Systems, devices, and methods for performing a non-contact electrical measurement (NCEM) on a NCEM-enabled cell included in a NCEM-enabled cell vehicle may be configured to perform NCEMs while the NCEM-enabled cell vehicle is moving. The movement may be due to vibrations in the system and/or movement of a movable stage on which the NCEM-enabled cell vehicle is positioned. Position information for an electron beam column producing the electron beam performing the NCEMs and/or for the moving stage may be used to align the electron beam with targets on the NCEM-enabled cell vehicle while it is moving.

A system for over-the-air testing of a device under test includes a measurement antenna, a reference antenna, a device under test capable of wirelessly transmitting and/or receiving complex radio frequency signals, and an analyzer. The analyzer has at least two ports, wherein the reference antenna is connected with a first port of the analyzer. The measurement antenna is connected with a second port of the analyzer. The analyzer is capable of determining a phase difference and a power ratio of radio frequency signals received via the measurement antenna and the reference antenna. The analyzer is capable of performing an IQ analysis on complex radio frequency signals. Further, a method of over-the-air testing of a device under test is disclosed.

An integrated circuit (IC) includes a first circuit layer that includes a first wireless power transfer (WPT) device, a first chip electrically connected to the first circuit layer, and a first tracking circuit disposed in the first chip. The first WPT device may be configured to extract energy from an electromagnetic signal and provide an output voltage. The first tracking circuit may be powered by the output voltage of the first WPT device and may output tracking data in response to an instruction extracted from the electromagnetic signal.

A testing probe apparatus for testing die. The testing probe may include a probe interface and a carrier for supporting at least one die comprising 3D interconnect (3DI) structures. The probe interface may be positionable on a first side of the at least one die and include a voltage source and at least one first inductor operably coupled to the voltage source. A voltage sensor and at least one second inductor coupled to the voltage sensor may be disposed on a second opposing side of the at least one die. The voltage source of the probe interface may be configured to inductively cause a voltage within the 3DI structures of the at least one die via the at least one first inductor. The voltage sensor may be configured to sense a voltage within the at least one 3DI structure via the at least one second inductor. Related systems and methods are also disclosed.

A circuit board incorporable into an apparatus includes a substrate, a reception unit that is provided on the substrate and that wirelessly receives a function program for achieving a function, a storage unit that is provided on the substrate and to which a writing program for writing the function program received by the reception unit has been written in advance, a power supply provided on the substrate, and a power control unit that supplies power for receiving, with the reception unit, the function program and power for writing, on a basis of the writing program, the function program to the storage unit using the power supply without using an external power supply.

A system and method for testing a tractor trailer is disclosed. The system includes a housing having connections for establishing an electrical and pressure connection to the electrical system and ABS of a tractor trailer, respectively, a circuit board that generates electrical signals and pressure signals corresponding to the connections, an electronic device for displaying the electrical signals and pressure signals, a wireless transceiver for transmitting the electrical signals and pressure signals to the electronic device, and a memory for storing the transmitted electrical signals and pressure signals. The method includes connecting the tractor trailer electrical system and ABS connections to the housing, powering on the tractor trailer, querying an electrical signal and/or pressure signal of the electrical system and ABS, wirelessly transmitting the electrical signal and/or pressure signal to an electronic device, and displaying the electrical signal and/or pressure signal on the electronic device.

The present invention discloses an automatic laser calibration kit for calibrating the distance between a test device of a wireless charging system and a device under test (DUT). The calibration kit may be located in a wireless charging test system. The test system may comprise a test plane for controlling the DUT and a gripping arm for controlling the test device. The calibration kit may comprise: a laser pointer, configured to emit a laser beam; a mirror, positioned on the gripping arm and configured to reflect the laser beam to form a spot on the test plane; and a camera, configured to monitor the position of the spot.

The invention relates to an integrated circuit with an active transistor area and a plurality of wiring layers arranged above the active transistor area. At least one optical device is integrated in the active transistor area. The optical device is electrically connected with at least one of the wiring layers. At least one optical tunnel extends from the at least one optical device through the plurality of wiring layers to a surface of an uppermost wiring layer of the plurality of wiring layers facing away from the active transistor area.

The disclosure describes a process and apparatus for accessing devices on a substrate. The substrate may include only full pin JTAG devices (504), only reduced pin JTAG devices (506), or a mixture of both full pin and reduced pin JTAG devices. The access is accomplished using a single interface (502) between the substrate (408) and a JTAG controller (404). The access interface may be a wired interface or a wireless interface and may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

A measuring method for locating an imperfection in an electrically conductive material comprises applying an electric input signal with an electric signal generator to the electrically conductive material such that the electrically conductive material acts as an antenna and thereby transmits an electromagnetic output signal having a frequency spectrum comprising a contributing frequency corresponding to the imperfection within the electrically conductive material; receiving the electromagnetic output signal with an antenna detection system, wherein the antenna detection system probes the frequency spectrum of the electromagnetic output signal as a function of at least one of position and direction; and locating the imperfection within the electrically conductive material by analyzing with an analysis device a spatial origin of the contributing frequency within the frequency spectrum of the received electromagnetic output signal.