Aspects of the disclosure provide for a circuit. In some examples, the circuit includes a Zener diode, a first current source, a first n-type field effect transistor (FET), a first inverter circuit, and a second current source. The Zener diode has a cathode coupled to a first node and an anode coupled to a second node. The first current source has a first terminal coupled to the second node and a second terminal coupled to a ground terminal. The first n-type FET has a gate terminal coupled to the second node, a source terminal coupled to the ground terminal, and a drain terminal coupled to a third node. The first inverter circuit has an input coupled to the third node and an output coupled to a fourth node. The second current source has a first terminal coupled to a fifth node and a second terminal coupled to the third node.

Aspects of the invention include a first voltage sensitive circuit including first transistors, the first transistors being coupled together so as to be operatively coupled to a first current source. A second voltage sensitive circuit includes second transistors, the second transistors being coupled together so as to be operatively coupled to a second current source, the first voltage sensitive circuit being coupled to the second voltage sensitive circuit to form a delay chain, the first and second current sources being responsive to changes in voltage of a power supply according to a voltage reference. A voltage sensitive current reference module is coupled to the first and second current sources and configured to supply the voltage reference to the first and second current sources, the voltage sensitive current reference module being responsive to changes in the voltage of the power supply.

A test verification circuit is described herein for verifying proper operation of a tested circuit, such as a voltage hazard warning circuit, using an N-channel MOSFET configured for switching ON and OFF the test verification circuit during a power outage, and a voltage source that provides an input voltage to the N-channel MOSFET from a conserved power supply. The N-channel MOSFET provides temporary power from a conserved power supply to the test verification circuit upon activation by a user during a power outage, and the test verification circuit determines whether the tested circuit has been de-energized, remains energized, or there remains inadequate power to complete the test.

A current detecting circuit includes a first switching element, a second switching element, and a third switching element electrically coupled in series with the first switching element. An output side of the third switching element is electrically coupled to an output terminal. The current detecting circuit includes a current amplifier configured to detect a difference between a first output voltage of the first switching element and a second output voltage of the second switching element. The current amplifier outputs a relative current to be used for detecting an output current that flows out from the output terminal. A ratio of resistance associated with the first switching element to resistance associated with the second switching element is n:1.

Methods, apparatus, systems and articles of manufacture are disclosed for current sensing and current limiting. An example apparatus includes a first main transistor including a first main transistor gate terminal coupled between an output terminal and an intermediate node; a second main transistor including a second main transistor gate terminal coupled between the intermediate node and a ground terminal; a first amplifier including a first amplifier output coupled to the first main transistor gate terminal; a second amplifier including a second amplifier output coupled to the second main transistor gate terminal; and a third amplifier including a third amplifier inverting input coupled to the intermediate node, a third amplifier non-inverting input coupled to a sense transistor, and a third amplifier output coupled to a third gate terminal of a third transistor.

In some examples, an integrated circuit includes a plurality of power modules formed on a substrate, including a first power module located between second and third power modules. The first power module is configured to conduct a load current, and includes a power transistor and first and second sense transistors. The first sense transistor is disposed at a first position between the second power module and a central axis of the first power module, and the second sense transistor is disposed at a second position between the third power module and the central axis. The first sense transistor is configured to conduct a first sense current; and the second sense transistor is configured to conduct a second sense current. The first and second sense transistors are configured to direct the first and second sense currents toward a measurement circuit that is configured to determine a derived sense current indicative of the load current.

An electronic circuit comprises a power switch circuit and a fault detection circuit. The power switch circuit includes a transistor. The fault detection circuit includes a first comparator circuit configured to compare a monitored voltage of the transistor to a detection threshold voltage and produce an indication of a circuit fault according to the comparing, and a delay circuit configured to delay the comparing by the first comparator circuit according to slew rate of the monitored voltage.

A circuit and method for detecting a failure of a switching power device is disclosed. The circuit and method utilize a Kelvin connection of a four-terminal configuration of the switching power device to sense a resistance of at least one wire-bond. The resistance corresponds to a defect or defects in the at least one wire-bond and so it can be used to detect a failure before damage occurs. A threshold used for detecting the failure can be adjusted to accommodate variations in the switching power device and/or the application in which it is being used. Additionally, the failure detection is carried out at a period after the switching power device is turned ON to prevent switching transients from affecting the detection.

System and method for charging or discharging one or more batteries. For example, a battery management system for charging or discharging one or more batteries includes: a first transistor including a first transistor terminal, a second transistor terminal, and a third transistor terminal, the second transistor terminal being configured to receive a first drive signal; a second transistor including a fourth transistor terminal, a fifth transistor terminal, and a sixth transistor terminal, the fifth transistor terminal being configured to receive a second drive signal; a burst mode detector configured to receive the first drive signal and generate a burst-mode detection signal based at least in part on the first drive signal; and a drive signal generator configured to receive the burst-mode detection signal and generate the first drive signal and the second drive signal based at least in part on the burst-mode detection signal.

An apparatus and method for diagnosing whether a charging and discharging switching element provided on a charging and discharging path of a battery pack operates normally. A charging and discharging switching unit having a charging and discharging switch and a fuse is installed on a charging and discharging path between a battery cell and a pack terminal. The apparatus includes a first diagnosing path a second diagnosing path, a third diagnosing path, an integrated diagnosing path having a diagnosis switching unit and a diagnosis resistor, a voltage measuring unit, and a control unit configured to turn on and off the diagnosis switching unit and determine whether the charging and discharging switching unit is operating abnormally based on the diagnosis voltage measured by the voltage measuring unit.