Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/26
Testing of individual semiconductor devices
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G01R31/27
Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
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G01R31/275
for testing individual semiconductor components within integrated circuits
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