A system for queuing a plurality of folded laundry articles for loading into a shipping container includes at least two vertically stacked platforms configured to receive thereon the folded laundry articles, a cantilevered conveyor configured to deposit the folded laundry articles on the at least two vertically stacked platforms and redistribute the folded laundry articles between the at least two vertically stacked platforms for ordered packing, one or more sensors disposed adjacent the at least two vertically stacked platforms, and at least one controller in operable communication with a drive of the cantilevered conveyor, the one or more sensors, and a memory. The controller is configured to instruct the cantilevered conveyor to transit along lengths of the at least two vertically stacked platforms, and store in the memory at least one of the area footprint, height, and article types of the deposited folded laundry articles.

Provided is a technique of transporting an object to be transported to a machine tool more securely. A transport system includes a transport path, and a storage portion. The storage portion stores an object, and has a first reference shape. The transport system includes machine tools, and a transport device that moves on and the transport path and transports an object. The control unit executes a process of making a camera photograph the first reference shape to acquire a first image from the camera, and a process of correcting a control parameter to be used in transporting an object to be transported stored in the storage portion to the machine tool that is a transport destination on the basis of a position of the first reference shape in the first image.

A conveyor controller for being implemented into a conveyor system includes control circuitry and one or more network interfaces for coupling with other conveyor controllers. In one embodiment, the control circuitry configured for detecting whether a another conveyor controller is connected and to determine which network interface is used in order to set the direction of the conveyor system. In another embodiment, the control circuitry is configured, to receive configuration data from a conveyor controller connected to a network interface, and to detect if another conveyor controller is and to transmit configuration message to another conveyor controller that includes additional configuration data associated with the conveyor controller. In still another embodiment, the control circuitry transmits configuration data to a replacement conveyor controller upon getting a request from the replacement conveyor controller that has been connected to a network interface.

An assembly consisting of a control member which comprises a carrier, an operating part movably supported on the carrier, an electromagnetic actuator comprising an armature and a coil for driving the operating part movingly relative to the carrier is provided. The assembly further comprises an electronic control system connected in an electrically conductive manner with the electromagnetic actuator for applying a control voltage to the electromagnetic actuator for a predetermined control period in a control step in order to generate a haptic feedback; a measuring circuit connected in an electrically conductive manner to the electromagnetic actuator for measuring a current present at the electromagnetic actor and for generating a measuring signal proportional thereto; and an evaluation unit connected in an electrically conductive manner at least to the measuring circuit and designed, in a measuring step offset in time relative to the control step, to apply a measuring voltage to the electromagnetic actuator by the electronic control system for a predetermined test period shorter than the control period, in order to measure by the measuring circuit the current which arises at the electromagnetic actuator as the test period elapses due to the application of the measuring voltage and to generate a measuring signal proportional thereto, and in order to obtain a characteristic value of the actuator based on the measuring signal.

Disclosed herein are methods and systems for semiconductor fabrication. In one embodiment, a method for fabricating semiconductors utilizing a semiconductor fabrication system includes performing a semiconductor fabrication process on a first lot of unprocessed semiconductor substrates with a semiconductor fabrication equipment unit to form a first lot of processed substrates and communicating processing data regarding the first lot of processed substrates from the semiconductor fabrication equipment unit to a just-in-time (JIT) module of the semiconductor fabrication system. The method further includes determining a processing priority of the first lot of processed substrates and a processing priority of a second lot of unprocessed substrates at the JIT module and scheduling removal of the first lot of processed substrates from the semiconductor fabrication equipment unit and delivery of the second lot of unprocessed substrates to the semiconductor fabrication equipment unit by the JIT module based on the processing data and the priority of one or both of the first lot of processed substrates and the second lot of unprocessed substrates.

A method is provided. The method includes: assigning a buffer to a first wafer lot comprising a plurality of wafers according to a first trigger event associated with an equipment; and assigning a transporter to a second wafer lot comprising a plurality of wafers according to a second trigger event associated with the equipment.

Methods and systems for sorting hides are provided. In particular, one or more embodiments comprise a tanning control system that enhances the traceability of hides by capturing and utilizing data related to the unloading, tanning, sorting, and packaging of hides. Furthermore, one or more embodiments enable the tanning control system to improve efficiency by sorting hides based, at least in part, on data generated during prior tanning processes. Additionally, one or more embodiments facilitate the tanning control system in customizing the sorting and packaging of hides based, at least in part, on one or more hide characteristics and/or customer specifications.

Embodiments of the present disclosure provide methodology to match and calibrate processing chamber performance in a processing chamber. In one embodiment, a method for calibrating a processing chamber for semiconductor manufacturing process includes performing a first predetermined process in a processing chamber, collecting a first set of signals transmitted from a first group of sensors disposed in the processing chamber to a controller while performing the predetermined process, analyzing the collected first set of signals, comparing the collected first set of signals with database stored in the controller to check sensor responses from the first group of sensors, calibrating sensors based on the collected first set of signals when a mismatch sensor response is found, subsequently performing a first series of processes in the processing chamber, and collecting a second set of signals transmitted from the sensors to the controller while performing the series of processes.

Techniques for providing an entity monitoring safety feature in an inventory management system may be described. For example, information that indicates respective locations for a plurality of mobile drive units within an inventory management system may be received. Tracking information may be received from a mobile location unit that is moving within a bounded area around a signal transmitter that is coupled to an entity. The tracking information may include an approximate location of the signal transmitter relative to the mobile location unit. Pathway information may be generated that indicates to the plurality of mobile drive units within the inventory management system to stay outside of a radius distance of the mobile location unit based on the received tracking information. The generated pathway information may be provided to the plurality of mobile drive units to enable safe passage for the entity within the inventory management system.

A method for transporting a group of semiconductor wafers and a manufacturing system are provided. A semiconductor processing facility is provided. The semiconductor processing facility includes a first destination, a second destination, and a transport system configured to transport a group of semiconductor wafers from the first destination to the second destination. Real time information is collected, where the real time information includes information on a current process executing in the semiconductor processing facility and information on a transfer time. The information on the transfer time includes data that indicates an amount of time required to transport the group of semiconductor wafers from the first destination to the second destination. A request is issued to the transport system to effect the transportation of the group of semiconductor wafers from the first destination to the second destination. A timing of the request is based on the first and second data.