Wafer inspection with stable nuisance rates and defect of interest capture rates are disclosed. This technique can be used for discovery of newly appearing defects that occur during the manufacturing process. Based on a first wafer, defects of interest are identified based on the classified filtered inspection results. For each remaining wafer, the defect classifier is updated and defects of interest in the next wafer are identified based on the classified filtered inspection results.

Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters.

Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters.

One or more processors receive operational data. The operational data includes two or more fields that contain an identical type of data as two or more fields within a master table. One or more processors generate a plurality of first unique identifiers from the two or more fields within the operational data and the master table. One or more processors determine a match between a pair of the plurality of first unique identifiers. The match is between a first unique identifier included in a operational data record and a first unique identifier included in a master table record. One or more processors determine a second unique identifier from the master table record. One or more processors generate an operational table record that includes the second unique identifier and at least a portion of the operational data.

Operator and quality information can be traced during manufacturing processes. It can be determined whether an operator requesting access to the manufacturing process is authorized. If authorized, the operator can be granted access to the manufacturing process. Quality information including one or more quality checks associated with the operator can be received. It can be determined whether the one or more quality checks pass predetermined quality requirements. If the quality checks pass the predetermined quality requirements, identification information can be generated. The identification information can be used to apply a traceable output on a part associated with the manufacturing process. Traceability reports can be generated that include the operator identification and the quality information and that can be reviewed by external computing systems.

A method for manufacturing a plurality of components, each of the plurality of components including at least one electrical feedthrough, in which a functional element is fastened in a feedthrough opening in a base body by way of an electrically insulating material, an information being acquired in association with each of the plurality of components, the method comprising the steps of: providing, in one of a plurality of manufacturing steps of the method, each of the plurality of components or one of a plurality of pre-stages of each of the plurality of components with an information store, at least one of (i) the information being stored in the information store, and (ii) an identifier is stored in the information store and the information is stored in a database in association with the identifier.

Provided is a production line management system for managing a manufacturing line for containers. The production line management system includes a first reading unit for reading an identification code applied to each of the containers when the container with the identification code indicating an identifier being information identifying the container passes through a first point on the manufacturing line, a second reading unit for reading the identification code applied to each of the containers after the first reading unit reads the identification code, and a computing unit for generating a database in which the identifier indicated by the identification code and relevant information about each of the containers are associated, and determining normality/abnormality of each of the containers by comparing the relevant information associated in the database with the identifier indicated by the identification code read in the second reading unit with predetermined setting information.

A recording system for the automated documentation of defects in semi-finished products, includes at least one measuring device configured to record at least one measured value of a semi-finished product that is processed in the manufacturing plant, and a data processing device, which is connected to the at least one measuring device and which receives the at least one measured value. The data processing device includes: a database in which database entries for documenting defects in the semi-finished product can be saved; a comparison device, which is configured to compare the at least one measured value with predefined range limits and to save the at least one measured value lying outside the range limits in a database entry; and a damage recording device configured to record data on the extent of the damage caused by the defect if the at least one measured value is outside the range limits.

A method for generating a digital production quality certificate for a component carrying a machine readable unique identifier undergoing a plurality of manufacturing steps is provided. The method comprises obtaining parameters indicative of the manufacturing steps from one or more sensors for a plurality of monitored manufacturing steps. The obtained parameters are linked with the machine readable unique identifier and one or more quality analyses are performed for a selected monitored manufacturing step based on the obtained parameters for said manufacturing step. A digital quality certificate is generated for the component comprising data related to the results of the quality analyses and the parameters obtained for the component are stored. The disclosure also provides examples of methods and systems of monitoring a manufacturing process.