The present specification discloses a covert mobile inspection vehicle with a backscatter X-ray scanning system that has an X-ray source and detectors for obtaining a radiographic image of an object outside the vehicle. The systems preferably include at least one sensor for determining a distance from at least one of the detectors to points on the surface of the object being scanned, a processor for processing the obtained radiographic image by using the determined distance of the object to obtain an atomic number of each material contained in the object, and one or more sensors to obtain surveillance data from a predefined area surrounding the vehicle.

The present disclosure discloses an inspection device, an inspection method and an inspection system. The device comprises a distributed ray source comprising multiple source points; a light source collimator configured to converge the rays generated by the distributed ray source to form an inverted fan-shaped ray beam; a scatter collimator configured to only allow rays scattered at one or more particular scattering angles which are generated by the rays from the light source collimator interacting with inspected objects to pass; at least one detector each comprising multiple detection units which have an energy resolution capability and are substantially arranged in a cylindrical surface to receive the scattered rays passing through the scatter collimator; and a processing apparatus configured to calculate energy spectrum information of the scattered rays from the inspected objects based on a signal output by the detectors.

A diffraction system configured to generate a diffraction signature based upon an angular disbursement of radiation is provided. In some embodiments, the diffraction system comprises a radiation source comprising a radiographic isotope configured to natural emit radiation due to decay. In some embodiment, the diffraction system is part of an object identification system that comprises one or more other radiation imaging modalities, such as a CT system and/or a line-scan system. By way of example, the one or more other radiation imaging modalities may perform an initial examination of an object to generate data indicative of the object. The data can be analyzed to identify an item of interest within the object, which can subsequently be examined by the diffraction system to generate a diffraction signature of the item. The diffraction signature of the item can be compared to known diffraction signatures of known items to characterize the item.

Methods of detecting high atomic weight materials in a volume such as a truck or cargo container are disclosed. The volume is scanned with an X-ray imaging system and a muon detection system. Using the output data of the muon detection system, the exit momentum and incoming and outgoing tracks of each muon are reconstructed. A muon scattering statistical model is calculated using the muon exit momentum and the incoming and outgoing tracks of the muon. A most likely scattering density map is determined according to the muon-scattering statistical model and an X-ray statistical model. A visual representation of the most likely scattering density map is displayed.

A scanner comprises an electromagnetic wave source; and a detector positioned to measure emissions from the electromagnetic wave source, wherein the electromagnetic wave source comprises a first technology, and the electromagnetic wave source is interchangeable with a second electromagnetic wave source comprising a second technology and/or wherein the detector comprises a first technology, and the detector is interchangeable with a second detector comprising a second technology. Training the scanner to inspect for contaminants includes generating electromagnetic wave emissions at a plurality of combinations of parameters; moving a conveyor belt to expose product having a plurality of contaminants of different sizes to the emissions generated at more than one combination of parameters; recording attenuated emissions that pass through the product at more than one combination of parameters; and selecting a combination of parameters to use when inspecting for the contaminant.

Disclosed is a nondestructive inspection system includes: a radiation source system generating different types of radiations and irradiating the generated different types of radiations toward an inspection object; a detector system detecting each of the radiations transmitted through the inspection object; a transfer system varying a position of the inspection object such that the radiations generated by the radiation source system are irradiated to the inspection object; and an image system generating an image regarding the inspection object on the basis of a detection result from the detector system, wherein the radiation source system comprises: an electron gun generating an electron beam; an electron accelerator accelerating the electron beam generated by the electron gun; and a target system selectively generating at least one of various types of radiations according to variables when the electron beam accelerated by the electron accelerator is irradiated thereto.

The present disclosure relates to a technical field of a security detection device, and particularly, to a security detection system, comprising one or more detection devices, wherein the detection device comprises a first ray emitter, a ray receiver, and a movable frame, wherein the first ray emitter comprises a first ray source for generating first detection rays and is provided at a bottom portion of the movable frame, so that the first detection rays can penetrate through a detected object from a bottom of the detected object; the ray receiver comprises a ray detector provided on the movable frame, for correspondingly receiving the first detection rays having penetrated through the detected object; and the movable frame is movable in a direction in which the first ray emitter and the ray receiver are capable of moving through a detection region for the detected object.

The present invention may perform fluoroscopic imaging simultaneously on the subjects in at least two channels using only one electron accelerator, at least two sets of X-ray beams and at least two sets of detector systems, through the design of the electron accelerator, the shielding and collimating device, the at least two detector arrays and various mechanical composite structures. The X-ray fluoroscopic imaging system according to the present invention may be designed in specific forms of a stationary type, an assembled type, a track mobile type or vehicular mobile type, etc., and has advantages such as simple structure, low cost, strong function, good image quality and the like.

The invention discloses an integrated security inspection system, comprising: a server, an information input unit in an information input area, a tray distributing and associating unit and a security inspection imaging and sorting unit in a baggage check area. The tray distributing and associating unit distributes a tray with an identifier to a piece of baggage. The information input unit obtains and sends information of a person to the server. The tray distributing and associating unit obtains and sends information of the person and the identifier of the tray to the server, which processes them to generate a first association information. The security inspection imaging and sorting unit checks the baggage to obtain a security image, read the identifier, and send them to the server, which processes them to generate a second association information. The server matches and stores the information of the person with information of the security image.

A diffraction system configured to generate a diffraction signature based upon an angular disbursement of radiation is provided. In some embodiments, the diffraction system comprises a radiation source comprising a radiographic isotope configured to natural emit radiation due to decay. In some embodiment, the diffraction system is part of an object identification system that comprises one or more other radiation imaging modalities, such as a CT system and/or a line-scan system. By way of example, the one or more other radiation imaging modalities may perform an initial examination of an object to generate data indicative of the object. The data can be analyzed to identify an item of interest within the object, which can subsequently be examined by the diffraction system to generate a diffraction signature of the item. The diffraction signature of the item can be compared to known diffraction signatures of know items to characterize the item.