A measurement system for determining an energy usage parameter of an electronic device under test is described. The measurement system includes a thermal chamber and an analysis circuit. The thermal chamber includes a housing, a temperature regulator and a thermal control circuit. The housing encloses an interior space of the thermal chamber, wherein the interior space is configured to accommodate the device under test. The thermal control circuit is configured to control the temperature regulator to keep a temperature of the interior space at a predefined reference temperature. The thermal control circuit is configured to determine a power consumption of the temperature regulator, wherein the power consumption is associated with keeping the temperature of the interior space at the predefined reference temperature. The analysis circuit is configured to determine at least one energy usage parameter of the device under test based on the determined power consumption. Further, a method of determining an energy usage parameter of an electronic device under test is described.

An over-the-air measurement system for investigating a device under test with respect to its temperature behavior is provided. The over-the air measurement system includes a positioning unit attached to the device under test for positioning the device under test, at least one antenna, and a temperature generating unit for generating heated or cooled air. The over-the-air measurement system includes a piping system comprising at least one pipe connected to the temperature generating unit for passing the heated or cooled air generated by the temperature generating unit into at least one opening of an enveloping material surrounding the device under test or for siphoning the heated or cooled air.

Systems and methods for performing over-the-air verification tests for radar. A test chamber includes multiple sections, the sections separated by metal walls. The inner surfaces of the metal walls include absorbers. Each section includes defined testing devices to verify a defined function of a radar device. The defined testing devices can include a horn antenna and corner reflector. Each section has a defined number of rows. Each row has a defined testing device. Test fixtures hold a defined number of the radar devices in correspondence with the defined number of rows. The defined number of the radar devices placed on the test fixture via a placement device. A positioner to align under the sections and move the test fixtures through the sections of the test chamber and a controller to control operation of the positioner, the radar devices, and the placement device to execute over-the-air verification of the radar devices.

The present disclosure provides an over-the-air measurement system for testing a device under test. The over-the-air measurement system includes at least two orthomode transducers and at least two antennas. Each of the antennas is connected to a dedicated orthomode transducer respectively, thereby establishing at least two measurement modules. The at least two orthomode transducers are rotated relative to each other, thereby providing different measurement polarizations of the at least two measurement modules with respect to a common reference plane.

The present disclosure provides an over-the-air measurement system for testing a device under test. The over-the-air measurement system includes an orthomode transducer (OMT) assembly having several separately formed orthomode transducer components that form at least two orthomode transducers. The orthomode transducer assembly has at least two output interfaces for feed antennas. Each of the at least two output interfaces is connected with one dedicated orthomode transducer. Two input interfaces are associated with each of the orthomode transducers. Each of the input interfaces merge into a corresponding waveguide transition that ends up in the respective orthomode transducer that is associated with the corresponding input interface. The several orthomode transducer components are stacked together linearly.

A testing base includes a housing, a carrier, a wave absorber, and a filler. The housing has an inner surface. The carrier is disposed on the housing. The carrier includes an upper surface, a lower surface, and a groove recessed in the upper surface. The groove is adapted for accommodating a component to be tested. The lower surface and the inner surface of the housing define a cavity body together. The wave absorber is disposed on the inner surface of the housing. The filler is filled in the cavity body and contacts the wave absorber and the carrier. A relative permittivity of the filler is less than or equal to 2.

A multi-panel base station test system includes a base station radio unit configured with a plurality of antenna panels positioned at a first end of a test chamber of the multi-panel base station test system. The multi-panel base station test system includes a plurality of test antennas positioned at a second end of the test chamber opposing the first end. The multi-panel base station test system includes a microwave lens positioned between the plurality of antenna panels and the plurality of test antennas in the test chamber. The microwave lens is configured to focus respective beams transmitted from each of the plurality of antenna panels toward respective focal points associated with each of the plurality of test antennas based on steering of the plurality of antenna panels.

A method of performing a measurement of a device under test by using an antenna array. The method includes: providing an antenna array that includes several antenna elements; providing a device under test configured to communicate over-the-air; locating the device under test at a first test location, thereby establishing a first relative distance between the device under test and the antenna array; performing a first measurement over-the-air when the first relative distance is provided between the device under test and the antenna array, thereby obtaining first measurement results; moving the antenna array and/or the device under test, thereby establishing a second relative distance between the device under test and the antenna array; and performing a second measurement over-the-air when the second relative distance is provided between the device under test and the antenna array, thereby obtaining second measurement results, wherein a quiet zone is established, in which the device under test is located, and wherein the size of the quiet zone is derived from a combination of at least two transfer functions associated with the first measurement results and the second measurement results. Further, a measurement system is described.

Devices and methods for testing microelectronic assemblies including wireless communications are disclosed herein. For example, in some embodiments, a wireless testing system may include a radio frequency (RF) shielded chamber; a device under test (DUT) in the RF shielded chamber, wherein the DUT includes an array of first antenna elements; a testing apparatus in the RF shielded chamber including an array of second antenna elements at a first surface of a substrate to receive a test signal from the DUT, wherein a distance between individual second antenna elements and an adjacent second antenna element is at least half of a wavelength of the test signal, and wherein a distance between the first antenna elements and the second antenna elements is within a near-field region; and an array of electrical switches, wherein an individual electrical switch is coupled to a respective individual second antenna element.

A fixture and a measurement system are provided. The fixture is adapted for electrically connecting a measurement device with a device under test, DUT, in particular a wireless DUT, and for mechanically holding the DUT. The fixture comprises a clamp for clamping the DUT; a male plug for engaging a mating socket of the DUT; and an electrical cable connected to the plug on one end and connectable with the measurement device at its other end. The fixture is arranged to mechanically hold the DUT such that the DUT can be rotated relative to the measurement device. The fixture reduces a shielding effect in respect of antenna modules of the DUT.