Portable apparatus for identifying and mitigating defects in electronic devices disposed on substrates or windows are disclosed herein. Such defects can be visually perceived by the end user. The substrates or windows may include flat panel displays, photovoltaic windows, electrochromic devices, and the like, particularly electrochromic windows.

Portable apparatus for identifying and mitigating defects in electronic devices disposed on substrates or windows are disclosed herein. Such defects can be visually perceived by the end user. The substrates or windows may include flat panel displays, photovoltaic windows, electrochromic devices, and the like, particularly electrochromic windows.

In a distance measuring device that measures a distance to an object using a round-trip time of light, a solid-state image sensor includes a plurality of pixel groups capable of being exposed independently, and causes each of the plurality of pixel groups to receive, at a different exposure time, reflected light from the object that is originally pulsed radiation light from a light emitter. A light emission and exposure controller cyclically and intermittently exposes each of the plurality of pixel groups of the solid-state image sensor at the different exposure time to obtain pixel signals of types corresponding to a time difference between the reflected light and the radiation light, and a signal processor obtains information about the distance to the object according to pixel signals of adjacent pixels exposed at different exposure times for each of the plurality of pixel groups.

In a distance measuring device that measures a distance to an object using a round-trip time of light, a solid-state image sensor includes a plurality of pixel groups capable of being exposed independently, and causes each of the plurality of pixel groups to receive, at a different exposure time, reflected light from the object that is originally pulsed radiation light from a light emitter. A light emission and exposure controller cyclically and intermittently exposes each of the plurality of pixel groups of the solid-state image sensor at the different exposure time to obtain pixel signals of types corresponding to a time difference between the reflected light and the radiation light, and a signal processor obtains information about the distance to the object according to pixel signals of adjacent pixels exposed at different exposure times for each of the plurality of pixel groups.

A system for optical measurement of an object includes a radiation generating device, a capturing device, and an evaluation device. The radiation generating device is configured to emit electromagnetic radiation onto the object. The capturing device includes an image sensor. The capturing device is configured to capture a measurement image as a result of an exposure of the image sensor with radiation returned from the object. The capturing device is configured to vary a focus setting (D) during the exposure. The evaluation device is configured to determine coordinates of at least one location on the object based on the captured measurement image.

An information processing apparatus includes a processor, and a memory connected to or built in the processor, in which the processor performs first distance measurement of measuring a distance to an imaging region based on an irradiation timing at which a light irradiator emits light to the imaging region and a light-receiving timing at which a light receiver receives reflected light of the light from the imaging region, performs second distance measurement of measuring the distance to the imaging region based on a first image obtained by imaging the imaging region by an imaging apparatus, and executes a specific process in a case in which a first distance measurement result obtained by performing the first distance measurement and a second distance measurement result obtained by performing the second distance measurement are different from each other.

An electronic device includes at least one optical lens assembly. The optical lens assembly includes four lens elements, and the four lens elements are, in order from an outside to an inside, a first lens element, a second lens element, a third lens element and a fourth lens element. The first lens element has an outside surface being convex in a paraxial region thereof. The second lens element has an inside surface being convex in a paraxial region thereof. The fourth lens element has an inside surface being concave in a paraxial region thereof, wherein at least one of an outside surface and the inside surface of the fourth lens element includes at least one critical point in an off-axis region thereof.

An actuator is configured to drive an imaging lens system. The actuator includes a frame portion configured to accommodate the imaging lens system, a supporting portion disposed on the frame portion, a driving portion configured to drive the imaging lens system to move, an optical mark structure disposed on part of the frame portion, the supporting portion or the driving portion and a liquid disposed on the optical mark structure. The supporting portion is configured to support the imaging lens system and give the imaging lens system a degree of freedom of movement with respect to the frame portion. The optical mark structure includes a plurality of optical mark units arranged side by side. The liquid is in physical contact with the imaging lens system, the frame portion, the supporting portion or the driving portion that is adjacent to the optical mark structure.

An optical projection system includes an image sensor, a light emitting circuit and a processor. The image sensor is configured to capture an image of a target object. The processor is electrically coupled to the image sensor and the light emitting circuit. The processor is configured to determine a size of the target object, and control the light emitting circuit to emit an optical pattern and to fan out the optical pattern according to the size of the target object, in order to cover the target object.

A distance measuring system is provided for auto focusing a camera of an inspection system for inspecting a planar surface that is patterned. The system includes a pattern generator, an image sensor, an optical element(s) and a processor. The pattern generator projects a spatially random pattern toward the planar surface at an oblique angle. The optical element(s) forms the image of the reflected pattern on the image sensor and the image sensor captures an image of the spatially random pattern reflected off the planar surface. The processor processes the image of the spatially random pattern and provides auto-focus information.