closure member adapted to slide longitudinally forward from a rearward open position to a forward closed position, the closed position useful to capture the conductor under test within a space encircled by the combination of the hook-shaped end, the closed slide closure member, and the rearward main body, with the space encircled including a current sensing zone, and having test leads integral to and stowable on the main body. The multi tester comprises circuitry adapted for detecting a magnetic flux generated by an electric current passing through the conductor under test positioned within the current sensing zone, for sensing current and inrush current, as well as selectably measuring voltage, continuity, and resistance between the test leads.

A measuring system has an analog-to-digital converter, an acquisition memory, a processing unit, and a display memory. The processing unit is adapted to decode a digital signal according to a protocol creating a decoded signal and to evaluate the decoded signal at a cursor position. The digital data generated by decoding the decoded signal at the cursor position is stored in the display memory. Further, a method for analyzing an analog signal according to a protocol is shown.

A waveform display device includes: an operation accepting unit for accepting operation by a user; and a display controller for generating waveform display screen including a program pattern waveform for program control and an actual measurement waveform based on measurement data obtained as a result of the program control, the program pattern waveform and the actual measurement waveform being superimposed on each other, and a cursor indicating a section between a past time area showing a program pattern waveform and an actual measurement waveform in the past time and a future time area showing a future program pattern waveform. The operation accepting unit is configured to accept scroll operation for changing a position of the cursor in the waveform display screen. The display controller is configured to change the position of the cursor in the waveform display screen in accordance with the scroll operation.

A multifunction testing and measuring device having a probe body with an elongated portion extending outward from a rearward main body portion to a hook-shaped forward end, the hook-shaped end useful for isolating a conductor under test, a slide closure member adapted to slide longitudinally forward from a rearward open position to a forward closed position, the closed position useful to capture the conductor under test within a space encircled by the combination of the hook-shaped end, the closed slide closure member, and the rearward main body, with the space encircled including a current sensing zone, and having test leads integral to and stowable on the main body. The multi tester comprises circuitry adapted for detecting a magnetic flux generated by an electric current passing through the conductor under test positioned within the current sensing zone, for sensing current and inrush current, as well as selectably measuring voltage, continuity, and resistance between the test leads.

A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.

The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.