An eye diagram measurement device includes a first mapping circuitry, a count circuitry, a second mapping circuitry and a memory circuitry. The first mapping circuitry maps one of plurality of internal signals of an electronic device to a first data signal having a predetermined number of bits. The counter circuitry performs a counting operation according to the first data signal and a plurality of signal values associated with the predetermined number of bits, to generate a plurality of count signals. The second mapping circuitry maps the count signals respectively to a plurality of eye diagram measurement signals corresponding to a present phase. The memory circuitry stores the eye diagram measurement signals in order to provide the eye diagram measurement signals to an external system for generating an eye diagram measurement result of the electronic device.

The present disclosure provides a measurement application device, comprising a signal interface that is configured to receive a signal that comprises at least two characterizing signal levels, a signal analyzer that is coupled to the signal interface and that is configured to analyze the received signal to determine individual sub-diagrams for the received signal, wherein each one of the sub-diagrams comprises a predetermined diagram type, a diagram processor coupled to the signal analyzer and a display, and arranges the sub-diagrams in a diagram arrangement where each one of the sub-diagrams is assigned a predetermined position in the diagram arrangement, and to control the display to display at least one of the sub-diagrams, and a user interface that receives user input with regard to the diagram arrangement where the diagram processor controls the displaying of the diagram arrangement by the display according to the user input.

A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT). The margin test generator is structured to modify test signals for testing the DUT during one or more testing states of a test session to create testing results. The testing results are stored in a data repository along with a DUT identifier of the DUT tested during the test session. A comparator determine whether any results of the DUT test results match a predictive outcome that is based from an analysis of previous DUT tests. If so, a message generator produces an indication that the tested DUT matched the predictive outcome.

An apparatus for determining a single decision function [d%(x%)] is configured to obtain measurements [x] from a plurality of devices under test corresponding to stimulating signals applied to the plurality of devices under test. The stimulating signals correspond to a set of tests performed on the plurality [N] of devices under test. The apparatus may further determine a subset of tests from the set of tests, such that the subset of tests is relevant for indicating whether the plurality of devices under test pass the set of tests. The apparatus may also determine the single decision function applicable to measurements from an additional device under test tested using the subset of tests, such that the single decision function is adapted to predict a test result [%(x%)] for the set of tests on the basis of the subset of tests.

A receiver includes a sampler that samples first voltage levels corresponding to a first logical value of data and second voltage levels corresponding to a second logical value of the data, based on a sampling clock. An equalizer receives and adjusts the first and second voltage levels. A clock and data recovery circuit recovers the sampling clock, based on the first and second voltage levels from the equalizer. An eye opening measurement circuit: (1) tracks a first sigma level by a first step unit depending on upper voltage levels greater than a first reference voltage level among the first voltage levels, (2) tracks a second sigma level by a second step unit depending on lower voltage levels less than a second reference voltage level among the second voltage levels, and (3) calculates a difference between the first sigma level and the second sigma level.

Methods for detecting a glitch at a high sampling rate are provided. In some embodiments, a method includes the following steps: S1, acquiring to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, performing glitch identification on the to-be-identified data to obtain a glitch position of the normal sampling data. In other embodiments, the disclosure provides a system for detecting a glitch at a high sampling rate and for implementing the method for detecting a glitch at a high sampling rate. The system includes an acquisition unit and a glitch identification unit. The acquisition unit acquires and processes the to-be-identified data to obtain the normal sampling data, and the glitch identification unit performs glitch identification on the to-be-identified data to obtain the glitch position of the normal sampling data.

A receiver includes a sampler that samples first voltage levels corresponding to a first logical value of data and second voltage levels corresponding to a second logical value of the data, based on a sampling clock. An equalizer receives and adjusts the first and second voltage levels. A clock and data recovery circuit recovers the sampling clock, based on the first and second voltage levels from the equalizer. An eye opening measurement circuit: (1) tracks a first sigma level by a first step unit depending on upper voltage levels greater than a first reference voltage level among the first voltage levels, (2) tracks a second sigma level by a second step unit depending on lower voltage levels less than a second reference voltage level among the second voltage levels, and (3) calculates a difference between the first sigma level and the second sigma level.

An oscilloscope system includes a chassis with an input signal port and a display system located on the chassis that are both coupled to a measurement engine. The measurement engine captures, via an input signal probe that is coupled to the input signal port and a device under test, a first output test pattern that is generated by the device under test in response to a first input test pattern that is received from a transmitter device. The measurement engine derives, using the first input test pattern, a transfer function for the device under test. The measurement engine captures a second input test pattern that is received from the transmitter device and that is different than the first input test pattern and mathematically convolutes, using the second input test pattern, the transfer function for the device under test to generate a reference measurement.

A controller system includes a microprocessor having a sequencer configured to output at least one spare multiplexor control signal, a memory, and a plurality of sensor inputs. At least one stimulation circuit is connected to a sensor signal line. The at least one stimulation circuit being connected to the at least one spare multiplexor control signal. The stimulation circuit is configured such that a state of the at least one spare multiplexor control signal controls a state of the stimulation circuit.

Adjustable integrated circuits and methods for designing the same are provided. In one embodiment, a method of designing an integrated circuit includes determining a plurality of design criteria of the integrated circuit; designing a plurality of circuit blocks of the integrated circuit in accordance with the plurality of design criteria, where one or more circuit blocks in the plurality of circuit blocks include one or more feedback paths; designing a circuit performance monitor, where the circuit performance monitor includes one or more replica feedback paths corresponding to the one or more feedback paths in the one or more circuit blocks, and where the circuit performance monitor is configured to monitor feedback path information of the one or more replica feedback paths; verifying the plurality of circuit blocks and the circuit performance monitor to meet the plurality of design criteria; and producing a verified description of the integrated circuit for manufacturing.