A test system is provided for performing design for debug (DFD) operations. The test system includes a host processor coupled to an auxiliary device. The auxiliary device includes a protocol interface block for communicating with the host processor during normal functional mode. The auxiliary device further includes a circuit under test (CUT) and a hardened DFD hub that is controlled by the host processor via the protocol interface block. The DFD hub includes a DFD triggering component, a DFD tracing component, and a DFD access component. The host processor directs the DFD hub to perform DFD operations by sending control signals through the protocol interface block during a debugging mode. Test information gathered using the DFD hub is fed back to the host processor to help facilitate silicon bring-up, pre-production software stack optimization, and post-production performance metric monitoring.

Adjustable integrated circuits and methods for designing the same are provided. In one embodiment, a method of designing an integrated circuit includes determining a plurality of design criteria of the integrated circuit; designing a plurality of circuit blocks of the integrated circuit in accordance with the plurality of design criteria, where one or more circuit blocks in the plurality of circuit blocks include one or more feedback paths; designing a circuit performance monitor, where the circuit performance monitor includes one or more replica feedback paths corresponding to the one or more feedback paths in the one or more circuit blocks, and where the circuit performance monitor is configured to monitor feedback path information of the one or more replica feedback paths; verifying the plurality of circuit blocks and the circuit performance monitor to meet the plurality of design criteria; and producing a verified description of the integrated circuit for manufacturing.

Systems and methods of developing an integrated circuit implement selecting a desired yield for a circuit used in the integrated circuit. The desired yield corresponds to a desired failure probability of the circuit. The method includes determining a parameter threshold value that corresponds with the desired yield. The circuit passes if a parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value. The method also includes using the parameter threshold value that corresponds with the desired yield during testing and improvement of a design of the integrated circuit, and providing the design of the integrated circuit for fabrication.

Systems and methods of developing an integrated circuit implement selecting a desired yield for a circuit used in the integrated circuit. The desired yield corresponds to a desired failure probability of the circuit. The method includes determining a parameter threshold value that corresponds with the desired yield. The circuit passes if a parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value. The method also includes using the parameter threshold value that corresponds with the desired yield during testing and improvement of a design of the integrated circuit, and providing the design of the integrated circuit for fabrication.

A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.

The present disclosure relates generally to biometric identification and electrostatic discharge (ESD) test verification system. Embodiments of the present disclosure provide systems and methods that combine ESD testing and biometric identification technology at a work area, such as a manufacturing workstation, to ensure that an employee is uniquely identified, and that the employee's electrical grounding straps are present and functioning correctly. Based on a result of the ESD testing and a biometric identification used to login at an ESD controlled work area, access to one or more functions of the manufacturing workstation may be granted, denied, or otherwise restricted.

The present disclosure relates generally to biometric identification and electrostatic discharge (ESD) test verification system. Embodiments of the present disclosure provide systems and methods that combine ESD testing and biometric identification technology at a work area, such as a manufacturing workstation, to ensure that an employee is uniquely identified, and that the employee's electrical grounding straps are present and functioning correctly. Based on a result of the ESD testing and a biometric identification used to login at an ESD controlled work area, access to one or more functions of the manufacturing workstation may be granted, denied, or otherwise restricted.

An apparatus, including: a deterministic monitored device; an interconnect to communicatively couple the monitored device to a support circuit; a super queue to queue transactions between the monitored device and the support circuit, the super queue including an operational segment and a shadow segment; a debug data structure; and a system management agent to monitor transactions in the operational segment, log corresponding transaction identifiers in the shadow segment, and write debug data to the debug data structure, wherein the debug data are at least partly based on the corresponding transaction identifiers.

A scan cell comprises: a state element and selection and combination circuitry. The selection and combination circuitry comprises first combination circuitry configured to combine a signal from a scan input of the scan cell with a signal from a functional circuit input of the scan cell to generate a first signal, second combination circuitry configured to combine the signal from the functional circuit input of the scan cell with an output signal of the state element to generate a second signal, and selection circuitry configured to select an input signal for the state element from the signal from the scan input of the scan cell, the signal from the functional circuit input of the scan cell, the first signal, and the second signal based on two selection input signals of the scan cell.

An embodiment herein provides a method for implementing verification IP for pre-silicon functional verification of a layered protocol. The method includes generating serially connected layer blocks. A layer block includes modular components that may be enabled or disabled to change a functionality of the layer block. The modular components include a layer core, a stimulus handler, one or more transmit routers and one or more receive routers. The layer core implements the complete functionality of the layer block. The stimulus handler drives input stimulus transactions into the layer core of the layer block. The one or more transmit routers routes one or more transmit core transactions from the layer core to the connected succeeding layer block. The one or more receive routers routes one or more receive core transactions from the succeeding layer block to the layer core.