A production line monitoring device that identifies a cause of a production defect, reduces the amount of analysis data and computation, and performs real-time processing, is provided. The production line monitoring device includes a defect indication detection unit that detects an indication of a production defect of a production line, and a defect cause identification unit that identifies a cause of the production defect. The defect indication detection unit collects measurement information measured by an inspection apparatus for each reference that identifies a position on products, and detects an indication of the production defect from the change with time of the measurement information at the references. The defect cause identification unit performs stratified analysis based on production information related to the reference when the defect indication detection unit detects an indication of a production defect, and identifies a cause of a production defect from a result of the analysis.

This disclosure describes techniques for automatically controlling the operation of a slitter (40) to convert a web (20) of material into smaller slit rolls (64, 66, 68). A slitter director (60) may automatically control the operation of a slitter (40) for defect removal, web splicing, and/or slit roll rejection based on continually registering previously-generated anomaly data (62) with physical locations of the web (20).

A real-time control system includes a faulty variable identification technique to implement a data-driven fault detection function that provides an operator with information that enables a higher level of situational awareness of the current and likely future operating conditions of the process plant. The faulty variable identification technique enables an operator to recognize when a process plant component is behaving abnormally to potentially take action, in a current time step, to alleviate the underlying cause of the problem, thus reducing the likelihood of or preventing a stall of the process control system or a failure of the process plant component.

Targeted distributing of reports containing historical process control information to particular user devices via a communications network. A curating service permits assigning a score to each report based on an interest level value of the historical process control information to a user associated with each user device and/or an urgency value of the historical process control information. Routing reports to user devices based on the score raises visibility of the historical process control information without overburdening the communications network.

In general, according to one embodiment, a data processing apparatus includes a processor including hardware. The processor acquires state data related to a state of each product and order data related to order related to manufacturing of each product. The processor calculates a first score by using the acquired state data and the acquired order data. The first score regards a change in the acquired state data and is based on a first change model. The first change model represents the change in the state data using the order data. The processor outputs the first score.

A system for analyzing cause of product defect, including: a distributed storage device configured to store production data generated by a factory device; an analysis device including one or more processors configured to perform: acquiring a production record from the production data; the production record includes information of processing devices used during production procedures for producing the products and information of defects occurring, where each product is processed by multiple processing devices, and each processing device participates in only the production procedures of a portion of the products; determining a correlation weight of the processing device to be analyzed corresponding to a defect to be analyzed according to the production record, and determining a correlation between the processing device to be analyzed and the defect to be analyzed according to the correlation weight; a display device configured to display an analysis result of the analysis device.

This invention discloses an automatic magnetic core sorting system based on machine vision, which comprises an image acquisition and detection mechanism, a digital conversion module, an image processing module, and a workpiece sorting mechanism. The digital conversion module communicates with the image acquisition and detection mechanism. The image processing module receives the digital signals of images of each workpiece taken from various angles and compares the digital signals with a preset value. Afterwards, the results of comparison are sent to the central control module which judges and controls the operations of the workpiece sorting mechanism according to the results sent from the image processing module. This invention adopts the machine vision-based automatic identification technology to automatically identify color and appearance defects of magnetic sheets on conveyor line. With advantages of real-time and accurate detection with high precision, it greatly improves the efficiency and the degree of automation of production.

An apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of device is provided. The device is configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in a path pattern, based on a production path quality and an association relationship between a path pattern and a production path indicating devices via which the product is produced and an order of passing through the devices; and to identify a path pattern suspected to be defective based on the estimated path pattern quality.

Embodiments of present disclosure relate to adjusting a robot motion path. In the method for adjusting a robot motion path, a first processing procedure may be performed on a first workpiece to obtain a first product. Then, first process data may be obtained, where the first process data describes an attribute of the first processing procedure for obtaining the first product from the first workpiece. Next, based on the obtained first process data, a robot motion path of a second processing procedure that is to be performed on the first product by a robot may be adjusted. Further, embodiments of present disclosure provide apparatuses, systems, and computer readable media for adjusting a robot motion path.

A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condition using the convolutional neural network model; providing a fault indicator of the fault condition in the one or more manufacturing processes of the electronic device; and determining that the electronic device includes a fault based on the fault indicator. The 2D data array has a dimension of an input data to the convolutional neural network model.