During frequency detection, a constant current source outputs an output current to charge a variable capacitor for multi-period. In a calibration mode, according to a comparison result between a cross voltage of the variable capacitor and a reference voltage, a capacitance value of the variable capacitor is adjusted. In a monitor mode, according to a reference frequency and the cross voltage of the variable capacitor, a frequency under test of a circuit under test is detected.

In an example, a method includes receiving an indication of an electrical parameter associated with at least part of a computing device. The method further includes determining whether or not the indication is indicative of an expected electric field distribution associated with a specified hardware configuration for the computing device.

In an example, a method includes receiving an indication of an electrical parameter associated with at least part of a computing device. The method further includes determining whether or not the indication is indicative of an expected electric field distribution associated with a specified hardware configuration for the computing device.

A measuring container for measurement of impurity ions in a liquid includes: a first electrode; a first insulation film formed on the first electrode; a second insulation film formed apart from the first insulation film to create a space into which the liquid is to be sealed; a second electrode on which the second insulation film is formed, the second electrode being arranged to face the first electrode; and a seal material having an inlet through which the liquid is injected into the space, the seal material being configured to seal the space.

A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe.

The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe.

The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.

An apparatus for detecting a wiring short in a substrate includes a voltage source configured to apply a rising or falling measurement voltage to a first wiring of a substrate, a plurality of electrodes including first and second electrode elements capacitively coupled to the first and second wirings of the substrate, respectively, a sensing circuit configured to generate an output voltage based on a voltage or a current between the first and second electrode elements, and a processor configured to determine whether a short circuit connection having a resistance value greater than a reference resistance value is present between the first and second wirings based on a change rate of the output voltage after application of the measurement voltage. Methods for detecting wiring shorts in the substrate are further provided.

Provided are a non-contact voltage measurement device and diagnosis system capable of acquiring the voltage of an electric wire without disconnecting the wire. The non-contact voltage measurement device (100) includes: a cylindrical fixing part (110) for holding an electric wire (10) by clipping the same from both sides; a first electrode (121) and a second electrode (122) provided on the inner peripheral surface of the electric-wire-holding side of the fixing part (110) so as to be separated by a distance (D2); a first measurement capacitor (C3) and a voltage division capacitor (C2) connected to the first electrode (121); a second measurement capacitor (C3) connected to the second electrode (122); a teminal (131) for measuring the voltage (V1) applied to the first measurement capacitor (C3); and a terminal (132) for measuring the voltage (V2) applied to the second measurement capacitor (C3).

Provided are a non-contact voltage measurement device and diagnosis system capable of acquiring the voltage of an electric wire without disconnecting the wire. The non-contact voltage measurement device (100) includes: a cylindrical fixing part (110) for holding an electric wire (10) by clipping the same from both sides; a first electrode (121) and a second electrode (122) provided on the inner peripheral surface of the electric-wire-holding side of the fixing part (110) so as to be separated by a distance (D2); a first measurement capacitor (C3) and a voltage division capacitor (C2) connected to the first electrode (121); a second measurement capacitor (C3) connected to the second electrode (122); a teminal (131) for measuring the voltage (V1) applied to the first measurement capacitor (C3); and a terminal (132) for measuring the voltage (V2) applied to the second measurement capacitor (C3).