A low-profile impedance tuner uses a cam-driven piston-like vertical movement of a metallic tuning probe inside a low loss slabline, controlled by an eccentrically centered disc (cam), which is attached to the axis of a stepper motor and rotates parallel to the slabline walls. The structure combines the benefits of low profile rotating tuning probe control with the benign reflection factor phase trajectory of block tuning probes; this is critical for accurate interpolation and impedance synthesis (tuning) strategies using a limited number of calibration points, especially at high microwave and millimeter-wave frequencies.

An antennas-in-package (AiP) verification board is provided, which includes a carrier board configured for disposing an antenna array or an electronic circuit; and a plurality of SMPM connectors. The plurality of SMPM connectors are arranged in an array on the carrier board and electrically connected with the antenna array or the electronic circuit of the carrier board for testing the characteristics of the antenna array on the carrier board or the characteristics of the electronic circuit on the carrier board. The AiP verification board is fixed on a beamforming test platform. In addition to the aforementioned AiP verification board, an AiP verification board including a plurality of adaptor structures and an AiP verification board including a plurality of connectors and a plurality of adaptor structures are also provided.

A multi-frequency programmable and remotely controllable variable attenuator and phase shifter (MF-VAPS) network utilizes wideband three port circulators, power combiners, high-low pass filters and a calibrated multi-harmonic tuner to control the amplitude and phase of the transmission factor (A21) at up to three user defined frequencies individually. The harmonic signal components are divided in frequency bands and injected into the circulator's port 1 and extracted from port 3, whereas the tuner is connected to port 2 and terminated with Zo. When the tuner is initialized (S11=0) the transmission factor of the network is zero; when the tuner is at maximum reflection at any frequency the transmission factor is also maximum. Changing the reflection phase of the tuner controls the transmission phase <A21 by the same amount, up to 360°.

The system includes a positioning system for mounting the circuit board to be tested and for mounting a sensor assembly. A control system registers the position of the sensor assembly relative to the circuit board to be tested and for moving the sensor assembly about the circuit board. The sensor assembly detects noise or other emissions generated by the circuit elements on the board. The noise emissions are separate from the operating signals of the circuit. The spectrum analyzer receives the emissions from the sensor assembly and produces frequency spectrum data over a selected frequency range with amplitude information. A processing system then compares the frequency spectrum information with frequency spectrum information from boards known to be good and provides information as to any differences and whether they are in an acceptable tolerance range.

A test fixture for PCB components is described herein. The test fixture comprises a shim with an aperture configured to direct RF energy from a component of a PCB, via an end of the PCB, and to a top clamp of the test fixture. The end of the PCB may correspond to a cut line of a destructive test. The test fixture also comprises the top clamp with a test port and a taper configured to direct the RF energy from the aperture to the test port. The test fixture also comprises a bottom clamp attached to the top clamp to retain the PCB between the top and bottom clamps for testing. The test fixture allows for quick mounting of the PCB and testing of the component without modifying a design of the PCB or requiring specific drilling of the PCB.

A device may include a receive antenna input to couple a receive antenna to a receive chain of the device. The device may include a test signal generator to generate a test signal. The device may include a signal coupler between the receive antenna input and the receive chain. The signal coupler may include a first port to inject the first test signal into the receive antenna via the receive antenna input. The device may include a control circuit to monitor an impedance matching of the receive antenna based on one or more characteristics of a reflected signal resulting from the first test signal being injected into the receive antenna. The one or more characteristics of the reflected signal may be dependent on the impedance matching of the receive antenna.

Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.

The present disclosure provides a circuitry distortion corrector for correcting distortions of electrical signals. The circuitry distortion corrector comprises a first correction filter that filters the received signals, and a second correction filter that is coupled to the first correction filter and filters the signals that are filtered by the first correction filter. The first correction filter operates based on first filter coefficients that are based on first value tuples, each first value tuple comprising a first frequency and a respective first circuitry characterizing value, and wherein the first frequencies are equally spaced apart, and the second correction filter operates with second filter coefficients that are based on second value tuples, each second value tuple comprising a second frequency and a respective second circuitry characterizing value, wherein the second frequencies are logarithmically spaced apart.

Load pull measurement arrangement having an active tuner with a signal generator providing a signal at a first frequency to a vector modulator. The vector modulator has an input for receiving control signals and is arranged to provide an injection signal at the first frequency based on the control signals. The active tuner further has a frequency multiplier receiving the injection signal and outputting a multiplied injection signal having a second frequency, the second frequency being an integer multiple of the first frequency. Furthermore, a millimeter wave extender has a frequency multiplier in the signal injection path connected to the device under test during operation.

An impedance control device for tuning a device under test comprising: a first terminal port arranged for connecting a device under test, a second terminal port arranged for connecting a termination, a first signal path for a signal travelling between the first and the second terminal port, first coupling means arranged for picking up a part of the signal travelling in the first signal path, a second signal path arranged for receiving the part of the signal from the first coupling means, said second signal path comprising a correction circuit for adapting as a function of frequency the amplitude and phase of the received part of the signal, second coupling means arranged for coupling back into the first signal path an adapted signal outputted by the correction circuit, and an attenuator and phase shifter for applying attenuation and phase shifting on the signals travelling between the first and the second terminal port.