The present invention discloses a scintillator structure and to a method for producing an output optical signal at a specific wavelength range. The scintillator structure comprises a multilayer nanostructure formed by at least one pair of alternating first and second layered material being arranged along one or more principal axes. The multi-layer nanostructure defines predetermined geometrical parameters and the structure is made of at least two different material compositions. At least one of the first layered material, the second layered material, or the combination of both, define scintillation properties. The invention also discloses a detector system for detecting an input radiation comprising a scintillator structure being as defined above and being configured and operable to collect most of the emitted optical signal.

An X-ray imaging apparatus includes an X-ray source, an X-ray imaging panel, and a controller. The controller includes an image processing unit that generates an inspection image in accordance with a data signal read from a thin-film transistor with the thin-film transistor supplied with a gate signal, a detection control unit that detects a dark-spot pixel from the inspection image, and a threshold correction unit that applies, to a gate of the thin-film transistor corresponding to the dark-spot pixel, a positive shift voltage that raises a gate-off threshold voltage of the thin-film transistor.

An X-ray detector integral with an automatic exposure control (AEC) device can include an X-ray detection part configured to detect X-rays irradiated from an X-ray source and generate X-ray image data; and an automatic exposure detection board located below the X-ray detection part and configured to generate an X-ray sensing signal for automatic exposure control based on residual X-rays which have passed by or through the X-ray detection part.

Disclosed herein is radiation detector, comprising a first photodiode comprising a first junction; and a first scintillator, wherein a first point in a first plane and inside the first scintillator is essentially completely surrounded in the first plane by an intersection of the first plane and the first junction. The first junction is a p-n junction, a p-i-n junction, a heterojunction, or a Schottky junction. The radiation detector further comprises a first reflector configured to guide essentially all photons emitted by the first scintillator into the first photodiode. The first scintillator is essentially completely enclosed by the first reflector and the first photodiode.

A radiation detector includes a sensor substrate, a conversion layer, and a reinforcing member. In the sensor substrate, a plurality of pixels that accumulate electric charges generated in response to light converted from radiation are formed in a pixel region of a first surface of a flexible base material, and the first surface is provided with a terminal for electrically connecting the flexible cable. The conversion layer is provided on the first surface of the base material 11 and converts the radiation into the light. The reinforcing member is provided in a region including at least a facing region, facing the terminal, on a second surface of the base material opposite to the first surface and has super engineering plastic as a material.

Some embodiments include a system, comprising: a housing; an imaging array disposed within the housing; an imaging strip disposed within the housing; a first readout circuit coupled to the imaging array; a second readout circuit coupled to the imaging strip; and common electronics coupled to the first readout circuit and the second readout circuit and configured to generate image data in response to at least one of the first readout circuit and the second readout circuit.

A radiation detector of one embodiment includes: a scintillator configured to generate first scintillation light having a first peak wavelength and second scintillation light having a second peak wavelength in response to radiation incidence; a photodetection unit configured to detect the scintillation light generated by the scintillator; and a filter layer disposed between the scintillator and the photodetection unit and configured to selectively block the first scintillation light. The filter layer has a metasurface structure.

The present invention relates to a radiation detector (100) comprising: i) a substrate (110); ii) a sensor, which is coupled to the substrate, the sensor comprising a first array (120) of sensor pixels, a second array (130) of signal read-out elements, and an electronic circuitry which is configured to provide image data based on signals received from the signal read-out elements; iii) a transducer, which is coupled to the substrate and to the sensor, the transducer comprising a third array (140) of subpixels, wherein at least two subpixels are assigned to one sensor pixel; wherein the second array of signal read-out elements and the third array of subpixels correspond to each other; wherein each of the subpixels comprises a radiation conversion material.

A device for the detection of gamma rays presents a high resolution in the three-dimensional position of the impact of the gamma ray within one or more scintillation crystal blocks coupled to an array of photosensors, for the determination of the impact energy of said gamma ray, the determination of the instant in time when said impact occurred, the interaction depth and the determination of the time-of-flight. Advantageously, in said device, the scintillation crystal detection blocks are optically isolated, in such a way that the scintillation light can only exit said blocks via the output region; and the scintillation crystal detection blocks and the array of photosensors are disposed in direct optical coupling.

Scintillating glass ceramics are disclosed. The scintillating glass ceramics may be used as an x-ray conversion layer (screen) for a flat panel imager (FPD) and as part of an imaging system. The FPD may have a single screen or a dual screen. The scintillating glass ceramics may be used for either a front screen or a back screen. The scintillating glass ceramics may be used for high energy x-ray applications including for energies of about 0.3 to about 20 MeV. A build-up layer may be attached to the scintillating glass ceramics for high energy applications. The scintillating glass ceramics may include a glass matrix hosting luminescent centers and light scattering centers. The materials used for the luminescent centers and light scattering centers may be the same or different. The scintillating glass ceramics may be coated onto a glass substrate.