A method, system and computer program product for a heuristic determination of in-process damage class control to manage expected output product category. The heuristic technique determines the predicted damages and their ranges while keeping the initial expected defects, the respective classes and range of defect and mitigation. The method dynamically computes a damage mitigation range of operation while being within the overall constraints and completes the computation in smaller number of loops being run at the edge computers so that the manufacturing equipment can operate at a higher velocity for higher quality of the output. The method includes a step of reducing error of the co-efficient and damage counts. An Internet of Things (IoT) based robot is used to mitigate the damages in the manufacturing steps to ensure that the output class of the product remains what was expected at the start despite damages and mitigation measures.

A data processing method for processing a plurality of pieces of unit-processing data (each unit-processing data includes a plurality of pieces of time series data) includes: a unit-processing data evaluating step of taking, as reference data, previously defined unit-processing data among the plurality of pieces of unit-processing data and calculating an evaluation value for unit-processing data to be evaluated based on the unit-processing data to be evaluated and the reference data; and a reference data changing step of changing the reference data based on the evaluation value calculated in the unit-processing data evaluating step.

A method, system, and computer program product, include recording high-frequency wave data of local arid adjacent fault curves of a power grid to compare the high-frequency wave data with historical fault data to detect an actual fault region in the power grid, the power grid having a plurality of sensors distributed in the power grid, each sensor being upstream of one adjacent sensor and downstream of an other adjacent sensor.

A method, system, and computer program product, include obtaining a dataset related to a power grid collected by a plurality of sensors distributed in the power grid, identifying a region as a candidate fault region based on first data in the dataset, the first data being collected by a first sensor from among the plurality of sensors that is located in the region, and verifying the candidate fault region based on second data in the dataset, the second data being collected by a second sensor from among the plurality of sensors that is adjacent to the first sensor.

Methods, apparatus, systems, and articles of manufacture to detect defects during semiconductor chip fabrication and/or to debug semiconductor chips after fabrication are disclosed. An example apparatus includes a substrate, integrated circuitry on a first side of the substrate, and an array of pins extending through the substrate. The pins include first ends on the first side of the substrate and second ends protruding beyond a second side of the substrate opposite the first side.

An integration server manages production in a manufacturing line that includes a first stage and a second stage carried out after the first stage. The integration server includes a communicator that acquires a first production log and a second production log. The first production log includes a first production count of processing objects in the first stage. The second production log includes the number of processing objects in the second stage. The integration server also includes an irregularity detector that detects the presence of irregularity in the first production log and the second production log on the basis of the first production count and the number of the processing objects in the second stage.

A method for protection and diagnosis of a linear compression including at least one electronic control. At each work cycle of the linear compressor, the protection method includes detecting a suction time of the linear compressor; detecting a compression time of the linear compressor; and calculating, after detecting a compression time of the linear compressor, a decision parameter equivalent to the difference between the previously detected suction time and the compression time.

A distributed light-guided processing method includes obtaining an order from a requester, for at least one completed product. Raw components are provided to at least one selected remote processing location. The selected remote processing location includes a light guided system. Work instructions are provided to the selected remote processing location, wherein the work instructions enable the light guided system to guide construction of the completed product. The completed product is processed, using at least the raw components, the work instructions, and the light guided system. The completed product is shipped from the selected remote processing location upon completion of the processing.

A manufacturing system includes a plurality of manufacturing facilities, a remote terminal, and a remote authority controller that controls authority of a remote operation from the remote terminal. When an error is detected in a first manufacturing facility out of the plurality of manufacturing facilities, the remote authority controller grants authority of a remote operation of a second manufacturing facility to the remote terminal. The second manufacturing facility causes the error and is other than the first manufacturing facility.

A defect prediction system includes an acquirer, a defect-related number predictor, and a cause predictor. The defect-related number predictor predicts, based on a past defect-related number acquired by the acquirer, a future defect-related number of a product with respect to each of a plurality of production lines in each of a plurality of process steps. The cause predictor predicts, based on the future defect-related number predicted by the defect-related number predictor with respect to each of the plurality of production lines in each of the plurality of process steps, which of the plurality of production lines a cause of an increase in a total future defect-related number is attributable to.