A current measurement apparatus comprises: a capacitor connected in parallel to a signal terminal of a device under test (DUT); a test pattern generation apparatus generating a test pattern to operate the DUT; and a measurement module connected to one end of the capacitor. The measurement module comprises: an input/output (I/O) buffer increasing or reducing an amount of charges of the capacitor and outputting a signal corresponding to an output logic value according to a voltage of the one end of the capacitor; a time measurer measuring an arrival time which it takes for the voltage of the one end of the capacitor to reach a second voltage from a first voltage; and a controller controlling the i/o buffer and the time measurer to measure the arrival time and controlling such that a value of a current related to an inspection of a DUT is measured using the arrival time.

In accordance with one embodiment, a method for testing a plurality of electronic components is provided, including subdividing the plurality of electronic components into a plurality of first groups and subdividing the plurality of electronic components into a plurality of second groups. The method may further include measuring, for each first group, an electrical parameter of an interconnection of the components of the first group; measuring, for each second group, an electrical parameter of an interconnection of the components of the second group, and determining which electronic components of the plurality of electronic components have a predefined property, on the basis of the result of the measurement of the electrical parameter for the first groups and on the basis of the result of the measurement of the electrical parameter for the second groups.

A method is provided for real-time monitoring the operational state of a capacitive sensor capable of being mounted on a rotating machine, and connected to an electronic measuring module via a high frequency transmission line, the method comprising the steps of: generating within the electronic module a signal for compensating in capacitance parasitic effects from the transmission line and the sensor; generating within the electronic module a signal for compensating in conductance parasitic effects from the transmission line and the sensor; extracting a signal representative of the capacitance compensation and of a signal representative of the conductance compensation so as to determine an operating point of the sensor; and analyzing the operating point so as to check if it is located in a predetermined area.

A method, system and computer program product, the method comprising: obtaining circuit information, comprising description of groups of pins of electronic chips; obtaining a description of a test comprising a plurality of rules specifying: an identifier, a first group of pins, a second group of pins, a first action to take upon successful interconnection of the first and second groups, and a second action to take upon failure, wherein the first action and second actions are one of: finish with success, finish with failure, and a rule ID of a subsequent rule to check; checking the plurality of rules, comprising checking a sequence of rules starting with a first rule, and wherein each subsequent rule is selected as the first or second action of a preceding rule, in accordance with whether the preceding rule succeeded or failed, respectively; and outputting a result of the plurality of rules.

A stress detector for detecting an in-situ stress profile of an electrode has a liquid cell, a holder configured to attach to one end of a sample electrode so that the sample electrode is cantilevered in the liquid cell, a piezo sensor comprising a piezo material in the liquid cell and having a movable end configured to contact the sample electrode and a fixed end fixedly engaged within the liquid cell and a measurement sensor in contact with the piezo sensor.

The present disclosure relates to a capacitor bank control system that uses a combination of line post sensors and wireless current sensors for control operations. For example, a capacitor bank controller may include one or more inputs that electrically couple to a line post sensor to allow the capacitor bank controller to obtain line post sensor measurements. The capacitor bank controller may include a transceiver that receives wireless current sensor measurements from first and second wireless current sensors. The capacitor bank controller may include a processor that controls one or more switching devices of a capacitor bank based at least in part on a combination of line post sensor measurements and wireless current sensor measurements.

A capacitor testing device includes a carrier with a plurality of clamping holes which are configured to carry capacitors to be tested; a conveying means being configured to convey the carrier; an image collection assembly, including an upper image collection assembly disposed above the conveying means and a lower image collection assembly disposed below the conveying means, the upper image collection assembly and the lower image collection assembly being configured to perform defect testing on outer surfaces of the capacitors to be tested; and a performance testing means, including a performance testing circuit board and a lifting assembly being configured to drive the performance testing circuit board to ascend or descend, and the performance testing means being configured to test electrical performances of the capacitors to be tested.

An apparatus includes a resistor having a resistor terminal. The apparatus includes a capacitor coupled to the resistor terminal. The apparatus includes a transistor having a current terminal and a gate. The gate is coupled to the resistor terminal and coupled to the capacitor. The apparatus includes a comparator having a comparator input and a comparator output. The comparator input is coupled to the current terminal. The apparatus includes a latch having a latch input coupled to the comparator output.

A method for determining the remaining service life of a capacitor is disclosed, wherein the capacitor may be formed by an electrolytic capacitor. The method includes the stages of: measuring a voltage change across the capacitor during a discharging time, determining a discharging current during the discharging time, determining an actual capacitance of the capacitor on the basis of the voltage change, the discharging current and the discharging time, determining a corrected capacitance of the capacitor from the actual capacitance based on an error correction, wherein influences of the temperature on the capacitance of the capacitor are corrected during the error correction, and determining the remaining service life on the basis of a difference between the corrected capacitance and an initial capacitance of the capacitor. A system including an assessment device, configured to perform this method, and a circuit having at least one capacitor to be assessed are also disclosed.

The disclosure generally relates to a failure indicator for providing an indicator that a failure has occurred on a capacitor unit of a capacitor bank. In some embodiments, the failure indicator may include a magnetic element, and the failure indicator may be configured to move from a first orientation to a second orientation based on a mechanical or electromagnetic impulse in the capacitor unit resulting from a failure of the first capacitor unit. In some embodiments, the magnetic element may maintain the first failure indicator in the second orientation to indicate the failure of the first capacitor unit.