Methods and apparatuses relating to a multiple master capable debug interface are described. In one embodiment, an apparatus includes a device circuit, a wireless connector circuit, and a switching circuit coupled between the device circuit and the wireless connector circuit to switch a debug and test mastership from the wireless connector circuit to a debug and test tool, wirelessly connected to the wireless connector circuit, to perform a debug and test operation on the device circuit.

An embedded logic analyzer of an integrated circuit includes a comparison block configured to generate a capture data signal and a plurality of comparison enable signals based on an input data signal from one of function blocks included in the integrated circuit such that the comparison enable signals are activated respectively based on different comparison conditions; an operation block configured to perform a logic operation on the comparison enable signals to generate a data enable signal indicating a data capture timing; and packer circuitry configured to generate a packer data signal including capture data and capture time information based on the capture data signal, the data enable signal and a time information signal.

Methods and apparatus are disclosed for programming reconfigurable logic devices such as FPGAs in a multi-tenant server environment. In one example, a computing host includes one or more processors configured to execute a supervisor process and two or more user processes and a single FPGA integrated circuit configured into a plurality of partitions. The partitions include a host logic partition that is accessible only to the supervisor process executing on the computing host, and two or more accelerator partitions. Each of the accelerator partitions is configured to include a virtual debug unit with a logic analyzer that collects logic signals generated by logic within the respective accelerator partition and sends debug data indicating values of the logic signals to one of the user processes. In some examples, the host logic partitions and/or the accelerator partitions can be independently reprogrammed of each other within their respective portions of the single FPGA.

The present disclosure describes using the JTAG Tap's TMS and/or TCK terminals as general purpose serial Input/Output (I/O) Manchester coded communication terminals. The Tap's TMS and/or TCK terminal can be used as a serial I/O communication channel between; (1) an IC and an external controller, (2) between a first and second IC, or (3) between a first and second core circuit within an IC. The use of the TMS and/or TCK terminal as serial I/O channels, as described, does not effect the standardized operation of the JTAG Tap, since the TMS and/or TCK I/O operations occur while the Tap is placed in a non-active steady state.

This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

Systems and techniques of the present disclosure may provide remote debugging of an integrated circuit (IC) device while preventing unauthorized access of device intellectual property (IP). A system may include an IC device that generates an encrypted session key and an interface that enables communication between the IC device and a remote debugging site. The interface may enable the IC device to send the encrypted the encrypted session key to initiate a remote debug process, receive an acknowledgement from the remote debugging session, and authenticate the acknowledgement. Further, the interface may enable to the IC device to initiate a secure debug session between the IC device and the remote debugging site.

Systems and methods are disclosed for secure debug architecture. For example, an integrated circuit (e.g., a processor) for executing instructions includes a processor core configured to execute instructions; a debug interface comprising two or more conductors with input/output drivers configured to, when enabled, transmit and receive signals between the processor core and an external host device via the two or more conductors; and wherein the integrated circuit is configured to: receive a request from a host device for access to the integrated circuit via the debug interface; responsive to the request, generate a random number; transmit the random number from the integrated circuit to the host device via the debug interface; receive, from the host device via the debug interface, input data that has been encrypted using the random number as a key; and decrypt the input data using the random number as a key.

A circuit includes a test data input (TDI) pin receiving a test data input signal, a test data out (TDO) pin outputting a test data output signal, and debugging test access port (TAP) having a test data input coupled to the TDI pin and a bypass register having an input coupled to the test data input of the debugging TAP. A multiplexer has inputs coupled to the TDI pin and the debugging TAP. A testing TAP has a test data input coupled to the output of the multiplexer, and a data register having an input coupled to the test data input of the testing TAP. The multiplexer switches so the test data input signal is selectively coupled to the input of the data register of the testing TAP so the output of the debugging TAP is selectively coupled to the input of the data register of the testing TAP.

Systems and methods for secure testing and debugging of electronic devices are described. In one embodiment, the systems and methods may include an electronic device that includes a control switch placed on a device test bus of the electronic device between a debugger external to the device and a debug interface on the device. In some cases, the device may include at least one register placed on the device test bus between the debugger and authentication logic of the electronic device.

Techniques are disclosed relating to using non-debug path circuitry to perform debug commands. In some embodiments, an apparatus includes a processor core that includes path circuitry configured to access data for instructions executed by the processor core and storage elements which the path circuitry is configured to access via one or more ports. In some embodiments, the apparatus includes debug circuitry configured to receive external debug inputs and send abstract commands to the processor core based on the external debug inputs. In some embodiments, the apparatus includes control circuitry in the processor core configured to, in response to an abstract command to access one or more of the storage elements: generate signaling to access the one or more storage elements using the path circuitry, access read data from the one or more storage elements based on the signaling, and transmit the accessed read data to the debug circuitry.