A structured dental x-ray detector implements an array of holes or channels filled with at least one of polycrystalline, amorphous, or nano-particle semiconductor x-ray or gamma ray converter materials. Readout electronics are configured for acquiring and analyzing signals from the detector; e.g., operating in a signal integration or photon detecting mode, or in a photon detecting mode with energy resolution. In dental application, a protective shell or frame can be provided to encapsulate the detector and readout electronics, with a wired or wireless communications link to a computer system configured for image data post-processing and storage of the readout signals, with an electronic display for the image data.

Structures operable to detect radiation are described. An imaging system is also described having the structures. For example, a structure may include two screens and a photosensor array between the two screens. One of the screens is comprised of a scintillating glass substrate. The scintillating glass substrate may serve two purposes. The scintillating glass substrate converts incident x-rays into light photons. Additionally, the scintillating glass substrate is a substrate for the photosensor array. The photosensor array is configured to detect light photons that reach the photosensor array from both screens.

This invention provides an ornate method and design to create a PSP panel assembly mosaic for radiography operations. There is no similar design or method as taught herein. Having an integrated attachment point allows a superior foundation to secure PSP panel assemblies together with unique brackets allowing for modular attachments, improving performance, and capabilities. All current options utilize external methods that are not dependable, bulky, and are not modular. The main benefits of this method are a more secure connection, better image quality, fewer backscatter deposits, lightweight, ease of use, and smaller boxes needed to carry components.

Provided is a tube weld X-ray inspection device for inspecting an abnormality, such as a tube welding part crack, of a heat exchanger by using X-rays.

An IP cover having a light-shielding property is detachably mounted on an IP. The IP includes a stimulable phosphor layer on one surface thereof. The IP cover is mounted on the stimulable phosphor layer so as to be closely attached to the stimulable phosphor layer. The IP and the IP cover include notches, and a part of an inspection target is inserted into the notches at the time of inspection. An IP unit is mounted on a blade welded portion of an impeller. Radiation is applied from a radiation irradiation device and a radiation image of the blade welded portion is recorded on the IP as a latent image. The IP cover is detached from the IP unit and the IP is set on a template. The IP is set at an image reading position of a radiation image reading device by the template, and the radiation image is read.

A monocrystalline scintillator comprises a monocrystal and an optical plate wherein a first side of the monocrystal is adhered to the optical plate. The monocrystal comprises at least one of a rare earth garnet, a perovskite crystal, a rare-earth silicate, and a monocrystal oxysulphide. The scintillator assembly includes an adhesive adhering the optical plate to the first side of the monocrystal. The adhesive can comprise an ultra-high vacuum compatible adhesive. The adhesive is substantially transparent and has a refractive index matching the optical plate. The scintillator assembly can also include a reflective coating on the second side of the monocrystal. The monocrystalline scintillator assembly can be incorporated in a microchannel plate image intensifier tube to provide improved spatial resolution and temporal response.

A storage phosphor panel can include an extruded inorganic storage phosphor layer including a thermoplastic polymer and an inorganic storage phosphor material, where the extruded inorganic storage phosphor panel has an image quality comparable to that of a traditional solvent coated inorganic storage phosphor screen. Further disclosed are certain exemplary method and/or apparatus embodiments that can provide inorganic storage phosphor panels including reduced noise. Further disclosed are certain exemplary method and/or apparatus embodiments that can include inorganic storage phosphor layer including at least one polymer, an inorganic storage phosphor material, and a copper phthalocyanine based blue dye.

The invention relates to a method for determining the quality of an imaging plate, comprising the steps of carrying out an exposure of the imaging plate, carrying out a scan of the imaging plate in order to determine an image, determining a signal-to-noise ratio of the image or/and carrying out edge recognition on the image and calculating a quality value of the imaging plate on the basis of the signal-to-noise ratio of the image or/and on the basis of the recognized edge structure. Furthermore, the invention relates to an imaging plate scanner for carrying out such a method.

A control unit corrects a lag component, which is included in offset image data in a state in which radiation is not emitted for a period from the end of a first imaging operation of generating second radiographic image data in a state in which the radiation is emitted and to the start of a second imaging operation of generating the second radiographic image data in the state in which the radiation is emitted and at each of a plurality of different times elapsed since the first imaging operation, on the basis of a combination of the correction image data and the time elapsed since the first imaging operation, lag component time change information, and a time from the end of the first imaging operation to the start of the second imaging operation, and corrects the second radiographic image data using the corrected offset image data.

A scintillator panel includes at least one light emitting layer and at least one non-light emitting layer laminated, wherein the light emitting layer contains phosphor particles, and when the thickness of the light emitting layer is represented by A, a relationship among a cumulative 50% particle diameter D.sub.50 of the phosphor particles based on volume average, a cumulative 90% particle diameter D.sub.90 of the phosphor particles based on volume average, and the thickness A satisfies,
D.sub.50<A and D.sub.90<2A.