A method for autofocusing in microscopic examination of a specimen located at the focus of a microscope objective uses an autofocus beam path, the autofocus beam path being directed, via a deflection device arranged on the side of the microscope objective facing away from the specimen, toward the microscope objective, and from there onto a reflective autofocus interface in the specimen region. The autofocus beam path is reflected at the autofocus interface and directed via the microscope objective and the deflection device toward an autofocus detector. The deflection device comprises two regions spaced apart from one another in a propagation direction of the autofocus beam path. Each region reflects the autofocus beam path. The autofocus detector is arranged in a plane conjugated with the microscope objective pupil to acquire an interference pattern. The focus of the microscope is adjusted as a function of the acquired interference pattern.

A method including obtaining a plurality of radiation distributions of measurement radiation redirected by the target, each of the plurality of radiation distributions obtained at a different gap distance between the target and an optical element of a measurement apparatus, the optical element being the nearest optical element to the target used to provide the measurement radiation to the target, and determining a parameter related to the target using data of the plurality of radiation distributions in conjunction with a mathematical model describing the measurement target.

A digital microscope system configured for use with the built in camera of a mobile device is provided. The digital microscope system has a lens and an advanced lighting system incorporated into a case designed to fit a particular mobile device, where the case positions the optics of the case over the lens of the built in camera and the camera built in flash. When combined with an application program (app) running on the mobile device held within the case, the optics of the case combined with the built in camera of the mobile device becomes a powerful digital microscope with a user adjustable magnification. In a specific embodiment the adjustable magnification ranges from 1 up to 200 optical magnification.

A control device for a microscope includes an operating device, an actuator and a processor. The operating device is configured to be operated by a user to vary focusing and/or positioning of an optical imaging system of the microscope relative to a sample. The actuator is configured to adjust an aperture of a detection pinhole which is included in the microscope so as to eliminate out-of-focus light from detection light which is directed by the optical imaging system onto a detector of the microscope. The processor is configured to detect a predetermined operating condition in response to a user operation of the operating device and to control the actuator to vary the aperture of the detection pinhole upon detection of the predetermined operating condition.

Provided herein are systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Systems and methods provided herein may comprise simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

The invention relates to a method and to an arrangement for operating a dynamic nano focusing system for use thereof in the field of microscopy, interferometry or similar applications, wherein the nano focusing system comprises a lever-transmission piezo actuator and a frictionless guide based on a resiliently deformable solid body joint which is connected to a mounting unit, in particular for a lens, in order to implement the desired adjustment paths for the focusing. According to the invention, in order to increase the dynamics during the focusing process, a secondary fine adjustment movement is superimposed on the primary adjustment movement, said secondary fine adjustment movement having a smaller adjustment path but higher frequency than the primary adjustment movement, wherein, when the fine adjustment is carried out, a determination is made as to whether the focusing result changes, in order to specify according thereto the amount and/or the direction of the primary adjustment movement.

Systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Discussed systems and methods may include simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

A control device for a microscope includes an actuator configured to shift a microscopic field of view relative to a sample, and an operating device configured to be operated by a user to control the actuator in accordance with a response characteristic determining a shift sensitivity. The field of view is shifted relative to the sample in response to a user operation of the operating device. The control device further includes a processor configured to determine a total visual magnification, and to control the response characteristic of the operating device based on the total visual magnification. The field of view is visualized by the microscope to the user based on the total visual magnification.

Systems and method for imaging a sample of a top surface of a sample coverslip which capture a sample image of the sample on the top surface of the sample coverslip using an objective lens disposed underneath the sample coverslip. Capture reference image data obtained from light reflected from a top surface of a calibration coverslip, capture test image data obtained from light reflected from a top surface of the sample coverslip, process die reference image data and the test image data to produce a calculated point spread function associated with the objective lens and the coverslip in use, and deconvolve the sample image using the calculated point spread function to thereby reduce artifacts from the sample image.

Some implementations of the disclosure relate to a method including: obtaining surface profile data of a swath of a sample, the swath divided into multiple tiles, and the surface profile data including surface profile data for each tile; calculating, based at least on a threshold residual and the surface profile data of the swath, one or more zones of the swath that include the multiple tiles, each zone including a respective one or more of the tiles that are adjacent; and associating, based on the surface profile data associated with the one or more tiles of each zone, a detilt value or detip value with each zone, the detilt value or detip value indicating an amount to adjust, before capturing one or more images of the zone, a relative tilt or tip between the sample and an image sensor of an imaging system capturing the one or more images.