A control system may perform functions including (i) storing data indicating an association between an optical identifier and a first robot, (ii) sending, to the first robot, data encoding the optical identifier for display by the first robot, and (iii) after sending the data encoding the optical identifier, sending, to a second robot, the data indicating the association between the optical identifier and the first robot. In some examples, the first robot may receive, from the control system, data encoding a second optical identifier of the first robot so that the first robot may display the second optical identifier instead of the first optical identifier. In some examples, a first robot may capture an image of an indication of a priority status of a second robot and perform an action based on comparing a first priority status of the first robot to the second priority status of the second robot.

A control system may perform functions including (i) storing data indicating an association between an optical identifier and a first robot, (ii) sending, to the first robot, data encoding the optical identifier for display by the first robot, and (iii) after sending the data encoding the optical identifier, sending, to a second robot, the data indicating the association between the optical identifier and the first robot. In some examples, the first robot may receive, from the control system, data encoding a second optical identifier of the first robot so that the first robot may display the second optical identifier instead of the first optical identifier. In some examples, a first robot may capture an image of an indication of a priority status of a second robot and perform an action based on comparing a first priority status of the first robot to the second priority status of the second robot.

A semiconductor electronic device structure includes an active area array disposed in a substrate, an isolation structure, a plurality of recessed gate structures, a plurality of word lines, and a plurality of bit lines. The active area array a plurality of active area columns and a plurality of active area rows, defining an array of active areas. The substrate has two recesses formed at the central region thereof. Each recessed gate structure is respectively disposed in the recess. A protruding structure is formed on the substrate in each recess. A STI structure of the isolation structure is arranged between each pair of adjacent active area rows. Word lines are disposed in the substrate, each electrically connecting the gate structures there-under. Bit lines are disposed above the active areas, forming a crossing pattern with the word lines.

A method is disclosed and includes determining whether there is any WIP information with one or more process constraints in a process constraint database that is coupled with a manufacturing execution system; determining whether there is a dispatching rule in the dispatching rule database that is coupled with a dispatching system; generating a tool-lot relationship based on at least one of the process constraints and the dispatching rule; utilizing the tool-lot relationship to assign one or more lots to one or more tools respectively.

A method for order prioritization includes calculating a cycle time for a product order of a plurality of product orders using an artificial neural network, determining a first order priority of the product order based on a priority index using an analytic hierarchy process, determining a second order priority of the product order based on event based simulation model, and determining a shipping date for the product order based on the second order priority. The artificial neural network calculates the cycle time based upon product order type and a plurality of component counts. The analytic hierarchy process determines a first order priority based upon a plurality of product order attributes. The simulation model determines a second order priority and completion time based upon the first order priority, product model, product type, a plurality of component counts, manufacturing capacity and inventory data, and production time data for historical product orders.

A method of filling orders and order fulfillment system includes storing inventory receptacles in an automated warehouse, some having a plurality of different types of inventory items. A queue of orders is maintained in a computer system, each including at least one inventory item. Each order is selected from the queue and assigned to a pick station. The computer system retrieves inventory receptacle(s) from the automated warehouse for the selected order and supplies the receptacle(s) to the pick station. The computer system identifies to an operator which inventory item is to be segregated with the selected order in at least one put receptacle. One or more of the put receptacles receives inventory items for at least one individual order and is directed to a secondary order processing station where items are separated into individual orders. The operator may be provided the capability to consolidate inventory items from inventory receptacles while picking orders to consolidate partially filled inventory receptacles in a consolidated inventory receptacle.

Embodiments presented herein provide techniques for executing a block-based workflow to provide a schedule for a semiconductor manufacturing environment. The block-based workflow includes a plurality of blocks and each block specifies a set of operations to be performed upon execution of each block. One embodiment includes extracting scheduling data from the semiconductor manufacturing environment, determining an allocation of the number of lots to one or more devices operating in the semiconductor manufacturing environment, determining an order in which the lots should be processed by the one or more devices and publishing results of the allocation and processing order to at least one another device in the semiconductor manufacturing environment, based on the plurality of blocks in the block-based workflow.

A machine tool system includes a schedule storage unit that stores machining schedule information containing a machining sequence of a plurality of workpieces, and a priority-level setting unit that allows a user to designate any of the workpieces in the machining schedule information stored in the schedule storage unit and to set a priority level for the designated workpiece. The workpiece for which the priority level is set by the priority-level setting unit is machined in accordance with the priority level, and the workpiece for which the priority level is not set is machined in accordance with the machining sequence after the workpiece for which the priority level is set is machined.

A computer implemented method for configuring a coating process to deposit a targeted mono- or multi-layered coating on a substrate, the method providing as output a series of ordered tasks executed on the coating process, and includes (a) providing a dataset including a data related to parameters of the coating process; (b) providing a set of algorithms which takes, as input, data from the dataset of (a) and provides, as output, series of at least one tasks associated to each algorithm; selecting two algorithms from the set of algorithms depending on current states of the coating process as provided as input data, and (d) selecting an order in which the algorithms selected at (c) has to be carried out so that the tasks provided by the algorithms are organized as a series of ordered tasks which are executed contextually onto the coating process at corresponding stages in the coating process.