Systems and methods include acquisition of data representing true coincidences and scatter coincidences detected by the plurality of detectors, allocation of the data into respective ones of a plurality of energy ranges, determination of a baseline response associated with each of a subset of the plurality of energy ranges, generation of data representing expected true coincidences associated with each of the subset of the plurality of energy ranges based on the data allocated to each of the subset of the plurality of energy ranges and the baseline response associated with each of the subset of the plurality of energy ranges, determination of a raw scatter estimate based on the data representing expected true coincidences associated with each of the subset of the plurality of energy ranges and the data allocated to each of the subset of the plurality of energy ranges, and reconstruction of an image based on the raw scatter estimate and the data representing true coincidences and scatter coincidences.

A detector apparatus for use as part of a data network includes a plurality of x-ray detectors, each of the plurality of x-ray detectors including a network-capable network interface, and a switch or router, connected to each of the network-capable network interfaces of the plurality of x-ray detectors, each of the plurality of x-ray detectors including a distinct IP address such that the data network is adjustable to take a change in a number of the plurality of x-ray detectors into account. The plurality of x-ray detectors are configured to detect x-rays generated from a single x-ray source.

Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.

Systems and methods include acquisition of data representing true coincidences and scatter coincidences detected by the plurality of detectors, allocation of the data into respective ones of a plurality of energy ranges, determination of a baseline response associated with each of a subset of the plurality of energy ranges, generation of data representing expected true coincidences associated with each of the subset of the plurality of energy ranges based on the data allocated to each of the subset of the plurality of energy ranges and the baseline response associated with each of the subset of the plurality of energy ranges, determination of a raw scatter estimate based on the data representing expected true coincidences associated with each of the subset of the plurality of energy ranges and the data allocated to each of the subset of the plurality of energy ranges, and reconstruction of an image based on the raw scatter estimate and the data representing true coincidences and scatter coincidences.

The present invention provides a method of calibrating gamma-ray and photon counting detectors, including, but not limited to, monolithic crystal detectors. The method of the present invention is based on the observation that measurement of fan beam datasets allows the synthesis of collimated beam data to derive MDRFs by use of an algorithm that finds the common or intersecting data subsets of two or more orthogonal calibration datasets. This makes the calibration process very efficient while still allowing the full benefits of maximum-likelihood event-parameter estimation that incorporates the statistical nature of the light sensor measurements.

A radiation image capturing apparatus includes a sensor substrate including a flexible base material and plural pixels that accumulate charges generated in accordance with radiation, a flexible first cable including one ends electrically connected to a connection region disposed at a predetermined side of the sensor substrate, a first circuit substrate electrically connected to the other end of the first cable and in which a first component used for processing a digital signal in a circuit unit driven in a case of reading out the charges in the plural pixels is mounted, a flexible second cable including one end electrically connected to a connection region disposed at a side different from the predetermined side, and a second circuit substrate electrically connected to the other end of the second cable and in which a second component used for processing an analog signal in the circuit unit is mounted.

Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.

A nuclear radiation monitoring apparatus comprising: communication circuitry configured to receive nuclear radiation data generated by a nuclear radiation detector, the nuclear radiation data being indicative of nuclear radiation emitted from each of a plurality of portions of an object and detected by the nuclear radiation detector; classification circuitry configured to classify the detected nuclear radiation using the nuclear radiation data; intensity determination circuitry configured to determine a value of an intensity parameter indicative of an intensity of the classified nuclear radiation for each portion of the object using the nuclear radiation data; visualisation data generation circuitry configured to generate visualisation data indicative of the classification of the classified nuclear radiation and, for each portion of the object, visualisation data indicative of the portion of the object and the determined intensity parameter value of the portion of the object; and display output circuitry configured to output the generated visualisation data for display.

An optical measurement device includes: an optical sensor that detects pulsed signal light and that outputs a detection signal formed of an exponential-function response; an A/D converter that samples the detection signal output from the optical sensor and that converts the detection signal into a digital signal; and a processor comprising hardware, the processor being configured to subject the digital signal output from the A/D converter to inverse transformation by using a multiple diagonal matrix, thus calculating an estimated pulse of the signal light.

An imaging detector is provided that includes a continuous NaI crystal, a glass plate, an array of SiPMs, and an array of concentrators. The continuous NaI crystal defines a reception side and a detection side. The glass plate is disposed on the detection side of the continuous NaI crystal, and is interposed between the detection side of the continuous NaI crystal and the array. The array of concentrators corresponds to the array of SiPMs, and is interposed between the array of SiPMs and the glass plate. Each concentrator has a reception side opening that is larger than a detection side opening, with the detection side opening disposed proximate to a corresponding SiPM.