A waveform segmentation device has a state level estimation unit that estimates a state level of input waveform data, and a segmentation identification unit that segments the waveform data at a plurality of segmentation points based on the state level estimated by the state level estimation unit. The segmentation identification unit may identify the plurality of segmentation points such that a feature value of the waveform data is included between two adjacent segmentation points among the segmentation points.

A transmitter includes a shift register, a lookup table, and a digital to analog converter. The shift register is configured to receive an input signal and to output delayed copies of the input signal. The lookup table is configured to store compensation values estimated based on the input signal and the delayed copies of the input signal. The digital to analog converter is configured to output a transmit signal based on the input signal and the compensation values. The compensation values are designed to mitigate distortion of the transmit signal from conversion of the input signal to a digital signal.

The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.

A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.

A real-time spectrum analyzer includes an ADC for providing digitized time domain data, an acquisition control unit for selectively acquiring the time domain data, a processing unit and a display unit. The processing unit includes a domain conversion engine configured to convert the acquired time domain data to frequency domain data, first and second display engines configured to generate first and second display data according to first and second display modes, a frequency content based trigger unit configured to generate a frequency content based trigger signal when the frequency domain data meet a first predetermined trigger condition, and a trigger based enabler configured to generate an enable signal for selectively gating the second display engine in response to the frequency content based trigger signal, such that the second display engine stops generating the second display data, while the first display engine continues to generate the first display data.

Embodiments of the invention provide a capability of determining an input impedance of a connected Device Under Test based on Waveform Monitoring of an output signal of a waveform generator. Using embodiments of the invention, the input impedance of DUT is determined from the waveform monitoring results. The impedance information of the DUT together with the actual waveform provided to the DUT allows systems according to embodiments of the invention capable of characterizing circuit behavior for performance optimizing and issue debugging for the DUT.

The present invention provides a measurement device for measuring a number of physical variables, the measurement device comprising a number of parameter inputs, wherein the parameter inputs are configured to receive parameter values, which configure at least one function of the measurement device, a calculation unit, which controllably performs calculation functions with at least one parameter value provided in a respective parameter input and replaces the parameter value in the respective parameter input with the result of the calculation, and a number of function keys, wherein every function key controls the calculation unit to perform a predetermined one of the calculation functions.

A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

A method, apparatus, and energy metering system obtains mains samples of a mains power line signal, performs non-white noise (NWN) filtering of the mains power line signal, obtains adjustable clock source samples of an adjustable clock signal of an adjustable clock oscillator, determines a difference based on the mains samples and the adjustable clock source samples, adjusts an adjustable clock source frequency of the adjustable clock oscillator based on the difference, and applies the adjustable clock source frequency to an analog to digital converter (ADC) to determine a conversion rate of the ADC.

A method, apparatus, and energy metering system obtains mains samples of a mains power line signal, performs non-white noise (NWN) filtering of the mains power line signal, obtains adjustable clock source samples of an adjustable clock signal of an adjustable clock oscillator, determines a difference based on the mains samples and the adjustable clock source samples, adjusts an adjustable clock source frequency of the adjustable clock oscillator based on the difference, and applies the adjustable clock source frequency to an analog to digital converter (ADC) to determine a conversion rate of the ADC.