An apparatus may comprise a skew detection circuit to sample a common mode voltage of a differential signal, wherein the sampled common mode voltage is indicative of an amount of skew between a first signal of the differential signal and a second signal of the differential signal; and a skew compensation circuit to adjust a delay of the first signal or the second signal based on the sampled common mode voltage to reduce the amount of skew.

An oscilloscope having a Nyquist frequency lower than an analog bandwidth includes an input configured to receive a signal under test; an analog-to-digital converter (ADC) to receive the signal under test, sample the signal under test at a sample rate, and produce digital samples of the signal under test; one or more processors configured to execute code that causes the one or more processors to: determine a set of candidate unit intervals by generating corresponding candidate histograms using the candidate unit intervals; determine a best unit interval from the candidate unit intervals based upon entropy measures of each candidate histogram; and reconstruct a representation of the signal under test using the digital samples and the best unit interval.

An apparatus may comprise a skew detection circuit to sample a common mode voltage of a differential signal, wherein the sampled common mode voltage is indicative of an amount of skew between a first signal of the differential signal and a second signal of the differential signal; and a skew compensation circuit to adjust a delay of the first signal or the second signal based on the sampled common mode voltage to reduce the amount of skew.

Power-glitch detection and power-glitch self-testing within a chip is shown. In a chip, a processor has a power terminal, a glitch detector, and a self-testing circuit. The power terminal is configured to receive power. The glitch detector is coupled to the power terminal of the processor for power-glitch detection. The self-testing circuit has a glitch generator and a glitch controller. The glitch controller controls the glitch generator to generate a self-testing glitch signal within the chip to test the glitch detector.

Power-glitch detection and power-glitch self-testing within a chip is shown. In a chip, a processor has a power terminal, a glitch detector, and a self-testing circuit. The power terminal is configured to receive power. The glitch detector is coupled to the power terminal of the processor for power-glitch detection. The self-testing circuit has a glitch generator and a glitch controller. The glitch controller controls the glitch generator to generate a self-testing glitch signal within the chip to test the glitch detector. The self-testing glitch signal is further fed back to the glitch controller for verification, and the glitch controller presents an error of the self-testing glitch signal by an error flag.