An intelligent function unit includes an input selector selecting, as an input signal, an actual input signal or a simulated input signal generated in advance; an output selector selecting whether to output an output signal to the second controlled device; and a calculator causing an input/output controller in which combination and order of use of general circuit blocks are set to process the input signal one step at a time and transmit the output signal to an engineering tool or causing the input/output controller in which combination and order of use of the general circuit blocks are set to process the input signal consecutively for a set period of two or more steps, store the output signal for each step in a logger, and transmit an output signal corresponding to the set period and stored in the logger to the engineering tool.

Disclosed herein is a test circuit for a device under test. The test circuit includes a test data source and a test data target. A debug chain is coupled between the test data source and test data target, and operates in either a clock debug mode or a test mode. The debug chain, when in the test mode, is deactivated. The debug chain, when in the clock debug mode, receives the test pattern data from the test data source and stores the test pattern data, generates a clock debug signature from the stored test pattern data while clocked by a test clock, and outputs the clock debug signature to the test data target, the clock debug signature indicative of whether the test clock is operating properly.

A system and method for time stamp synchronization are disclosed. In one embodiment, first and second devices are provided. The second device receives a first time stamp of the first device, wherein the first time stamp was generated in response to a time stamp synchronization event common to the first and second devices; generates a second time stamp of the second device in response to the time stamp synchronization event, wherein the first and second time stamps are in different time domains; and correlates the first and second time stamps, wherein correlating the first and second time stamps provide a relationship between the time domains because the first and second time stamps were both generated with respect to the same time stamp synchronization event common to the first and second devices.

A method for debugging and a method for testing a circuit design on a programmable logic device is disclosed, making use of a parameterized configuration. A corresponding system also is disclosed.

A latch circuit having a master latch and a slave latch includes a device used to short either the master latch or the slave latch. The device includes a transistor and a global control used to assert a signal, and is positioned to short an inverter of the master latch or the slave latch. When the signal is asserted by the global control, the inverter is shorted such that the output value of the inverter is the same as the input value. The assertion of the signal is facilitated by another device connected to the master latch and the slave latch that includes the global control and a transistor.

In accordance with embodiments of the present disclosure, an information handling system may include a host system with information handling resources, a management controller configured to provide out-of-band management of the information handling system, and a debugging circuit. The debugging circuit may receive a plurality of serial data streams from the management controller and the plurality of information handling resources, and provide access to at least a subset of the plurality of serial data streams to a debugging information handling system via a wireless interface.

The present invention discloses a test device for testing an integrated circuit. An embodiment of the test device includes an on-chip-clock controller (OCC), a pulse debugging circuit and a register circuit. The OCC is configured to generate an output clock according to an input clock, in which the output clock is for testing a circuitry under test (CUT) that is included in the test device. The pulse debugging circuit is configured to generate a pulse record according to a pulse number of the output clock, in which the pulse record is used to find out whether a test status dependent upon the output clock is abnormal. The register circuit is configured to store and output the pulse record according to a reliable clock.

The present disclosure describes using the JTAG Tap's TMS and/or TCK terminals as general purpose serial Input/Output (I/O) Manchester coded communication terminals. The Tap's TMS and/or TCK terminal can be used as a serial I/O communication channel between; (1) an IC and an external controller, (2) between a first and second IC, or (3) between a first and second core circuit within an IC. The use of the TMS and/or TCK terminal as serial I/O channels, as described, does not effect the standardized operation of the JTAG Tap, since the TMS and/or TCK I/O operations occur while the Tap is placed in a non-active steady state.

A processor includes logic to implement a reconfigurable test access port with finite state machine control. A plurality of test access ports may each include a finite state machine for enabling implementation of different test interfaces to the processor, including JTAG IEEE 1149.1, JTAG IEEE 1149.7, and serial wire debug.

A method for managing a product includes: placing an integrated circuit in a bootstrap mode with debugging prohibition in response to each reset or power-up of the integrated circuit and in an absence of a reception, on a test access port of the product, of a first command; and placing the integrated circuit in an analysis mode with debugging authorization in response to reception, on the test access port, of the first command following the reset or the power-up of the integrated circuit. Placing the integrated circuit in the analysis mode is maintained at least as long as a second command has not been received on the test access port. Placing the integrated circuit in the bootstrap mode and placing the integrated circuit in the analysis mode are performed in response to a determination that the integrated circuit has never before been placed in the analysis mode with debugging authorization.