Patent classifications
G01V5/222
HUMAN BODY SECURITY INSPECTION APPARATUS AND METHOD OF OPERATING THE SAME AND FILTER DEVICE
A human body security inspection apparatus, a method of operating the same, and an associated filter device are disclosed. The human body security inspection apparatus includes a radiation beam exit configured for emitting a radiation beam; a beam guiding box configured for guiding the radiation beam; and a filter device configured between the radiation beam exit and the beam guiding box. The filter device includes a housing and a filter cage having a central axis. The filter cage is formed by arranging two or more pairs of filtering sheets, which are made of different materials and/or have different thicknesses, in an encircling way. The filter cage is rotatable about its central axis such that at least one pair of filtering sheets is capable of filtering the radiation beam to adjust an outputted dosage of the radiation beam of the human body security inspection apparatus.
Device and method for analysis of material by neutron interrogation
Material analysis device (100) comprising a neutron generator (10) for emitting neutrons towards a material to be analysed in pulsed mode; an alpha particle detector (13) for locating the neutrons emitted in a given solid angle by detecting alpha particles associated with these neutrons; at least one gamma ray detector (14) for measuring energy of gamma photons generated by interaction of the neutrons emitted in the given solid angle with the material to be analysed; at least two Compton cameras (15), each for measuring energy of the gamma photons generated by interaction of the neutrons with the material to be analysed and for calculating an incidence cone of these gamma photos; and an electronic circuit adapted for three-dimensionally mapping the presence of at least one chemical element of interest in the material to be analysed based on data provided by the alpha particle detector (13), the gamma ray detector (14) and the Compton cameras (15).
SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE
A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
X-RAY SENSOR, METHOD FOR CONSTRUCTING AN X-RAY SENSOR AND AN X-RAY IMAGING SYSTEM COMPRISING SUCH AN X-RAY SENSOR
An X-ray sensor (1) having an active detector region including a plurality of detector diodes (2) arranged on a surface region (3) of the X-ray sensor (1), a junction termination (4) surrounding the surface area (3) including the plurality of detector diodes (2), the junction termination (4) including a guard (5) arranged closest to the end of the surface region (3), a field stop (6) arranged outside the guard (2) and a number N of field limiting rings, FLRs (7) arranged between the guard (5) and the field stop (6), wherein each of the FLRs (7) are placed at positions selected so that distances between different FLRs (7) and between the guard and the first FLR lie within an effective area, the effective area being bounded by the lines =(10+1.3(n1)) m and =(5+1.05(n1)) m.
Semiconductor X-ray detector
Disclosed herein is an apparatus comprising: a radiation absorption layer comprising an electrode; a counter configured to register a number of radiation particles absorbed by the radiation absorption layer; a controller configured to start a time delay from a time at which an absolute value of an electrical signal on the electrode equals or exceeds an absolute value of a first threshold; a comparator configured to compare the electrical signal to a second threshold; wherein the controller is configured to activate the comparator during the time delay; wherein the controller is configured to cause the number registered by the counter to change, if the comparator determines that an absolute value of the electrical signal equals or exceeds an absolute value of the second threshold.
Enclosed x-ray chopper wheel
A chopper wheel assembly includes a collimator configured to narrow an x-ray beam, a chopper wheel has a planar surface configured to face in a direction of the collimator and a housing configured to receive the chopper wheel. The chopper wheel includes a central axis, a plurality of slits in the planar surface, a first projection extending from the planar surface in a direction of the collimator and a second projection extending from the planar surface in the direction of the collimator. The slits extend in radially-outward direction relative to the central axis. The first projection is located radially outward of the plurality of slits and the second projection is located radially inward of the plurality of slits. Each projection is provided for 360 degrees about the central axis. The housing includes an interior wall including a first groove configured to receive the first projection and a second groove configured to receive the second projection with the chopper wheel received within the housing.
Enclosed x-ray chopper wheel
A chopper wheel assembly includes a collimator configured to narrow an x-ray beam, a chopper wheel has a planar surface configured to face in a direction of the collimator and a housing configured to receive the chopper wheel. The chopper wheel includes a central axis, a plurality of slits in the planar surface, a first projection extending from the planar surface in a direction of the collimator and a second projection extending from the planar surface in the direction of the collimator. The slits extend in radially-outward direction relative to the central axis. The first projection is located radially outward of the plurality of slits and the second projection is located radially inward of the plurality of slits. Each projection is provided for 360 degrees about the central axis. The housing includes an interior wall including a first groove configured to receive the first projection and a second groove configured to receive the second projection with the chopper wheel received within the housing.
X-ray scanning system with high x-ray energy
An x-ray scanning system, and corresponding method, includes an x-ray source that produces incident x-ray radiation having end-point x-ray energy, which, in various embodiments, can be greater than about 200 keV, between about 200 keV and about 500 keV, or greater than about 500 keV. The system also includes a disk chopper wheel that can be irradiated by and attenuate the incident x-ray radiation. The disk chopper wheel further defines one or more slits configured to pass the incident x-ray radiation through the disk chopper wheel for scanning a target. In some embodiments, the high end-point x-ray energies with disk chopper wheels are facilitated by forming the incident x-ray radiation as a collimated fan beam and/or orienting the chopper wheel with a wheel plane substantially non-perpendicular to a fan beam plane, increasing effective thickness of a disk chopper wheel to attenuate incident x-rays of higher energies.
Screening system
There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.
Mobile Backscatter Imaging System with Dual-Sided Inspection
An x-ray inspection system includes a vehicle, a mobile conveyance, and first and second x-ray scanning modules. The first module is transportable directly or indirectly, via a transport of the vehicle, to an inspection site, and it can irradiate a near side of an object to be inspected at the site with a first x-ray scanning beam. The second scanning module is transportable to the inspection site via a combination of the mobile conveyance and the vehicle, it the second module is movable and positioned at the inspection site, via the mobile conveyance, to irradiate a far side of the object with a second x-ray scanning beam. The vehicle and the mobile conveyance are configured to be mechanically coupled together during the transport and to be mechanically decoupled from each other at the inspection site. The system enables dual-sided x-ray backscatter inspection using a mobile platform.