A test tool for a low voltage devices is described. The test tool comprises a voltage sensor, a current sensor, a diode sensor, a testing module, and an indicator. The voltage sensor determines a voltage between a first and second electrical wire from an alternating current (AC) transformer. The current sensor determines a current between the first and second electrical wires. The diode sensor determines a presence of a diode connected to the first and second electrical wires based on the current and the voltage. The testing module identifies one or more installation diagnostics related to a device to be coupled with the AC transformer. The indicator generates a visual or audible indicator corresponding to the one or more installation diagnostics.

A pulse current application circuit for applying a pulse current to a current application target. The pulse current application circuit includes a first switching element and an inductive load connected in series between a power supply and a reference potential, a second switching element connected in series with the current application target, the second switching element and the current application target being connected between the reference potential and a connection point of the first switching element and the inductive load, and a commutation circuit connected in parallel to the inductive load, the commutation circuit having a current flowing therethrough and having no current flowing therethrough respectively when the second switching element is in a cut-off state and a conductive state.

An example electrical drain test device includes a battery interface system having electrical cables to connect in-line with a negative battery post of a battery and an electrical system under test without losing connectivity to test the electrical system under test without having to reset test or vehicle modules. The example electrical drain test device also includes a battery disconnect switch. The battery disconnect switch in a first position provides continuous electrical current between the battery and the electrical system. The battery disconnect switch in a second position electrically connects the electrical system under test to the battery through a test circuit to test the electrical system under test for parasitic drain. After an initial connection, the system under test remains in electrical connection with the battery regardless of switch position.

A semiconductor device includes a semiconductor layer having a first area and an edge termination area outside the first area. The semiconductor layer has a first conductivity type, an active area in the first area, a test area in the first area adjacent the active area, a first anode contact on the semiconductor layer in the active area, a second anode contact on the semiconductor layer in the test area, and a cathode contact in electrical contact with the semiconductor layer. A related method of testing surge current capability of a semiconductor device includes applying a forward current that is smaller than a maximum forward current of the semiconductor device to a test active area that is within an area inside a main edge termination area of the semiconductor device, and detecting a failure of the semiconductor device in response to the forward current.

Electrical drain test systems and methods are disclosed. An example electrical drain test device includes a battery interface design with electrical cables to connect in-line with a battery and an electrical system under test. The example electrical drain test device also includes a battery disconnect switch. The switch has a first position to electrically connect the battery and the electrical system. The switch also has a second position to electrically connect the electrical system under test to the battery through a test circuit to test the electrical system under test for parasitic drain. The example electrical drain test device includes an output device to output a conclusive pass/fail result of the test of the electrical system by analyzing current curves through predetermined criteria programmed into the device.

Systems and methods for detecting a diode fault are provided. In one example implementation, a method for determining a diode fault condition in a rotating rectifier associated with an electrical machine in an aircraft includes obtaining, by one or more processors, a signal associated with a diode of a rotating rectifier; determining, by the one or more processors, a frequency of interest; isolating, by the one or more processors, the frequency of interest from the signal to generate an isolated signal; determining, by the one or more processors, an amplitude of the isolated frequency of interest; and determining, by the one or more processors, a diode fault condition based on the determined amplitude.

A test tool for a low voltage devices is described. The test tool comprises a voltage sensor, a current sensor, a diode sensor, a testing module, and an indicator. The voltage sensor determines a voltage between a first and second electrical wire from an alternating current (AC) transformer. The current sensor determines a current between the first and second electrical wires. The diode sensor determines a presence of a diode connected to the first and second electrical wires based on the current and the voltage. The testing module identifies one or more installation diagnostics related to a device to be coupled with the AC transformer. The indicator generates a visual or audible indicator corresponding to the one or more installation diagnostics.

A method for identifying a polarity of a freewheeling diode interconnected in parallel to an inductive actuator for a safety unit for a vehicle. The method includes applying a test current to a terminal of the freewheeling diode and carrying out a comparison between a voltage present at the terminal and a threshold voltage while the test current is being applied, a result of the comparison indicating the polarity of the freewheeling diode.

An inspection device comprises a stage for placing a device under test thereon, a dynamic characteristics test probe, a static characteristics test probe, and a control device configured to perform positional control by moving at least one of the stage, the dynamic characteristics test probe, and the static characteristics test probe. The control device performs the positional control such that the dynamic characteristics test probe is set to a dynamic characteristics test state in which the dynamic characteristics test probe is brought into contact with the electrode when the dynamic characteristics test is performed, and performs the positional control such that the static characteristics test probe is set to a static characteristics test state in which the static characteristics test probe is brought into contact with the electrode while the dynamic characteristics test probe is separated from the electrode when the static characteristics test is performed.

A testing circuit includes at least one sub-circuit. The sub-circuit includes a first input end, at least one second input end, at least one third input end, and at least one driving output end. The first switch unit includes controllable switches. The second switch unit includes sub-units and first inverters. The sub-unit includes transmission gates. The control end of the controllable switch connects to the second input end, the first end connects to the first input end, and the second end connects to the input end of the transmission gate. The first control end of the transmission gate connects to the third input end and the input end of the first inverter, the second control end connects to the output end of the first inverter, the output end connects to the driving output end.