Portable apparatus for identifying and mitigating defects in electronic devices disposed on substrates or windows are disclosed herein. Such defects can be visually perceived by the end user. The substrates or windows may include flat panel displays, photovoltaic windows, electrochromic devices, and the like, particularly electrochromic windows.

Portable apparatus for identifying and mitigating defects in electronic devices disposed on substrates or windows are disclosed herein. Such defects can be visually perceived by the end user. The substrates or windows may include flat panel displays, photovoltaic windows, electrochromic devices, and the like, particularly electrochromic windows.

The invention relates to an optical device, comprising: a lens having an adjustable focal length. According to the invention, a light source which is configured to emit light that is affected by said lens and impinges on at least a first photosensitive element, which is designed to generate a first output signal corresponding to the intensity of light impinging on it, wherein the first photosensitive element is configured to measure only a portion of the intensity distribution of said emitted light, and wherein the light source, the lens and the first photosensitive element are configured such that a change of the focal length of said lens changes the intensity distribution of the emitted light that impinges on the first photosensitive element, so that each focal length of the lens is associated to a specific first output signal generated by the first photosensitive element.

The invention relates to an optical device, comprising: a lens having an adjustable focal length. According to the invention, a light source which is configured to emit light that is affected by said lens and impinges on at least a first photosensitive element, which is designed to generate a first output signal corresponding to the intensity of light impinging on it, wherein the first photosensitive element is configured to measure only a portion of the intensity distribution of said emitted light, and wherein the light source, the lens and the first photosensitive element are configured such that a change of the focal length of said lens changes the intensity distribution of the emitted light that impinges on the first photosensitive element, so that each focal length of the lens is associated to a specific first output signal generated by the first photosensitive element.

A distance measuring camera 1 includes a light beam irradiation unit 3 for irradiating a light beam B3 with respect to a subject, an imaging unit 4 for photographing the subject to which the light beam B3 is irradiated to obtain an image and a distance calculating part 6 for calculating a distance to the subject based on a size of the light beam B3 on the subject contained in the image obtained by the imaging unit.

A distance measuring camera 1 includes a light beam irradiation unit 3 for irradiating a light beam B3 with respect to a subject, an imaging unit 4 for photographing the subject to which the light beam B3 is irradiated to obtain an image and a distance calculating part 6 for calculating a distance to the subject based on a size of the light beam B3 on the subject contained in the image obtained by the imaging unit.

Systems and methods for autofocusing an objective lens in a microscope system. A self-calibrating autofocus system includes a light source, a decentered aperture, and image-capturing device. The system may be connected to the microscope system so that the light source generates a light on an optical path that includes the objective lens and a plate having a reference surface proximal to a sample holding component. The image capturing device images a reflection of light from the reference surface as the objective lens moves to a series of z-positions. A reference calibration slope is generated for the objective lens by determining positions of the images taken at the z-positions of the objective lens. At least one image having a particular attribute corresponds to a best focus position. The objective lens is moved to predicted best focus or preferred offset from calibrated best focus using the reference calibration slope.

Fringe-projection autofocus system devoid of a reference mirror. Contributions to error in determination of a target surface profile caused by air non-uniformities are measured based on multiple measurements of the target surface performed at different wavelengths, and/or angles of incidence, and/or grating pitches and subtracted from the measured profile, rendering the system substantially insensitive to presence of air turbulence. Same optical beams forming a fringe irradiance pattern on target surface are used for measurement of the surface profile and reduction of measurement error by the amount attributed to air turbulence.

Fringe-projection autofocus system devoid of a reference mirror. Contributions to error in determination of a target surface profile caused by air non-uniformities are measured based on multiple measurements of the target surface performed at different wavelengths, and/or angles of incidence, and/or grating pitches and subtracted from the measured profile, rendering the system substantially insensitive to presence of air turbulence. Same optical beams forming a fringe irradiance pattern on target surface are used for measurement of the surface profile and reduction of measurement error by the amount attributed to air turbulence.

An electronic device includes at least one optical lens assembly. The optical lens assembly includes four lens elements, and the four lens elements are, in order from an outside to an inside, a first lens element, a second lens element, a third lens element and a fourth lens element. The first lens element has an outside surface being convex in a paraxial region thereof. The second lens element has an inside surface being convex in a paraxial region thereof. The fourth lens element has an inside surface being concave in a paraxial region thereof, wherein at least one of an outside surface and the inside surface of the fourth lens element includes at least one critical point in an off-axis region thereof.