A mechanism is included for receiving a phase modulated optical signal. The phase modulated signal is modulated by a remote electrical test signal at a sensor head. A reference optical signal is also received. A phase difference between the phase modulated optical signal and the reference optical signal is then determined. The phase difference is employed to recover the remote electrical test signal from the sensor head. The phase difference may be determined by employing a phase modulator in a controller that tracks a phase modulator in the sensor head. The phase difference may also be determined by comparison of the signals in the complex signal domain.

A fiber optic sensor and related method are described, with the sensor including a cross-coupling element in the optical path between a polarizing element and a sensing element, but separated from the sensing element itself; with the cross-coupling element generating a defined cross-coupling between the two orthogonal polarization states of the fundamental mode of a polarization maintaining fiber guiding light from the light source to the sensing element thus introducing a wavelength-dependent or temperature-dependent sensor signal shift to balance wavelength-dependent or temperature-dependent signal shifts due to other elements of the sensor, particularly signal shifts due to the wavelength dependence of the Faraday effect or the electro-optic effect constant.

A system detects and/or predicts metal ion plating events of a metal ion energy storage device. The system includes an optical sensor disposed internally within or externally on a metal ion energy storage device wherein the optical sensor has an optical output that changes in response to strain within a metal ion energy storage device. A current sensor senses current through the metal ion energy storage device. Plating detection circuitry measures a wavelength shift in the optical output of the optical sensor and estimates a state of charge (SOC) of the metal ion energy storage device based on the current. An expected wavelength shift is determined from the estimated SOC. A plating event can be detected and/or predicted based on the difference between the expected wavelength shift and the measured wavelength shift.

Within electrical test equipment systems comparator bridges are employed to provide the required dynamic range, accuracy, and flexibility. However, whilst bridge based measurement configurations remove many of the issues associated with making measurements at accuracies of sub-parts, a part, or few parts per million they still require, in many instances, that a null point be determined where the bridge is balanced. However, this becomes increasingly difficult within electrically noisy environments, with modern digital multimeters, and where the desired measurement point within the electrical system is physically difficult to access particularly when improved accuracy in calibration, standards, and measurements on circuits and components means measurement systems must operate at 50 parts per billion (ppb) and below. In order to address this, a null detector design is provided supporting operation within such electrically noisy environments with physical separation of the null detector measurement circuit from the electrical test equipment.

A fiber optic sensor and related method are described, with the sensor including a cross-coupling element in the optical path between a polarizing element and a sensing element, but separated from the sensing element itself; with the cross-coupling element generating a defined cross-coupling between the two orthogonal polarization states of the fundamental mode of a polarization maintaining fiber guiding light from the light source to the sensing element thus introducing a wavelength-dependent or temperature-dependent sensor signal shift to balance wavelength-dependent or temperature-dependent signal shifts due to other elements of the sensor, particularly signal shifts due to the wavelength dependence of the Faraday effect or the electro-optic effect constant.

A sensor head of a test and measurement instrument can include an input configured to receive an input signal from a device under test (DUT), an optical voltage sensor having signal input electrodes and control electrodes or one set of electrodes, wherein the input is connected to the signal input electrodes, and a bias control unit connected to the control electrodes and configured to reduce an error signal or the input signal bias control signal are electrically combined and applied to a single set of electrodes.

A system detects and/or predicts metal ion plating events of a metal ion energy storage device. The system includes an optical sensor disposed internally within or externally on a metal ion energy storage device wherein the optical sensor has an optical output that changes in response to strain within a metal ion energy storage device. A current sensor senses current through the metal ion energy storage device. Plating detection circuitry measures a wavelength shift in the optical output of the optical sensor and estimates a state of charge (SOC) of the metal ion energy storage device based on the current. An expected wavelength shift is determined from the estimated SOC. A plating event can be detected and/or predicted based on the difference between the expected wavelength shift and the measured wavelength shift.

The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.

An electric field sensor includes a light source; an electro-optical crystal, a first separator, a first wavelength plate, first and second light receivers, a differential amplifier, and a controller. The electro-optical crystal has light from the light source incident thereon and receives an electric field generated by an object. The first separator separates light emitted from the electro-optical crystal into a P wave and an S wave. The first wavelength plate changes a phase of light at a pre-stage of the first separator. The first and second light receivers receive the P wave and S-wave light respectively, and convert the received light into first and second electrical signals, respectively. The differential amplifier generates a differential signal between the first and second electrical signals. The controller adjusts a wavelength of the light source such that an output value of a direct-current component of the differential amplifier is within a value range.

A method of measuring fluctuations in electric fields is disclosed, the method comprising the step of: placing a Liquid Crystal Device in communication with the electric field, the device having disparate orthogonal polarization sensitivity to an external electric field; utilizing an optical probe beam having a known polarization state to interrogate the liquid crystal of the liquid crystal device to produce a response beam; and analyzing the polarization state of the response beam to provide an indicator of the corresponding fluctuations in the electric field.