An apparatus comprising of two microstrip resonators placed on two parallel surfaces of a planar dielectric substrate, electrically disconnected from each other. The apparatus further comprising a microstrip T-resonator comprising a transmission line and a stub, placed substantially in a middle of the transmission line, placed on the first surface of a planar dielectric substrate. The apparatus further comprises a split-ring resonator comprising two split rings, placed on the second surface of the substrate such that the adjacent edge of the split rings substantially aligns with the open-ended edge of the stub in the first surface. The apparatus further comprises two ground conductors, each placed on the opposite sides of the microstrip T-resonator and split-ring resonator. The apparatus further comprises a microstrip L-resonator, instead of the microstrip T-resonator, coupled to a rectifying circuit block to provide a DC voltage output signal.

An electronic load testing system is configured to emulate aspects of an integrated circuit (IC). A control module of the system is configured to be electrically coupled to a first location on a printed circuit board (PCB) of an electronic assembly, and a load module is configured to be electrically coupled to a second location on the PCB. The load module includes a load cell configured to selectively conduct current from a power supply of the electronic assembly. The first location and the second location are spaced apart and in electronic communication via one or more traces of the PCB. The control module is configured to communicate with the load module via the one or more traces of the PCB. In some examples, the load module and the IC have an equivalent form factor, such that the load module can be installed in place of the IC.