G05B19/4189

Cosmetic manufacturing apparatus, control method of the same, and cosmetic manufacturing system

This disclosure relates to a cosmetic manufacturing apparatus, a control method thereof, and a cosmetic manufacturing system. According to an embodiment of the disclosure, there is provided a cosmetic manufacturing apparatus including: a control unit for calculating a first composition ratio based on the user's skin condition measured by a measurement sensor, receiving cosmetic purchase history of the user from an operating server, and calculating a second composition ratio by modifying the first composition ratio with a preset algorithm based on the purchase history; and a cosmetic material supply unit which discharges cosmetic materials according to one of the first composition ratio or the second composition ratio, so that a cosmetic is manufactured according to the one of the first composition ratio or the second composition ratio.

Computer-implemented method, apparatus for data processing, and computer system for controlling a control device of a conveyor system

A computer-implemented method, a device for data processing and a computer system for controlling a control device of a conveyor system to achieve an alignment and/or a defined spacing of piece goods, wherein the control of the control device is determined by an agent acting according to Reinforcement Learning methods. An individual, local state vector of predefined dimension that is the same for all the piece goods is created for each of the piece goods and an action vector is selected from an action space according to a strategy that is the same for all piece goods for the current state vector of this piece good. These action vectors are projected onto the conveying elements, wherein conflicts are resolved. After a cycle time has elapsed, state vectors are created again for each piece good and evaluated with rewards and the strategy is adjusted.

ANALYSIS METHOD AND ANALYSIS DEVICE FOR SEMICONDUCTOR MANUFACTURING PROCESS

An analysis method and an analysis device for a semiconductor manufacturing process are provided. The analysis method of the semiconductor manufacturing process includes the following steps. A semiconductor machine log file is loaded. A plurality of machine action events are defined from the semiconductor manufacturing machine log file. A wafer moving path map is generated according to a wafer moving information file. A plurality of account point information are bound to each of the machine action events according to the wafer moving path map. A wafer movement tracking graph is generated according to the machine action events that have been bound to account information.

SYSTEMS AND METHODS FOR PROCESSING OBJECTS

A processing system is disclosed for processing objects. The processing system includes a perception system for providing perception data regarding an object, and a primary transport system for providing transport of the object along a primary direction toward a processing location that is identified based on the perception data.

Workpiece machining device and machining control method
12377506 · 2025-08-05 · ·

A workpiece machining device includes a sensor unit that detects the passage of a moving workpiece W, a machining unit that performs machining using a predetermined machining tool in a state where the workpiece W is moved, and a machining control unit that controls the operation of the machining unit. The machining control unit issues an operation command signal S.sub.P to the machining unit at intervals of a predetermined control cycle T, measures a detection time T.sub.D taken to receive a detection signal S.sub.D relative to a cycle start time point of the control cycle T, stores various parameters including the detection time T.sub.D, a difference between the control cycle T and the detection time T.sub.D is defined as a response delay time, and modifies the operation command signal S.sub.P in each control cycle T on the basis of the response delay time T.sub.D.

SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM

It is possible to suppress a decrease in work efficiency in an initial position setting operation for a substrate processing apparatus. There is provided a technique that includes: transporters each provided with one or more transfer shafts; a manipulator for selecting a specified transfer shaft from the one or more transfer shafts and performing an initial position setting therefor; a display for displaying a status of the initial position setting for the specified transfer shaft; and a controller including a determination processor and notifying a determination result determined by the determination processor, wherein the determination processor determines whether the initial position setting for the specified transfer shaft selected by the manipulator is completed and whether it is possible for an initial position setting for another transfer shaft to be performed in parallel.

HIDE SORTING SYSTEMS AND METHODS
20250257414 · 2025-08-14 ·

Methods and systems for sorting hides are provided. In particular, one or more embodiments comprise a tanning control system that enhances the traceability of hides by capturing and utilizing data related to the unloading, tanning, sorting, and packaging of hides. Furthermore, one or more embodiments enable the tanning control system to improve efficiency by sorting hides based, at least in part, on data generated during prior tanning processes. Additionally, one or more embodiments facilitate the tanning control system in customizing the sorting and packaging of hides based, at least in part, on one or more hide characteristics and/or customer specifications.

Teaching method for transfer device, and transfer system
12387954 · 2025-08-12 · ·

A teaching method for a transfer device provided with a pick configured to hold a substrate and a mapping sensor, includes detecting a position of an edge of the substrate arranged in a teaching target module by the mapping sensor and setting a teaching position in one horizontal direction, transferring the substrate from the teaching target module to a stage of an alignment device by the pick based on the set teaching position, rotating the stage by a predetermined angle and detecting a locus of the position of the edge of the substrate, and estimating an eccentricity amount between the stage and the substrate based on the detected locus of the position of the edge of the substrate.

Method for Ascertaining the Position of a Transport Means of a Conveyor System, and Conveyor System
20250231563 · 2025-07-17 ·

A method for ascertaining a position of at least one transport apparatus includes the step of capturing and ascertaining. The transport apparatus is configured to transport at least one component of a conveyor system. The step of capturing includes capturing at least one marking arranged in an area of a travel path, along which the transport apparatus travels through at least one route section, with an optical capture device of the transport apparatus. The step of ascertaining includes ascertaining a multidimensional position of the transport apparatus in the space with an electronic computing device, as a function of the captured marking.

CONTROL DEVICE, CONTROL SYSTEM, AND CONTROL METHOD

A control device that controls an operation of a moving object that can move by unmanned driving includes: an acquisition unit that acquires process information indicating a manufacturing process that is being executed with respect to the moving object; a specifying unit that specifies using the process information which one movement mode of an engine movement mode of moving using an engine and a motor movement mode of moving using a motor to use to cause the moving object to move; and a control unit that causes the moving object to move in the specified movement mode.