A voltage sampling system is provided. The voltage sampling system includes a voltage sampling device, two optic-fiber transmission lines and a control device. The voltage sampling device includes a voltage-dividing resistor module, a common mode rejection circuit and an analog-to-digital converter. The voltage-dividing resistor module generates a first and a second divided voltages according to a voltage source. The common mode rejection circuit receives the first and the second divided voltages to perform a common-mode noise rejecting process to generate an output voltage. The analog-to-digital converter converts the output voltage to generate a digital data signal. The two optic-fiber transmission lines transmit the digital data signal and a clock signal respectively. The control device receives the digital data signal from the analog-to-digital converter and the clock signal to perform a digital data processing.

Some embodiments are directed to a process device comprising a process variable sensor configured to generate an output signal indicative of a sensed process variable; loop current output circuitry configured to control a loop current on a two wire process control loop to a value based on the output signal; loop current measurement circuitry coupled to the process control loop and configured to generate a measured loop current value based on the loop current; and loop current verification circuitry configured to approximate the loop current value based on the output signal and properties of a low pass filter, and generate a diagnostic signal based on a comparison of the approximated loop current value and the measured loop current value.

A method measures a characteristic of a SUT using a signal measurement device having multiple input channels. The method includes digitizing first and second copies of the SUT in first and second input channels to obtain first and second digitized waveforms; repeatedly determining measurement values of the SUT characteristic in the first and second digitized waveforms to obtain first and second measurement values, respectively, each second measurement value being paired with a first measurement value to obtain measurement value pairs; multiplying the first and second measurement values in each of the measurement value pairs to obtain measurement products; determining a mean-squared value (MSV) of the SUT characteristic measurement; and determining a square root of the MSV to obtain a root-mean-squared (RMS) value of the measured SUT characteristic, which substantially omits variations not in the SUT, which are introduced by only one of the first or second input channel.

An inductor current detecting circuit is provided. A differentiator circuit differentiates a high-side voltage signal to generate a first differential signal, and differentiates a low-side voltage signal to generate a second differential signal. A first current source outputs a first charging current according to the first differential signal. A second current source outputs a second charging current according to the second differential signal. First and second terminals of a first switch are respectively connected to the first current source and a first terminal of a second switch. A second terminal of the second switch is connected to the second current source. Two terminals of a capacitor are connected to the second terminal of the first switch and the second current source respectively. The first switch and the second switch are alternately turned on to obtain a continuous waveform.

A voltage-glitch detection and protection circuit and method are provided. Generally, circuit includes a voltage-glitch-detection-block (GDB) and a system-reset-block coupled to the GDB to generate a reset-signal to cause devices in a chip including the circuit to be reset when a voltage-glitch in a supply voltage (VDD) is detected. The GDB includes a voltage-glitch-detector coupled to a latch. The voltage-glitch-detector detects the voltage-glitch and generates a PULSE to the system-reset-block and latch. The latch receives the PULSE and generates a PULSE_LATCHED signal to the system-reset-block to ensure the reset-signal is generated no matter a width of the PULSE. In one embodiment, the latch includes a filter and a sample and hold circuit to power the latch, and ensure the PULSE_LATCHED signal is coupled to the system-reset-block when a voltage to the GDB or to the latch drops below a minimum voltage due to the voltage-glitch.

A novel nonlinear impulse sampler is presented that provides a clock sharpening circuit, sampling stage, and post-sampling block. The clock sharpening circuit sharpens the incoming clock while acting as a buffer, and the sharpened clock is fed to the input of the sampling stage. The impulse sampling stage has two main transistors, where one transistor generates the impulse and the other transistor samples the input signal. Post-sampling block processes the sampled signal and acts as a sample and hold circuit. The architecture uses an ultrafast transmission-line based inductive peaking technique to turn on a high-speed sampling bipolar transistor for a few picoseconds. It is shown that the sampler can detect impulses as short as 100psec or less.

A digital multimeter stores multiple sequential measurements of physical or electrical parameters. Each of the sequential measurements has a name including an automatically generated descriptor. The descriptor for each sequential measurement may indicate a relative position of the measurement within the sequence. For instance, the descriptor may indicate whether the measurement was obtained before or after other measurements in the sequence.

A measuring arrangement acquires signals of alternating electrical magnitudes. A sampling apparatus performs a sampling of the signals to form digital sample values. A clock tracking apparatus adapts a sampling clock used by the sampling apparatus in the light of the frequency of the signal to be sampled. In order to be able to acquire reliably signals of alternating electrical magnitudes even when they have different frequencies, the sampling apparatus samples at least two of the signals each with its own sampling clock and the clock tracking apparatus adapts the sampling clock in the light of the frequency of the signal to be sampled simultaneously for each of these at least two signals. There is also described a corresponding method for measuring electrical signals.

A current measurement system is configured to measure an alternating-current (AC) current flowing through a conductor. The AC current has a frequency within a measurement range. The system includes a current sensor and a shunt resistor. The current sensor includes a measurement coil configured to be magnetically coupled to the conductor. The shunt resistor has both ends electrically connected to both ends of the measurement coil, respectively. An output voltage across the both ends of the shunt resistor is saturated at a saturation point in a saturation frequency of the frequency of the AC current. An upper limit value of the measurement range including the frequency is higher than a fundamental frequency of the AC current. The saturation frequency is higher than or equal to the upper limit value. The current measurement system improves sensitivity to frequency components higher than the fundamental frequency of the AC current.

A system for analyzing waveform, applied to a servo motor system, includes a data-acquiring module, a waveform-constructing module, a sampling module, a data-processing module, and a deep learning module. The present system retrieves normal data, abnormal date, and real-time data for generating a normal waveform, an abnormal waveform, and a real-time waveform, and then samples normal sampling data from the normal data, abnormal sampling data from the abnormal data, and real-time sampling data from the real-time data. The data-processing module is utilized to add the normal data and the abnormal data to form corresponding total data. The deep learning module utilizes a deep learning model to identify whether or not the real-time waveform is the normal waveform or the abnormal waveform by evaluating the normal waveform, the abnormal waveform and the total data.