A detector apparatus for use as part of a data network includes a plurality of x-ray detectors, each of the plurality of x-ray detectors including a network-capable network interface, and a switch or router, connected to each of the network-capable network interfaces of the plurality of x-ray detectors, each of the plurality of x-ray detectors including a distinct IP address such that the data network is adjustable to take a change in a number of the plurality of x-ray detectors into account. The plurality of x-ray detectors are configured to detect x-rays generated from a single x-ray source.

Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.

Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.

A detector apparatus includes at least one x-ray detector, including a network-capable network unit; and a switching unit connected to the network unit of the x-ray detector.

Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.

A method is provided for monitoring the exposure to radiation of medical personnel during an X-ray examination of an examination object with an X-ray apparatus. A monitoring unit is activated and continuously scans a first three-dimensional volume that includes a region directly irradiated by the X-ray beam, for objects. When an object is detected, automatic evaluation is performed as to whether the object is a human body part that does not correspond to the examination object and a signal or a display is output if a human body part is determined inside the three-dimensional volume that does not correspond to the examination object.

An apparatus for collecting super-sampled imaging data includes an imaging scanner, a bed, and a first motor. The imaging scanner includes a plurality of detectors arranged substantially circumferentially about a scanner axis. The bed has a plane and a central axis that is generally in the plane of the bed. However, the bed is oriented so as to form a first non-zero degree angle between the central axis and the scanner axis. The first motor translates the bed along the central axis, and a second motor may translate the bed along an axis orthogonal to the central axis and scanner axis. Since the voxels pass through the scanner in different relative positions of the bed, additional information may be acquired during the scan.

An imaging detector is provided that includes a continuous NaI crystal, a glass plate, an array of SiPMs, and an array of concentrators. The continuous NaI crystal defines a reception side and a detection side. The glass plate is disposed on the detection side of the continuous NaI crystal, and is interposed between the detection side of the continuous NaI crystal and the array. The array of concentrators corresponds to the array of SiPMs, and is interposed between the array of SiPMs and the glass plate. Each concentrator has a reception side opening that is larger than a detection side opening, with the detection side opening disposed proximate to a corresponding SiPM.

Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.

The present invention provides a method of calibrating gamma-ray and photon counting detectors, including, but not limited to, monolithic crystal detectors. The method of the present invention is based on the observation that measurement of fan beam datasets allows the synthesis of collimated beam data to derive MDRFs by use of an algorithm that finds the common or intersecting data subsets of two or more orthogonal calibration datasets. This makes the calibration process very efficient while still allowing the full benefits of maximum-likelihood event-parameter estimation that incorporates the statistical nature of the light sensor measurements.