An implementation of a system disclosed herein includes a decompressor logic with the capability to vary a level of decompression of a scanning input signal based on value of compression program bits and a compressor logic to generate a scanning output signal, the compressor logic including a plurality of XOR logics, wherein the output of the plurality of XOR logics is selected based on the compression program bits.

A circuit includes a test circuit in an integrated circuit to test signal timing of a logic circuit under test in the integrated circuit. The signal timing includes timing measurements to determine if an output of the logic circuit under test changes state in response to a clock signal. The test circuit includes a bit register that specifies which bits of the logic circuit under test are to be tested in response to the clock signal. A configuration register specifies a selected clock source setting from multiple clock source settings corresponding to a signal speed. The selected clock source is employed to perform the timing measurements of the specified bits of the bit register.

A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.

A software-defined linear feedback shift register (SLFSR) implements a low-power test compression for launch-on-capture (LOC). Each bit of an extra register controls a stage of the SLFSR. A control vector is shifted into the extra register to indicate whether a primitive polynomial contains the stage of the non-zero bit. Therefore, SLFSR can configure any primitive polynomials with different degrees by loading different control vectors without any hardware overhead. A low-power test compression method and design for testability (DFT) architecture provide LOC transition fault testing by using seed encoding scheme, low-power test application procedure and a software-defined linear-feedback shift-register (SLFSR) architecture. The seed encoding scheme generates seeds for all test pairs by selecting a primitive polynomial that encodes all test pairs of a compact test set.

Disclosed are an facilitating debugging electronic device, system and method, reasonably integrates the power-supply interface and the signal interface of the electronic device, matches the conventional output end of the electronic device with the master device, realizes the debugging of electronic devices including semi-finished products of PACKAGE (SMD)/PCBA/COB modules and electronic products, partly overcomes the technical problem of the increase of product volume and cost, which caused by setting different interfaces on electronic devices for various testing, burning and correcting purposes. The present disclosure also partly realizes the debugging of electronic devices with fewer external interfaces, which contributes to the miniaturization of electronic devices such as semi-finished products of PACKAGE (SMD)/PCBA/COB modules and electronic products, and guarantees the quality of electronic products by implementing the waterproof, dustproof and pleasing design of the housing structure of devices and achieves economic and social benefits.

Disclosed are an facilitating debugging electronic device, system and method, reasonably integrates the power-supply interface and the signal interface of the electronic device, matches the conventional output end of the electronic device with the master device, realizes the debugging of electronic devices including semi-finished products of PACKAGE (SMD)/PCBA/COB modules and electronic products, partly overcomes the technical problem of the increase of product volume and cost, which caused by setting different interfaces on electronic devices for various testing, burning and correcting purposes. The present disclosure also partly realizes the debugging of electronic devices with fewer external interfaces, which contributes to the miniaturization of electronic devices such as semi-finished products of PACKAGE (SMD)/PCBA/COB modules and electronic products, and guarantees the quality of electronic products by implementing the waterproof, dustproof and pleasing design of the housing structure of devices and achieves economic and social benefits.

A system for testing a circuit comprises scan chains, a controller, and hold-toggle circuitry. The hold-toggle circuitry is configured to allow, according to a control signal generated by the controller, some scan chains in the scan chains to operate in a full-toggle mode and some other scan chains in the scan chains to operate in a hold-toggle mode when a test pattern is being shifted into the scan chains. The control signal also contains information of a hold-toggle pattern for the scan chains operating in the hold-toggle mode. The hold-toggle pattern repeats multiple times when the test pattern is being shifted into the scan chains.

A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.

A method for generating redundant configuration in FPGA devices includes: analysing the configuration pertaining to a given design to be configured, or already configured, in the FPGA device, in order to identify programmed and empty configuration memory portions, configuring the FPGA device for implementing said design, measuring the power consumption of the configured FPGA device, copying the configuration from at least some subsets of the programmed portion to subsets of the empty portion, (a) verifying the configuration read back from said subsets of the empty portion with the configuration data read from said subsets of the programmed portion, (b) verifying whether the functionality of the design after the copy is still correct, (c) measuring the power consumption of the FPGA device, and verifying whether the power consumption of the FPGA device after the copy is acceptable according to pre-defined criteria, if the verification steps (a), (b) and (c) are all successful the redundant configuration is correctly generated, and if the verification steps (a), (b) and (c) are not all successful the method restarts from the beginning choosing other subsets of the empty portion of the FPGA device for hosting the configuration data from said subsets of the programmed portion.

A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.