A measurement system including a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner. The measurement device includes a control circuit. The first probe unit includes an interface module being configured to receive a user input, to generate an input data signal based on the received user input, and to provide the input data signal to the control circuit. The control circuit is configured to generate and provide a control signal at least to the second probe unit based on the input data signal. At least the second probe unit is configured to adjust an operational parameter based on the control signal, wherein the operational parameter relates to a measurement parameter to be measured Moreover, a method for operating a measurement system is disclosed.

Provided is a waveform display device that can easily designate an analysis target range just by selecting a location to be analyzed with regard to a tool trajectory. This waveform display device comprises: a positional information acquisition unit that acquires, from a control device that controls a machine tool, motor positional information for a drive shaft of the machine tool during workpiece machining; a shaft information setting unit that sets shaft information indicating the shaft configuration of the drive shaft of the machine tool; a tool trajectory display unit that calculates the trajectory of a tool tip point during workpiece machining by a tool mounted on the machine tool on the basis of the motor positional information and the shaft information and displays the trajectory as a waveform; an analysis target setting unit that sets an analysis target position relating to the trajectory of the tool tip point; an analysis target range generation unit that generates and displays an analysis target range containing a solid body including the set analysis target position; and a measurement point sorting unit that sorts out and displays a measurement point included in the analysis target range generated by the analysis target range generation unit from within the trajectory of the tool tip point.

A digital data rate enhancement filter is described. The digital data rate enhancement filter-includes an enhancement filter input, a first interpolation filter, a second interpolation filter, and a multiplexer circuit. The first interpolation filter is connected to the enhancement filter input downstream of the enhancement filter input. The second interpolation filter is connected to the first interpolation filter downstream of the first interpolation filter. The enhancement filter input is configured to receive a digital input signal set. The first interpolation filter is configured to receive the digital input signal set and to interpolate the digital input signal set, thereby obtaining a first interpolated signal set. The second interpolation filter is configured to receive the first interpolated signal set and to interpolate the first interpolated signal set, thereby obtaining a second interpolated signal set. The multiplexer circuit is configured to selectively receive the first interpolated signal set and/or the second interpolated signal set. The multiplexer circuit further is configured to output the first interpolated signal set and/or the second interpolated signal set received. Further, a digital data rate reduction filter and a digital oscilloscope are described.

A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.

A measurement apparatus is provided for measuring signals from a device under test (DUT). The measurement apparatus includes a time domain receiver configured to receive from the DUT a time domain signal in a time domain; a logic domain receiver configured to receive from the DUT a logical signal comprising logic levels over time; a frequency domain receiver configured to receive from the DUT a frequency domain signal in a frequency domain through frequency downconversion; and a controller coupled to the logic domain receiver, and configured to determine the logic levels over time of the logical signal and to control at least one parameter of the frequency domain signal in response to the determined logic levels.

A method for improving frequency response of a high-speed data acquisition device includes sampling signals received at an input of the high-speed data acquisition device at a first sampling rate and generating a digital data stream representative of the sampled input signals. The digital data stream is interpolated to generate an interpolated digital signal with a higher sample rate than the first sampling rate, and one or more finite impulse response (FIR) filters are applied to the interpolated digital signal to generate a filtered digital signal. The filtered digital signal corrects for: parasitic and/or expected response of elements from the network of resistors and capacitors in the anti-aliasing filter in the high-speed data acquisition device, and select anti-aliasing filter response characteristics. The filtered digital signal is decimated to reduce the sampling rate of the filtered digital signal and generate a decimated digital signal.

A real-time spectrum analyzer (RSTA) includes an analog-to-digital converter (ADC) configured to convert in an input analog signal into a digital input data stream, a fast Fourier transform (FFT) unit configured to generate FFTs of the digital input data stream for successive time slices of the input analog signal, wherein the FFTs of each time slice are grouped into FFT bins, each FFT bin including the FFTs of a given frequency band, a first detector configured to reduce a number of FFTs per bin generated by the FFT unit and output a corresponding thinned FFT data stream for each of the successive time slices, a second detector configured to compress the thinned FFT data stream output by the first detector and output a compressed FFT data stream for each of the successive time slices, an FFT plotter configured to generate first display data representing an FFT plot of a given time slice of the input analog signal from the thinned FFT data stream output by the first detector, and a spectrogram plotter configured to generate second display data of a spectrogram of the given time slice and previous time slices of the input analog signal from the compressed FFT data stream output by the second detector.

A test and measurement instrument includes an acquisition memory and a processor structured to store a stream of sampled incoming data samples in the acquisition memory. As the memory fills, the instrument automatically decimates either the data samples already stored in the acquisition memory, the incoming data samples, or both. The instrument may also store two copies of the incoming data samples, one at an increased decimation rate. The two copies are tied together with a timestamp or using other methods. The more highly decimated copy may be used to produce a video output of the stored data samples, saving the instrument from generating the video output from the larger sized sample.

The present disclosure provides an oscilloscope post processing system for an oscilloscope, the oscilloscope post processing system comprising an acquisition memory that stores samples that represent at least one signal acquired by the oscilloscope, and an interval selector that is coupled to the acquisition memory and reads at least some of the stored samples from the memory and outputs at least one first set of the stored samples and at least one second set of the stored samples. Further, the present disclosure provides a respective method, and a respective measurement device.

A method and system provide for measuring a repeating waveform of a SUT. The method includes repeatedly sampling first and second copies of the SUT to provide first SUT waveforms including first noise introduced by a first digitizer and second SUT waveforms including second noise introduced by a second digitizer; pairing the first and second SUT waveforms to provide corresponding pairs of first and second digital samples; organizing the pairs of first and second digital samples into groups of sample pairs corresponding to sampling times; for each group, calculating a covariance of the first and second digital samples to estimate a signal variance of the SUT, and scaling the first and second digital samples to preserve a mean of the group while adjusting a variance of the group to match the estimated signal variance of the SUT at the corresponding sampling time; and reassembling the groups into the SUT waveform.