Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/28
Testing of electronic circuits, e.g. by signal tracer
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G01R31/2801
Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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G01R31/2818
using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
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