An instrument test arrangement is specified, which is preferably equipped for medical instruments for argon plasma coagulation. The instrument test arrangement comprises an electrode arrangement, comprising at least one test electrode. In a preferred embodiment, a test electrode is thereby connected to two neutral conductors of a neutral conductor cable or device, wherein the neutral conductors are insulated from one another, and wherein the first coupling impedance between the test electrode and the first neutral conductor and the second coupling impedance between the test electrode and the second neutral conductor are equal or at most slightly different, so that a split circuit, which is assigned to a neutral electrode arrangement, does not trigger due to the strike of a test spark or arc.

Various embodiments include methods for determining an electrical fault of a conductivity sensor for ascertaining the electrical conductivity of a medium using a conductivity principle, wherein the conductivity sensor comprises a first electrode pair fully disposed in the medium comprising: applying an electrical alternating voltage to the first electrode pair; measuring a temporal profile of the electrical alternating current at the first electrode pair resulting from application of the electrical alternating voltage at the first electrode pair; ascertaining a current-amplitude characteristic value from the temporal profile of the electrical alternating current; and identifying an electrical fault of the conductivity sensor if the current-amplitude characteristic value is below a first current threshold value or above a second current threshold value.

A temperature measurement circuit includes a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature, a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage, a sensing circuit configured to generate a temperature-variant voltage based on a bias current, where the temperature-variant voltage is varied depending on the operation temperature, an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage, and an analog built-in self-test (BIST) circuit configured to generate a plurality of flag signals indicating whether each of the band-gap reference voltage, the measurement reference voltage, and a bias voltage corresponding to the bias current is included in a predetermined range.

A spark detector indicates the presence of a spark by analyzing sound waves generated when an electrical spark is produced from an electrical spark generator located on an igniter rod. The spark detector includes an acoustic sensor that is in communication with the igniter rod to determine the time for the spark sound wave to travel through the igniter rod to the acoustic sensor. If a spark is not detected, the spark detector may output a signal indicating at least one of (i) the spark was not detected, (ii) to replace the electrical spark generator immediately, or (iii) replace the electrical spark generator soon such as at the next scheduled maintenance. Furthermore, the spark detector may be calibrated based on current temperature of the igniter rod based upon time of propagation of a pulse sound wave, generated by a pulse-echo generator, to reflect off an end of the igniter rod.

A signal processing apparatus includes an interface module and a signal processing module. The interface module includes an identification resistance for identifying the interface module, the interface module being connectable to a device configured to perform at least one of measuring of a measuring target and operating of an operation target. The signal processing module includes a first connection terminal connected to one end of the identification resistance, a first power source connected to the identification resistance via the first connection terminal, a detector configured to detect any one of voltage and electrical current at the first connection terminal, and a signal processor configured to process signals received from and transmitted to the device.

Integrated circuit systems, such as sensor systems, having on-board-diagnostic (OBD) circuits for the detection of errors presenting internal to the systems are disclosed, along with related methods. In one embodiment, an ADC multiplexer receives analog output readback from an output driver and provides a signal triggering an OBD circuit for internal error indication performed completely independent of digital-to-analog converters (DAC) and output drivers, which can be the point of failure.

An object of the present invention is to provide a semiconductor device capable of diagnosing disconnection of a signal line that transmits a command signal in an inspection process even if the command signal is assumed not to be transmitted in the inspection process. A semiconductor device according to the present invention includes a first semiconductor integrated circuit and a control circuit, the control circuit includes a means for controlling a signal line in response to a response signal from the first semiconductor integrated circuit, and the control circuit further includes a means for controlling the signal line regardless of a signal from the first semiconductor integrated circuit.

The invention relates to a circuit arrangement comprising a control device, an input circuit for applying an input signal, a conditioning circuit electrically connected to the input circuit for converting the input signal into a measured signal, an analog-to-digital converter electrically connected to the conditioning circuit for converting the measured signal into a digital value, and a reference source that outputs a known reference signal. In this respect, a first switching apparatus is provided that selectively separate the input signal from the conditioning circuit or supplies it to the conditioning circuit and a second switching apparatus is provided that selectively supplies the reference signal to the input circuit or separates it from the input circuit, wherein the control device is configured to determine an offset error and to determine a gain error of the circuit arrangement.

Even when parts having individual differences among identical parts or differences in deterioration speed between parts, or a part that does not have a non-volatile memory such as an EEPROM in a chip of the part itself, are mixed, there is no deterioration diagnosis device that can appropriately diagnose a state of deterioration due to temporal change or the like, because of which a mechanism (correction methodology) for evaluating and correcting deterioration in the precision or performance of an electronic part that has low precision or considerable temporal deterioration, and does not have a correction function, is incorporated in a deterioration diagnosis device, and a deterioration state is diagnosed using incorporated deterioration determination means when using a product after shipping.

A test coupon includes a pseudo element circuit which is constituted of a main circuit section and an adjusting section. The main circuit section includes a first pattern conductor and second pattern conductors. The first pattern conductor and the second pattern conductors overlap one another with a dielectric layer interposed therebetween. The first pattern conductor electrically conducts to the second pattern conductors. The main circuit section represents the R-component and the L-component of an equivalent circuit, and is a dominant circuit element which determines a signal waveform. The adjusting section includes linear conductors. A peak of a voltage waveform is suppressed by the R- and L-components of the adjusting section.