Patent classifications
G03H2001/0447
Method and system for determining features of objects in a suspension
A method of directing a wavefront of coherent radiation through a sample of objects in a suspension, capturing an interference pattern between the wavefront of coherent radiation and a wavefront of the diffracted by the object with an image sensor, numerically determining the focal plane of at least one object, and numerically reconstructing a de-focused image of the at least one object from the interference pattern in an image plane which is substantially parallel to the image sensor and in a plane with a predetermined offset from the focal plane. The method further includes identifying at least one portion in the defocused image corresponding to the at least one object in the sample, and calculating from each of said portions at least one feature of the corresponding object.
System and method for digital inline holography
A method of extracting particles from a two-dimensional (2D) hologram recorded as part of a digital inline holography system includes reconstructing a three-dimensional (3D) optical field from the recorded 2D hologram. In addition, particles are extracted/segmented from the 3D optical field, wherein segmented particles are identified by particle location in three-dimensional space and a cross-sectional area of the segmented particle. Based on the identified particle location and cross-sectional area, extracted particles are removed from the 2D hologram to generate an updated 2D hologram. These steps are repeated iteratively until a threshold is met.
Image processing techniques using digital holographic microscopy
Digital holographic microscopy and related image processing techniques are described. A hologram captured in an image frame is split into different depths while a new hologram is being captured. Image slices of the hologram are determined and using free space impulse responses that are pre-calculated at a different precision than processing operations using the holographic data. Each computation is calculated in parallel based on the number of available processing cores and threads. The image slices are combined into a 2D array or 3D array to permit further processing of the combined array to count and size particles in the image frame. The reconstructed hologram is displayed at a subsequent image frame than that used to capture the hologram.
Colloidal fingerprints for soft materials using total holographic characterization
Systems and methods for uniquely identifying fluid-phase products by endowing them with fingerprints composed of dispersed colloidal particles, and by reading out those fingerprints on demand using Total Holographic Characterization. A library of chemically inert colloidal particles is developed that can be dispersed into soft materials, the stoichiometry of the mixture encoding user-specified information, including information about the host material. Encoded information then can be recovered by high-speed analysis of holographic microscopy images of the dispersed particles. Specifically, holograms of individual colloidal spheres are analyzed with predictions of the theory of light scattering to measure each sphere's radius and refractive index, thereby building up the distribution of particle properties one particle at a time. A complete analysis of a colloidal fingerprint requires several thousand single-particle holograms and can be completed in ten minutes.
Optical scanning holography system
An optical scanning holography system includes a polarization-sensitive lens configured to receive a linearly polarized beam and generate a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a first polarizer configured to pass only a beam component therethrough in a predetermined polarization direction among components of the generated first and second spherical waves, a scanning unit configured to scan an object by using an interference beam generated between the first and second spherical waves passing through the first polarizer, and a first photodetector configured to detect a beam reflected from the object.
DIGITAL HOLOGRAPHIC MICROSCOPE
A digital holographic microscope in which two digital holographic microscopes for detecting a fluorescence image and a phase image, respectively, are combined to be able to three-dimensionally measure a fluorescence image and a phase image at the same time, and perform measurement at a high SN ratio in all the polarization states including random light polarization. A first holographic optical system that, by using laser light, acquires a phase three-dimensional image due to interference light generated by superimposing object light which passes through a sample stage and reference light which does not pass through the sample stage onto each other. A second holographic optical system that, by using fluorescent excitation light, acquires a fluorescence three-dimensional image due to a fluorescence signal light, wherein phase measurement by the first holographic optical system and fluorescence measurement by the second holographic optical system are performed at the same time.
ARRANGEMENT FOR IN-LINE HOLOGRAPHY MICROSCOPY
A measuring arrangement having an illuminating arrangement to emit coherent light; a cuvette defining an inner volume for receiving a fluid possibly comprising microscopic objects of foreign origin, the cuvette being arranged to receive the coherent light and let it exit therefrom through opposite entrance and exit openings, the entrance opening being closed by an entrance window. The possible microscopic objects present in the fluid scatter part of the light, the scattered and non-scattered light interfering to form interference fringes. An image sensor is configured to capture a hologram digital image frame by receiving the light propagated across the cuvette. An exit window is arranged to close the exit opening of the cuvette. The image sensor is mounted in direct contact with the cuvette.
METHOD FOR DETERMINING A PHASE OF AN INPUT BEAM BUNDLE
A method is presented for determining a phase of an input beam (110, E.sub.in) without a reference ray. In the method, an input beam (110, E.sub.in) having a plurality of input rays is split into a main beam (112, E1) and a reference beam (114, E2) in such a way that each input ray is split into a main ray of the main beam (112, E1) and a comparative ray of the reference beam (114, E2). The main beam (112, E1) is propagated along a first interferometer arm, and the reference beam (114, E2) is propagated along the second interferometer arm. The propagated main beam (112, E1) and the propagated reference beam (114, E2) are superposed to form an interference beam having a plurality of interference rays. The propagation along the first and second interferometer arms is carried out such that at least one interference ray of the interference beam is a superposition of a main ray of the propagated main beam (112, E1) assigned to a first input ray of the input beam (110, E.sub.in), and of a comparative ray of the propagated reference beam (114, E2) assigned to a second input ray of the input beam (110, E.sub.in) different from the first input ray.
MEASURING APPARATUS AND MEASURING METHOD
According to one embodiment, a beam splitter splits light into first light and second light. The second light is used to irradiate a sample containing particles. A first imaging device images a first interference pattern formed by multiplexing third light, which has been generated by irradiating the particles with the second light, and the first light. A second imaging device images a second interference pattern formed by the third light. An arithmetic device compares a composite image with a calculated image. The composite image is created by using a first interference image picked up by the first imaging device and a second interference image picked up by the second imaging device. The calculated image is obtained by combining single particle interference images, each of which is expected to be obtained by the first imaging device in a case where a particle is present alone in the sample.
System and method for cell recognition
The present disclosure relates to systems and methods for cell recognition. At least one embodiment relates to a method for recognizing cell. The method includes receiving an image of the cell. The method also includes performing edge detection on the image of the cell. Further, the method includes detecting ridges within the image of the cell. In addition, the method includes quantifying an internal complexity of the cell by gauging a contrast of the ridges with an average of a Laplacian on the detected ridges.