G01R29/0871

Measurement device for antenna systems

A measurement device for measuring performance of at least one antenna system in a first frequency band and in a second frequency band. The measurement device including an outer chamber having inwardly radio frequency reflective walls configured to enclose the antenna system, an inner chamber deployable inside the outer chamber, the inner chamber having radio frequency absorptive walls configured to enclose the antenna system, a first test antenna arrangement arranged inside the outer chamber and configured for a measurement operation in the first frequency band, and a second test antenna arrangement arranged inside the inner chamber and configured for a measurement operation in the second frequency band, thereby enabling measuring performance of the antenna system in a reflective radio frequency environment by the first test antenna arrangement and measuring performance in an essentially anechoic radio frequency environment by the second test antenna arrangement.

Evaluation method, estimation method, evaluation apparatus, and combined evaluation apparatus

The electromagnetic noise of a semiconductor device is conveniently evaluated, and the electromagnetic noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method is provided which includes causing one of a first device and a second device of a semiconductor device to perform a switching operation, the semiconductor device comprising the first device and second device connected in series and a third device and a fourth device connected to each other in series and connected parallel to a series circuit of the first device and second device; measuring voltage variation occurring between the third device and the fourth device during the switching operation; and outputting an evaluation benchmark for electromagnetic noise of the semiconductor device, based on the voltage variation.

FREQUENCY DEBUGGING BOARD, FREQUENCY DEBUGGING SYSTEM, AND METHOD FOR DEBUGGING ELECTRONIC DEVICE
20220357378 · 2022-11-10 · ·

A frequency debugging board includes a bottom plate; a variable capacitor and a plurality of first probes that are all disposed on the bottom plate, two ends of the variable capacitor being each connected to a first probe; and a plurality of second probes and at least one switch that are all disposed on the bottom plate, any two adjacent second probes being connected to each other through a switch.

NEAR-FIELD TEST METHOD, SYSTEM, READABLE STORAGE MEDIUM AND COMPUTER DEVICE
20230096422 · 2023-03-30 ·

A near-field testing method proposed in the present invention includes steps of: in a selected coordinate system, controlling a motion device to cause random relative movement of the DUT and the probe to generate multiple random test points, determining one or more postures of the probe, and obtaining the electromagnetic field coefficients corresponding the postures of the probe respectively; obtaining the measured values of the electromagnetic field signals collected by the probes, and obtaining a set of measured values; according to the set of measured values and the electromagnetic field coefficients according to the Lorenz reciprocity theorem in electromagnetism, and determining the electromagnetic field coefficients through convex optimization; obtaining, according to the electromagnetic field coefficients, the far field pattern of the DUT or the electric field and/or magnetic field at any point outside the DUT.

METHOD AND SYSTEM FOR COMPONENT MISMATCH COMPENSATION

A method and system of compensating for component mismatch are disclosed. An example system comprises an amplifier including a current ratio measurement engine (CRME) and a modulator (DSM). The CRME is configured to obtain measurements for each possible configuration of an amplifier circuit and to pass these measurements to a processor for analysis. In the example system, the measurements are obtained by driving a bias current through two or more circuit elements and measuring the ratio in current between the two or more circuit elements, which is representative of the relative mismatch between the two or more components. The DSM is configured to receive adjustment parameters from the processor and to tune the amplifier circuit according to the adjustment parameters to thereby improve the performance of the amplifier.

Power amplifiers testing system and related testing method

A testing system includes: a signal generator arranged to generate a testing signal; a dividing circuit coupled to the signal generator for providing a plurality of input signals according to the testing signal; and a plurality of power-amplifier chips coupled to the dividing circuit for being tested by generating a plurality of output signals for a predetermined testing time according to the plurality of input signals respectively.

METHOD AND SYSTEM FOR ALIGNING TEST ENVIRONMENTS

A method for aligning test environments is provided. The method inlcudes: measuring, by a measurement device located in an anechoic chamber, a standard signal transmitted from a base station simulator and went through to a channel emulator, then output with noise added inside the channel emulator, to multiple antennas within the anechoic chamber; obtaining, by a computing device, measurement information based on the standard signal and the noise transmitted from the measurement device; determining, by the computing device, whether the measurement information is within a predetermined range of a target value; and transmitting, by the computing device, a control signal to the channel emulator to adjust the noise output from the channel emulator so that the computing device obtains desired measurement information based on the standard signal and the adjusted noise when the measurement information is not within the predetermined range of the target value.

STORAGE MEDIUM, EMI CALCULATION METHOD, AND EMI CALCULATION APPARATUS

A non-transitory computer-readable storage medium storing a n EMI calculation program that causes at least one computer to execute a process, the process includes inputting circuit information of a first circuit to a machine learning model; acquiring an EMI value at a certain frequency of the first circuit; selecting, based on an impedance characteristic of the first circuit and the EMI value at the certain frequency, first EMI information from a plurality of pieces of EMI information in each of which an impedance characteristic of each of a plurality of circuits is associated with EMI values at a plurality of frequencies of each of the plurality of circuits; and acquiring an EMI value at another frequency different from the certain frequency of the first circuit based on the EMI value at the certain frequency and the first EMI information.

METHOD FOR MEASURING ENVIRONMENTAL ELECTROMAGNETIC FIELD

A method employs an unmanned aerial vehicle to carry an electromagnetic field measurement system to overcome environmental obstacles in measuring environmental electromagnetic field. The electromagnetic field measurement system senses the electromagnetic field of a spatial position in the environment to generate a sensing signal, then processes the sensing signal to remove the high-frequency electromagnetic interference generated by the operation of the unmanned aerial vehicle itself from the sensing signal, and converts the processed sensing signal into a digital signal. The digital signal is processed to extract at least one wave according to a fundamental frequency and a harmonic order, thereby removing the low-frequency electromagnetic interference from the digital signal. The extracted wave is employed in calculating an environmental electromagnetic field value of the spatial location.

APPARATUS FOR INSPECTING ANTENNA AND METHOD FOR INSPECTING ANTENNA
20230070750 · 2023-03-09 ·

An apparatus for inspecting an antenna includes a stage including a ground on which an antenna device is disposed, an inspection board configured to be in contact with and connected to the antenna device, a connection maintaining unit for maintaining a contact and connection between the antenna device and the inspection board, and an inspection unit mounted or connected to the inspection board to inspect the antenna device.