A holographic interferometer, comprising: at least one imaging device capturing an interference pattern created by at least two light beams; and at least one aperture located in an optical path of at least one light beam of the at least two light beams; wherein the at least one aperture is located away from an axis of the at least one light beam, thus transmitting a subset of the at least one light beam collected at an angle range.

A system for measuring vibrations of a surface (VSURF) of a mechanical part (M), comprising a source (SOURCE) of radiation (L), a first separator element (ELI) configured to define a first incident ray (LB1) and a reference ray (RLB), a shaping module (DOEM) producing a second incident ray (LB2) from said first incident ray (LB1), and an optical element (OE) capable of an interferential addition of the reference ray (RLB) and a ray produced by a reflection of said second incident ray (LB2) on said surface (VSURF), the shaping module (DOEM) comprising one or more diffracting optical elements (DOE1, . . . , DOEn), each comprising at least one diffraction structure (FSTRUCT) diffracting all or part of the first incident ray (LB1) so as to illuminate a chosen surface of the mechanical part.

Systems and methods for simultaneous multi-channel off-axis holography are described. Multi-channel imaging systems can include a light system including a plurality of light sources configured to generate illumination and reference beams at a plurality of wavelengths, an illumination system configured to illuminate a target object with the illumination beams, an optical assembly configured to receive a reflected target beam and condition the target beam for recording at an optical imaging system, and a reference system configured to propagate the reference beams to the optical imaging system. The reference beams are interfered with the target beam at the optical imaging system to create interference patterns, which can be recorded in a collective image having a plurality of side lobes. Holographic information in the side lobes can be combined to generate 3D images having a substantially reduced signal to noise ratio.

A holographic interferometer, comprising: at least one imaging device capturing an interference pattern created by at least two light beams; and at least one aperture located in an optical path of at least one light beam of the at least two light beams; wherein the at least one aperture is located away from an axis of the at least one light beam, thus transmitting a subset of the at least one light beam collected at an angle range.

A low-cost digital holography microscope (DHM) that is capable of performing inspection at high speed while accurately inspecting an inspection object at high resolution, an inspection method using the DHM, and a method of manufacturing a semiconductor device by using the DHM are provided. The DHM includes: a light source configured to generate and output light; a beam splitter configured to cause the light to be incident on an inspection object and output reflected light from the inspection object; and a detector configured to detect the reflected light, wherein, when the reflected light includes interference light, the detector generates a hologram of the interference light, and wherein no lens is present in a path from the light source to the detector.

Lighting information comprising at least the reflectance data of a plurality of regions of an object surface is generated and printed out as a series of relightable holograms. Each of the printed holograms comprises the reflectance data of a corresponding region of the object. A model of the object is generated such that the model also comprises a plurality of portions corresponding to the regions of the object surface. The series of holograms are each affixed to a portion of the model such that a particular hologram of the series which encodes the reflectance data of a particular region of the object is affixed to the corresponding portion of the model. In an embodiment, the model of the object is generated from a metal. The series of holograms is engraved directly onto the metallic model such that a particular hologram of the series which encodes the reflectance data of a particular region of the object is engraved onto the corresponding portion of the metallic model.

A system for analyzing a transparent particle including: an analysis pathway, including a first light source emitting an analysis light beam, and a first optical system focusing the analysis light beam in a focusing plane; and a position control pathway including a second light source, an image sensor, and a second optical system at least partially merged with the first optical system. The image sensor is offset relative to the image of the focusing plane by the second optical system. The system makes it possible to control correct positioning of the particle, even though it is transparent, and without disturbing the analysis pathway.

Systems and methods for simultaneous multi-channel off-axis holography are described. Multi-channel imaging systems can include a light system including a plurality of light sources configured to generate illumination and reference beams at a plurality of wavelengths, an illumination system configured to illuminate a target object with the illumination beams, an optical assembly configured to receive a reflected target beam and condition the target beam for recording at an optical imaging system, and a reference system configured to propagate the reference beams to the optical imaging system. The reference beams are interfered with the target beam at the optical imaging system to create interference patterns, which can be recorded in a collective image having a plurality of side lobes. Holographic information in the side lobes can be combined to generate 3D images having a substantially reduced signal to noise ratio.

Systems, devices, and methods are described herein for performing digital holography to analyze dynamics of fluid flow. According to some aspects of this disclosure, a Digital Fresnel Reflection Holography (DFRH) system, which is arranged to utilize light backscattered from particles in a fluid chamber to create a hologram that may be processed to analyze characteristics of fluid flow. The DFRH system may utilize light reflected from an imaging window disposed between a light source and a sampling volume, to be analyzed as a reference wave, to form an interference pattern and resultant hologram. According to some aspects of this disclosure, the DFRH techniques may provide simple, cost-effective mechanisms with improved performance over other techniques for analyzing fluid flow using holography.

Imaging apparatus and methods using diffraction-based illumination are disclosed. An example apparatus includes a diffraction grating to redirect light from a light source toward a sample to thereby illuminate the sample. The example apparatus also includes an image sensor to detect a diffraction pattern created by the illuminated sample.