Systems and methods for implementing variable cycle times for overall equipment effectiveness (OEE) analytics for industrial systems. The system may include an electronic processor configured to receive operational data describing a manufacturing process of an industrial system. The electronic processor may be configured to dynamically select, from a plurality of cycle times, a first cycle time for a first type of part manufactured by the industrial system as part of the manufacturing process and determine, using a first portion of the operational data associated with manufacturing the first type of part and the first cycle time, a first efficiency metric associated with manufacturing the first type of part. The electronic processor may be configured to determine, based on the first efficiency metric, an OEE of the industrial system. The electronic processor may be configured to generate and transmit a report indicating the OEE for display.

A wafer-like semiconductor sensor includes a wafer-like base formed of a plurality of layers of chemically-hardened glass and an electronics module mounted to a recessed pocket in the base and containing a sensor.

A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.

Systems and methods of inspecting a manufactured part include creating a computer model of the part with a desired model contour having a model feature at a desired location. The manufactured part is scanned to obtain scanned data indicative of a manufactured surface formed in a manufactured contour and having a manufactured feature at an actual location on the manufactured surface. The computer model is modified using modeled reaction forces so that the model contour matches the manufactured surface. A determination whether the manufactured part is acceptable is based on a comparison of the actual location of the manufactured feature with and the desired location of the model feature with the model surface in the modified model contour. Additionally or alternatively, the reaction forces are compared with a reaction force threshold to determine whether the manufactured part requires reworking.

A production equipment monitoring system 20 including: an anomaly index determination unit 23 determining an anomaly index a of a production equipment 10, based on a feature quantity obtained from an equipment information on the production equipment 10; a relevance determination unit 24 determining a degree of relevance D between each of anomalous conditions predicable to occur in the production equipment 10 and an observed condition of the production equipment 10; a detection threshold determination unit 25 determining a single detection threshold th for detecting a degree of anomaly A of the production equipment 10, based on anomaly thresholds at which are thresholds of the anomaly index a corresponding respectively to the anomalous conditions, and on the degree of relevance D; and an anomaly degree detection unit 26 detecting the degree of anomaly A of the production equipment 10, based on the anomaly index a and the detection threshold th.

A system for controlling a parameter relative to the quality of a tyre being processed includes at least one system for detecting a parameter relative to one or more tyres being processed. A control unit is programmed for comparing a succession of values of the parameter by comparing each value with at least one discard threshold and preferably with at least one warning threshold. The discard threshold divides a discard interval from an acceptable interval. The warning threshold belongs to the acceptable interval and defines one or more warning intervals. The control unit is also programmed for controlling the trend of the succession of values with respect to the discard threshold. A method for controlling quality of production of tyres.

An operation support system for supporting an operation to each facility installed in a plant, the operation support system may include, but is not limited to, a data storage that stores historical data which represent information regarding operations performed to the facility as history, and at least one operation support device portable by a field operator, wherein the operation support device may include a position information acquirer configured to acquire a current position of the operation support device, and to output current position information, an inspection information processor configured to add information regarding the operation performed to the facility, and to output the current position information regarding position where the operation was performed to at least the facility that is associated with the historical data to data storage, and an operation supporter configured to represent information regarding the operation performed to the facility as operation information based on the historical data, and to enable one or more further functions regarding the operation associated with the operation information to be executed.

A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.

In production management systems, management devices includes a management device of a pre-process which adds a hash value of a production condition information received from a preceding process and a hash value calculated from the production condition information of the pre-process to calculate a first hash value and transmit the production condition information of the pre-process and the first hash value to a management device of a current process, and the management devices includes a management device of a current process which calculates a second hash value from production condition information received, calculates a third hash value obtained by subtracting the second hash value from the first hash value.

A Sensor network system (10) with a plurality of sensor devices (12_1 12_5), each comprising: a detection unit (16, 18) for detecting a physical quantity and for providing a corresponding measurement signal, a computing unit (20) for processing the measurement signal and for providing measurement data (M_1-M_5) which is based on the measurement signal, and a data interface (22) via which output data (A_1-A_5) can be read out, is known.

In order to provide an efficient sensor network system (10), according to the present invention, a central evaluation unit (24) is provided, which is configured to: determine individual output data (A_1-A_5) for the at least two sensor devices (12_1-12_5) based on the measurement data (M_1-M_5) of at least two of the sensor devices (12) via a central evaluation algorithm, and provide the determined output data (A_1-A_5) to the respective sensor device (12_1-12_5).