An X-ray detection system is described having a solid-state detector module including a plurality of detector tiles at a first side thereof for directly detecting X-ray radiation. The detector module has a plurality of interstitial areas separating adjacent tiles of the detector module, and at least one actuator for inducing motion of the detector module to a plurality of detection positions along a trajectory with respect to a stationary reference frame while the detector module is operated in an exposure mode. The spatial extent of the trajectory in the stationary reference frame is at least as large as the largest interstitial area, and the detector module is adapted for acquiring a plurality of frames in the exposure mode at a frame acquisition rate at least a factor of 100 faster than the inverse of a predetermined exposure time for the exposure mode.

Disclosed herein is a method for forming a radiation detector. The method comprises forming a radiation absorption layer and bonding an electronics layer to the radiation absorption layer. The electronics layer comprises an electronic system configured to process electrical signals generated in the radiation absorption layer upon absorbing radiation photons. The method for forming the radiation absorption layer comprises forming a trench into a first surface of a semiconductor substrate; doping a sidewall of the trench; forming a first electrical contact on the first surface; forming a second electrical contact on a second surface of the semiconductor substrate. The second surface is opposite the first surface. The method further comprises dicing the semiconductor substrate along the trench.

The invention relates to energy-resolved X-ray imaging apparatus and method. The present disclosure provides an apparatus for electromagnetic irradiation imaging. The apparatus includes one or more pixels, each pixel including a plurality of detector cells arranged in a row extending in a row direction. The row is configured to receive photons at an incident surface at one end of the row, and the received photons penetrate the plurality of detector cells in the row direction. The plurality of detector cells of the same row are configured to generate respective signals that collectively indicate an energy-resolved spectral profile of the photons based on the penetration of the photons into the row of detector cells

Disclosed herein is a method for forming a radiation detector. The method comprises forming a radiation absorption layer and bonding an electronics layer to the radiation absorption layer. The electronics layer comprises an electronic system configured to process electrical signals generated in the radiation absorption layer upon absorbing radiation photons. The method for forming the radiation absorption layer comprises forming a trench into a first surface of a semiconductor substrate; doping a sidewall of the trench; forming a first electrical contact on the first surface; forming a second electrical contact on a second surface of the semiconductor substrate. The second surface is opposite the first surface. The method further comprises dicing the semiconductor substrate along the trench.

Various methods and systems are provided for an imaging detector array. In one example, a detector module of the array has an X-ray sensor assembly coupled to an upper surface of a conductive block and at least one integrated circuit positioned in a recess of the conductive block below the X-ray sensor assembly. The detector module may further include a radiation blocker positioned between the X-ray sensor assembly and the at least one integrated circuit.

A radiation sensor that may include a first transistor, a first isolated conductive structure that comprises a floating gate of the first transistor, a first group of radiation sensing diodes that are coupled to each other, wherein the first group is configured to convert sensed radiation that is sensed by the first group to a first output signal, and to change a state of the first isolated conductive structure using the first output signal, a second transistor, a second isolated conductive structure that comprises a floating gate of the second transistor, and a second group of radiation sensing diodes that are coupled to each other, wherein the second group is configured to convert sensed radiation that is sensed by the second group to a second output signal, and to change a state, under a control of the first transistor, of the second isolated conductive structure using the second output signal.

Disclosed herein is a method comprising: obtaining a third image from a first X-ray detector when the first X-ray detector and a second X-ray detector are misaligned; determining, based on a shift between a first image and the third image, a misalignment between the first X-ray detector and the second X-ray detector when the first and second detectors are misaligned; wherein the first image is an image the first X-ray detector should capture if the first and the second detectors are aligned.

Disclosed herein is an image sensor comprising: a first, a second, and a third radiation detectors, each of which comprising a planar surface to receive radiation from a radiation source; wherein the planar surfaces of the first radiation detector and the second radiation detector are not parallel, the planar surfaces of the second radiation detector and the third radiation detector are not parallel, and the planar surfaces of the third radiation detector and the first radiation detector are not parallel; wherein the first radiation detector, the second radiation detector and the third radiation detector are not arranged in the same row; wherein the first, the second and the third radiation detectors are configured such that the planar surface of each of them includes a position at which an angle of incidence of the radiation from the radiation source is 0°.

An x-ray imaging system includes an x-ray source and detector. The detector is a photon counting x-ray detector, enabling detection of photon-counting events. The system acquires at least one phase contrast image based on photon-counting events. The detector includes x-ray detector sub-modules, also referred to as wafers, each including detector elements. The sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x-rays enter through the edge. Each sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements/pixels, are arranged. The system estimates charge diffusion from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in a sub-module or wafer of the x-ray detector, and estimates a point of interaction of the x-ray photon sub-module based on the determined estimate of charge diffusion.

To optimize image quality and/or sensitivity, a Compton camera is adaptable. The scatter and/or catcher detectors may move closer to and/or further away from a patient and/or each other. This adaptation allows a balancing of image quality and sensitivity by altering the geometry.