The invention relates to a distance-measuring device for determining a distance between a reflection body in a conducting structure and a coupling region for electromagnetic waves, which region is provided on an end section of the conducting structure, said measuring device comprising a transmitting and receiving device, and a conduction junction (1) provided on the coupling region, for coupling the transmitting and receiving device to the conducting structure containing a medium, in order to couple an electromagnetic wave into the conducting structure, and to decouple the electromagnetic wave, reflected on the reflection body, from the conducting structure. Said measuring device also comprises an evaluation device for determining the distance between the coupling region and the reflection body from the complex reflection coefficient between the coupled electromagnetic wave and the decoupled electromagnetic wave. The invention also relates to the corresponding method.

Non-liquid immersed transformers and methods of measuring aging degree of the transformers' insulation are disclosed. The transformers comprise a solid insulation inside the conductive coil and one or more floating electrodes in the solid insulation. At least a part of the conductive coil and the one or more floating electrodes may form one or more capacitive elements, respectively. An electrical parameter, e.g. complex permittivity, of the capacitive element is measured and the aging degree is calculated as a function of the electrical parameter measurement.

The present invention relates to diagnostic device for the characterization of electromagnetic material properties and a method of making and using same. Unlike current diagnostic devices, the disclosed diagnostic device comprises a novel waveguide system and is suitable for the characterization of electromagnetic material properties such as permittivity, permeability, and the loss tangent of materials over a broad temperature and pressure range.

A printed circuit board (PCB) may include a signal layer having a functional region and a PCB signal layer testing region. The PCB signal layer testing region may include a first differential pair having a first length formed on the signal layer, a second differential pair having a second length, different than the first length, formed on the signal layer and a third differential pair having a third length, different than the first length and different than the second length, formed on the signal layer.

A method for evaluating insulation includes applying and drying an insulation coating liquid on a simulated overlay part, and collecting first data about a first length of a first gap of a first applicator, a first thickness which has been increased by the insulation coating liquid, and a capacity of the simulated overlay part; applying and drying the insulation coating liquid on a current collector for a simulated pure insulation coating layer, and collecting second data about a second length of a second gap of a second applicator and a second thickness of the pure insulation coating layer; generating a relation between the second thickness and the capacity; measuring a thickness of a pure insulation coating layer of an electrode for evaluation; and determining a capacity of an overlay part of the electrode for evaluation from the measured thickness using the generated relation.

A complex dielectric sensor includes at least two voltage dividers to measure voltage amplitudes in a circuit of at least two impedances connected to a transducer probe. The impedances are configured to reduce amplification of raw error using relatively simple geometric calculations based on mapping the voltage amplitudes as a pair of intersecting circles in a complex admittance space. Instrument sensitivity can be optimized by selecting impedances with moduli in the complex admittance space that are similar in magnitude to the modulus of the sample admittance and by selecting impedances that cause characteristic directions of the voltage dividers (relative to the sample admittance in the complex admittance space) to be oriented as close to perpendicular to each other as possible.

The invention relates to a distance-measuring device for determining a distance between a reflection body in a conducting structure and a coupling region for electromagnetic waves, which region is provided on an end section of the conducting structure, said measuring device comprising a transmitting and receiving device, and a conduction junction (1) provided on the coupling region, for coupling the transmitting and receiving device to the conducting structure containing a medium, in order to couple an electromagnetic wave into the conducting structure, and to decouple the electromagnetic wave, reflected on the reflection body, from the conducting structure. Said measuring device also comprises an evaluation device for determining the distance between the coupling region and the reflection body from the complex reflection coefficient between the coupled electromagnetic wave and the decoupled electromagnetic wave. The invention also relates to the corresponding method.

A device for measuring characteristics of a wafer is provided. The device comprises a first circuit on the wafer and having a first number of parallelly connected oscillators, and a second circuit on the wafer and having the first number of parallelly connected oscillators; wherein a first portion of the second circuit is disconnected from a second portion of the second circuit.

A method for generating a calibration curve of asphalt concrete of a known mix. Initially, a single sample of the known asphalt concrete mix is obtained. The single sample has a known percent voids. A dielectric measurement of the single sample is obtained. Using only the dielectric measurement of the single sample, the sample's known percent voids, and a dielectric of air, a theoretical ideal dielectric for the asphalt concrete mix at 0% voids is computed. A dielectric vs. percent voids calibration curve is generated based on the computed ideal dielectric.

The present disclosure provides a measuring device, a measuring apparatus, and a measuring method for a dielectric constant of a liquid crystal. The measuring device includes: a first substrate and a second substrate disposed to be opposite to each other; a resonant structure layer disposed on a side of the first substrate facing the second substrate. a cavity for receiving the liquid crystal to be measured is defined between the first substrate and the second substrate. The above measuring device is applied to measurement of the dielectric constant of the liquid crystal in the terahertz wave band.