A measuring device includes a signal-processing unit for the registration of a first signal in the time domain and a histogram-generating unit for the indirect generation of a histogram in the frequency domain from the first signal. The histogram-generating unit provides a frequency grid-point variation unit.

Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accuracy. In particular, the high accuracy data may be temporarily stored and analyzed upon the operation mode is changed from the real-time mode to the off-line mode.

A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

Embodiments of the invention provide a capability of determining an input impedance of a connected Device Under Test based on Waveform Monitoring of an output signal of a waveform generator. Using embodiments of the invention, the input impedance of DUT is determined from the waveform monitoring results. The impedance information of the DUT together with the actual waveform provided to the DUT allows systems according to embodiments of the invention capable of characterizing circuit behavior for performance optimizing and issue debugging for the DUT.

A measuring device comprises an interface, adapted to acquire a measuring signal, a triggering unit, adapted to determine at least one condition of the measuring signal based on an initial triggering condition, and a storage unit adapted to store data words, comprising changes of the at least one condition of the measuring signal and instances in time at which the changes of the at least one condition occur. Moreover, the measuring device comprises a parameter determination unit, adapted to determine at least one parameter from the data words and a parameter histogram unit, adapted to determine a parameter histogram of the at least one parameter.

A measuring device comprises an interface, adapted to acquire a measuring signal, a triggering unit, adapted to determine at least one condition of the measuring signal based on an initial triggering condition, and a storage unit adapted to store data words, comprising changes of the at least one condition of the measuring signal and instances in time at which the changes of the at least one condition occur. Moreover, the measuring device comprises a parameter determination unit, adapted to determine at least one parameter from the data words and a parameter histogram unit, adapted to determine a parameter histogram of the at least one parameter.

This specification discloses methods and systems for implementing a chip integrated scope (i.e., chip scope (CS)), which is a feature that allows a user to scope RF signals (internally and externally to the DUT (device under test)), by using the RF receive path (including amplifier, filter, ADC, DSP) to capture and store signal traces. In some embodiments, this specification discloses methods and systems to enhance the sampling rate and resolution of these signal traces by using subsampling techniques where a post-processing merges the subsampled traces (with different phase-shifts of say, for example, 0, 90, 180, and 270) into a single trace that will appear to have a sampling rate that is higher than a pre-determined sampling rate used to collect these subsampled traces.

A continuous-time sampler has series-connected delay lines with intermediate output taps between the delay lines. Signal from an output tap can be buffered by an optional voltage buffer for performance. A corresponding controlled switch is provided with each output tap to connect the output tap to an output of the continuous-time sampler. The delay lines store a continuous-time input signal waveform within the propagation delays. Controlling the switches corresponding to the output taps with pulses that match the propagation delays can yield a same input signal value at the output. The continuous-time sampler effectively holds or provides the input signal value at the output for further processing without requiring switched-capacitor circuits that sample the input signal value onto some capacitor. In some cases, the continuous-time sampler can be a recursively-connected delay line. The continuous-time sampler can be used as the front end sampler in a variety of analog-to-digital converters.

A photocurrent scanning system comprises a laser generating device, a focusing device, a displacement adjustment device, a bias supply device, and a measuring device. The laser generating device is used to emit a laser. The focusing device is used to focus the laser to a surface of a sample. The displacement adjustment device is used to place the sample and adjust a position of the sample, to make the laser focused onto different parts of the surface of the sample. The bias supply device is used to supply a voltage to the sample. The measuring device is used to measure a photocurrent signal flowing through the sample.

An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.