G01R33/32

Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy

A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.

Systems and methods for extending reconstructions to non-uniform k-space sampling

In a medical imaging auto-calibrated reconstruction method, an imaging scan is performed using a data acquisition scanner to generate image data, calibration data having a uniform sampling is determined, a point-spread function is determined based on the calibration data, and an image is reconstructed from the image data based on the point-spread function. A central region of k-space may have uniform sampling. The calibration data may be determined by extracting a uniformly-sampled central region of k-space from the image data. An outer region of k-space may have non-uniform sampling. A calibration scan may be performed to generate the calibration data.

Systems and methods for extending reconstructions to non-uniform k-space sampling

In a medical imaging auto-calibrated reconstruction method, an imaging scan is performed using a data acquisition scanner to generate image data, calibration data having a uniform sampling is determined, a point-spread function is determined based on the calibration data, and an image is reconstructed from the image data based on the point-spread function. A central region of k-space may have uniform sampling. The calibration data may be determined by extracting a uniformly-sampled central region of k-space from the image data. An outer region of k-space may have non-uniform sampling. A calibration scan may be performed to generate the calibration data.

SYSTEMS AND METHODS FOR EXTENDING RECONSTRUCTIONS TO NON-UNIFORM K-SPACE SAMPLING

In a medical imaging auto-calibrated reconstruction method, an imaging scan is performed using a data acquisition scanner to generate image data, calibration data having a uniform sampling is determined, a point-spread function is determined based on the calibration data, and an image is reconstructed from the image data based on the point-spread function. A central region of k-space may have uniform sampling. The calibration data may be determined by extracting a uniformly-sampled central region of k-space from the image data. An outer region of k-space may have non-uniform sampling. A calibration scan may be performed to generate the calibration data.

SYSTEMS AND METHODS FOR EXTENDING RECONSTRUCTIONS TO NON-UNIFORM K-SPACE SAMPLING

In a medical imaging auto-calibrated reconstruction method, an imaging scan is performed using a data acquisition scanner to generate image data, calibration data having a uniform sampling is determined, a point-spread function is determined based on the calibration data, and an image is reconstructed from the image data based on the point-spread function. A central region of k-space may have uniform sampling. The calibration data may be determined by extracting a uniformly-sampled central region of k-space from the image data. An outer region of k-space may have non-uniform sampling. A calibration scan may be performed to generate the calibration data.

High-frequency magnetic field generating device

A high-frequency magnetic field generating device includes two coils arranged with a predetermined gap in parallel with each other, the two coils (a) in between which electron spin resonance material is arranged or (b) arranged at one side from electron spin resonance material; a high-frequency power supply that generates microwave current that flows in the two coils; and a transmission line part connected to the two coils, that sets a current distribution so as to locate the two coils at positions other than a node of a stationary wave.

Dynamic decoupling in solid state spin ensembles

Long spin coherence lifetimes are realized for ensembles of electronic spin impurities in solid state spin systems, for example NV color centers in diamond, by using spin-control RF pulse sequences to provide dynamic decoupling of the ensembles of spin impurities from environmental sources of decoherence such as dipolar and hyperfine interactions with proximal spin and other paramagnetic impurities in diamond. In this way, the measurement sensitivity of the coherent evolution of ensembles of solid state spin impurities are increased. Using the Carr-Purcell-Meiboom-Gill (CPMG) pulse sequence, the spin coherence lifetimes of NV ensembles can be extended to more than 2 ms in room temperature diamond, and sensitivity of magnetometry that uses NV ensembles can be increased.

Integrated optical nanoscale probe
09779769 · 2017-10-03 · ·

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).

Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
09778329 · 2017-10-03 · ·

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The probe tip is scanned over an area of a sample with an electric charge, such as a field effect transistor or flash memory. Optically Detected Spin Resonance (ODMR) is measured as the probe tip is scanned over the area of the sample, from which a characteristic of the area of the sample with the electric charge may be determined.

Patient proximity-modulated specific absorption rate
11428761 · 2022-08-30 · ·

A method of operating a magnetic resonance imaging system (10) includes adjusting a radio frequency excitation field B1 to be applied to a subject of interest (20) to be imaged. At least one position parameter (d) that is indicative of a position of at least the portion of the subject of interest (20) relative to at least one radio frequency transmit antenna (36) of the magnetic resonance imaging system (10) is determined. At least one radio frequency power-related parameter of radio frequency power to be fed to the at least one radio frequency transmit antenna (36) is adjusted in dependence of the at least one of the determined at least one position parameter (d) and a determined geometric dimension (w) of the subject of interest (20).